JPS5567644A - Sharpness judgement method for construction material - Google Patents

Sharpness judgement method for construction material

Info

Publication number
JPS5567644A
JPS5567644A JP14102878A JP14102878A JPS5567644A JP S5567644 A JPS5567644 A JP S5567644A JP 14102878 A JP14102878 A JP 14102878A JP 14102878 A JP14102878 A JP 14102878A JP S5567644 A JPS5567644 A JP S5567644A
Authority
JP
Japan
Prior art keywords
rays
incident
sharpness
incident angle
goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14102878A
Other languages
English (en)
Inventor
Makoto Hayashi
Yusaku Nakagawa
Masahiro Koizumi
Tateo Tamamura
Tasuku Shimizu
Kunio Enomoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14102878A priority Critical patent/JPS5567644A/ja
Publication of JPS5567644A publication Critical patent/JPS5567644A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP14102878A 1978-11-17 1978-11-17 Sharpness judgement method for construction material Pending JPS5567644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14102878A JPS5567644A (en) 1978-11-17 1978-11-17 Sharpness judgement method for construction material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14102878A JPS5567644A (en) 1978-11-17 1978-11-17 Sharpness judgement method for construction material

Publications (1)

Publication Number Publication Date
JPS5567644A true JPS5567644A (en) 1980-05-21

Family

ID=15282526

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14102878A Pending JPS5567644A (en) 1978-11-17 1978-11-17 Sharpness judgement method for construction material

Country Status (1)

Country Link
JP (1) JPS5567644A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63165740A (ja) * 1986-12-27 1988-07-09 Mitsubishi Heavy Ind Ltd X線回折装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63165740A (ja) * 1986-12-27 1988-07-09 Mitsubishi Heavy Ind Ltd X線回折装置

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