JPS5583231A - Exposure method - Google Patents

Exposure method

Info

Publication number
JPS5583231A
JPS5583231A JP15835078A JP15835078A JPS5583231A JP S5583231 A JPS5583231 A JP S5583231A JP 15835078 A JP15835078 A JP 15835078A JP 15835078 A JP15835078 A JP 15835078A JP S5583231 A JPS5583231 A JP S5583231A
Authority
JP
Japan
Prior art keywords
photomask
substrate
pattern
warp
corrected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15835078A
Other languages
Japanese (ja)
Inventor
Shunsuke Matsuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15835078A priority Critical patent/JPS5583231A/en
Publication of JPS5583231A publication Critical patent/JPS5583231A/en
Pending legal-status Critical Current

Links

Landscapes

  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE: To form a fine live pattern by a method wherein a substrate is exposed while being corrected for warp by being pressed with photomask on supporting base.
CONSTITUTION: Warp of substrate 5 is corrected by being prened between the support base 11 and the photomask 12. By projecting light on the photomask 12, the resist film 7 on top of the layer 6 of the substrate 5 is exposed according to the pattern on the bottom surface of the photomask. The bottom surface of the substrate 5 is either placed on or bonded to the support base 11 with an adhesive. The method can provide a 1μm live width pattern with high yields and allows the use of thin substrates which otherwise are expensive.
COPYRIGHT: (C)1980,JPO&Japio
JP15835078A 1978-12-19 1978-12-19 Exposure method Pending JPS5583231A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15835078A JPS5583231A (en) 1978-12-19 1978-12-19 Exposure method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15835078A JPS5583231A (en) 1978-12-19 1978-12-19 Exposure method

Publications (1)

Publication Number Publication Date
JPS5583231A true JPS5583231A (en) 1980-06-23

Family

ID=15669720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15835078A Pending JPS5583231A (en) 1978-12-19 1978-12-19 Exposure method

Country Status (1)

Country Link
JP (1) JPS5583231A (en)

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