JPS5572069A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5572069A
JPS5572069A JP7298979A JP7298979A JPS5572069A JP S5572069 A JPS5572069 A JP S5572069A JP 7298979 A JP7298979 A JP 7298979A JP 7298979 A JP7298979 A JP 7298979A JP S5572069 A JPS5572069 A JP S5572069A
Authority
JP
Japan
Prior art keywords
region
film
type
sio
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7298979A
Other languages
Japanese (ja)
Other versions
JPS6238865B2 (en
Inventor
Yoshio Sakai
Toshiaki Masuhara
Osamu Hata
Toshio Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7298979A priority Critical patent/JPS5572069A/en
Publication of JPS5572069A publication Critical patent/JPS5572069A/en
Publication of JPS6238865B2 publication Critical patent/JPS6238865B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Static Random-Access Memory (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Abstract

PURPOSE: To compensate for leakage current of the MOS transistor by feeding a slight current to the drain region from a semiconductor substrate composing a static type MOS memory used for the power supply line.
CONSTITUTION: The SiO2 film 34 is spread over the specified region 32 on the surface of the n--type Si substrate 21 and used for the mask to form a p--type region 22. After the removal of the film 34, a thick field SiO2 film 27 is formed at the end of the region 22. Subsequently, a polycrystaline Si-layer 35 is arranged on the region 32 covering over the film 27 located on the both sides thereof while a polycrystaline Si gate electrode 25 on the region 22 through a thin gate SiO2 film 27 while a SiO2 film 36 is formed on the specified region of the layer 35. Thereafter, with the electrode 25 as a mask, an n-type source and the drain regions 23 and 24 are formed by diffusion on the region 22. At the same time, the layer 35 except for under the film 36 is converted into an n-type layers 30 and 31 while an n-type region 33 is formed under the layer 31. In this manner, the region 23 is fed with a slight current from the substrate 21 by way of the layers 33, 31, 29 and 30.
COPYRIGHT: (C)1980,JPO&Japio
JP7298979A 1979-06-12 1979-06-12 Semiconductor device Granted JPS5572069A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7298979A JPS5572069A (en) 1979-06-12 1979-06-12 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7298979A JPS5572069A (en) 1979-06-12 1979-06-12 Semiconductor device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP9360885A Division JPS6134968A (en) 1985-05-02 1985-05-02 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS5572069A true JPS5572069A (en) 1980-05-30
JPS6238865B2 JPS6238865B2 (en) 1987-08-20

Family

ID=13505309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7298979A Granted JPS5572069A (en) 1979-06-12 1979-06-12 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5572069A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60246666A (en) * 1984-05-22 1985-12-06 Seiko Instr & Electronics Ltd Mis transistor inverter
US4792841A (en) * 1980-08-15 1988-12-20 Hitachi, Ltd. Semiconductor devices and a process for producing the same
US4853894A (en) * 1986-07-09 1989-08-01 Hitachi, Ltd. Static random-access memory having multilevel conductive layer

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0623891Y2 (en) * 1987-04-01 1994-06-22 昭和アルミニウム株式会社 Cold storage container
JPS63162280U (en) * 1987-04-09 1988-10-24

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792841A (en) * 1980-08-15 1988-12-20 Hitachi, Ltd. Semiconductor devices and a process for producing the same
JPS60246666A (en) * 1984-05-22 1985-12-06 Seiko Instr & Electronics Ltd Mis transistor inverter
US4853894A (en) * 1986-07-09 1989-08-01 Hitachi, Ltd. Static random-access memory having multilevel conductive layer

Also Published As

Publication number Publication date
JPS6238865B2 (en) 1987-08-20

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