JPS557638A - Measuring method for semiconductor integrated circuit - Google Patents

Measuring method for semiconductor integrated circuit

Info

Publication number
JPS557638A
JPS557638A JP8034078A JP8034078A JPS557638A JP S557638 A JPS557638 A JP S557638A JP 8034078 A JP8034078 A JP 8034078A JP 8034078 A JP8034078 A JP 8034078A JP S557638 A JPS557638 A JP S557638A
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
current consumption
output voltage
standard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8034078A
Other languages
English (en)
Inventor
Tsutomu Hata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP8034078A priority Critical patent/JPS557638A/ja
Publication of JPS557638A publication Critical patent/JPS557638A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP8034078A 1978-06-30 1978-06-30 Measuring method for semiconductor integrated circuit Pending JPS557638A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8034078A JPS557638A (en) 1978-06-30 1978-06-30 Measuring method for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8034078A JPS557638A (en) 1978-06-30 1978-06-30 Measuring method for semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS557638A true JPS557638A (en) 1980-01-19

Family

ID=13715525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8034078A Pending JPS557638A (en) 1978-06-30 1978-06-30 Measuring method for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS557638A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176U (ja) * 1984-06-07 1986-01-06 沖電気工業株式会社 半導体ｉｃ装置の試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176U (ja) * 1984-06-07 1986-01-06 沖電気工業株式会社 半導体ｉｃ装置の試験装置

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