JPS5536941A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5536941A
JPS5536941A JP10881078A JP10881078A JPS5536941A JP S5536941 A JPS5536941 A JP S5536941A JP 10881078 A JP10881078 A JP 10881078A JP 10881078 A JP10881078 A JP 10881078A JP S5536941 A JPS5536941 A JP S5536941A
Authority
JP
Japan
Prior art keywords
diffusion layers
zener diode
distribution
equal
impurity density
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10881078A
Other languages
Japanese (ja)
Inventor
Giichi Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP10881078A priority Critical patent/JPS5536941A/en
Publication of JPS5536941A publication Critical patent/JPS5536941A/en
Pending legal-status Critical Current

Links

Landscapes

  • Bipolar Transistors (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE: To minimize a deviation of manufacturing conditions and an influence of working temperatures by forming a constant current circuit with resistor and Zener diode having such diffusion layers as are equal in impurity density and distribution.
CONSTITUTION: P-type diffusion layers 2 and 3 are formed on the surface of N-type semiconductor substrate 1, and diffusion layers 4a and 4b which are equal in impurity density and distribution are formed on the diffusion layers 2, 3 respectively. Thus zener diode is constituted between the diffusion layers 2 and 4a. On the other hand, a resistance is constituted between the diffusion layers 3 and 4b. Then, the diffusion layers 2 and 3 are connected electrically, a load is connected between the diffusion layers 4a, 4b, and a voltage is applied between both terminals of Zener diode. Where the voltage exceeds Zener voltage of the Zener diode, a current flowing in the load can be kept constant. Furthermore, since the diffusion layers 4a and 4b are equal in impurity density and distribution, an influence of change in manufacturing conditions or temperatures can be minimized.
COPYRIGHT: (C)1980,JPO&Japio
JP10881078A 1978-09-04 1978-09-04 Semiconductor device Pending JPS5536941A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10881078A JPS5536941A (en) 1978-09-04 1978-09-04 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10881078A JPS5536941A (en) 1978-09-04 1978-09-04 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS5536941A true JPS5536941A (en) 1980-03-14

Family

ID=14494057

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10881078A Pending JPS5536941A (en) 1978-09-04 1978-09-04 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5536941A (en)

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