JPS552991A - Measurement of specific element content by x ray radiation and apparatus therefor - Google Patents

Measurement of specific element content by x ray radiation and apparatus therefor

Info

Publication number
JPS552991A
JPS552991A JP7575179A JP7575179A JPS552991A JP S552991 A JPS552991 A JP S552991A JP 7575179 A JP7575179 A JP 7575179A JP 7575179 A JP7575179 A JP 7575179A JP S552991 A JPS552991 A JP S552991A
Authority
JP
Japan
Prior art keywords
measurement
ray radiation
element content
apparatus therefor
specific element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7575179A
Other languages
English (en)
Japanese (ja)
Inventor
Yohanesu Beetsukurundo Nirusu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPS552991A publication Critical patent/JPS552991A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H05G1/12—Power supply arrangements for feeding the X-ray tube with DC or rectified single-phase AC or double-phase
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP7575179A 1978-06-21 1979-06-18 Measurement of specific element content by x ray radiation and apparatus therefor Pending JPS552991A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Publications (1)

Publication Number Publication Date
JPS552991A true JPS552991A (en) 1980-01-10

Family

ID=20335268

Family Applications (2)

Application Number Title Priority Date Filing Date
JP7575179A Pending JPS552991A (en) 1978-06-21 1979-06-18 Measurement of specific element content by x ray radiation and apparatus therefor
JP1988090072U Expired JPH0334681Y2 (OSRAM) 1978-06-21 1988-07-08

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP1988090072U Expired JPH0334681Y2 (OSRAM) 1978-06-21 1988-07-08

Country Status (11)

Country Link
US (1) US4344181A (OSRAM)
JP (2) JPS552991A (OSRAM)
AU (1) AU522334B2 (OSRAM)
CA (1) CA1139021A (OSRAM)
DE (1) DE2924244C2 (OSRAM)
FI (1) FI72814C (OSRAM)
FR (1) FR2429425A1 (OSRAM)
GB (1) GB2025040B (OSRAM)
NL (1) NL7904500A (OSRAM)
SE (1) SE415804B (OSRAM)
ZA (1) ZA793095B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01503803A (ja) * 1986-09-12 1989-12-21 ブリティッシュ・テクノロジー・グループ・リミテッド 鉱石分析

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE428974B (sv) * 1979-02-07 1983-08-01 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov
US4484341A (en) * 1981-10-02 1984-11-20 Radiation Dynamics, Inc. Method and apparatus for selectively radiating materials with electrons and X-rays
US4731804A (en) * 1984-12-31 1988-03-15 North American Philips Corporation Window configuration of an X-ray tube
FR2600422B1 (fr) * 1986-05-29 1989-10-13 Instruments Sa Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x
US5369679A (en) * 1990-09-05 1994-11-29 Photoelectron Corporation Low power x-ray source with implantable probe for treatment of brain tumors
US5153900A (en) * 1990-09-05 1992-10-06 Photoelectron Corporation Miniaturized low power x-ray source
US5442678A (en) * 1990-09-05 1995-08-15 Photoelectron Corporation X-ray source with improved beam steering
US5452720A (en) * 1990-09-05 1995-09-26 Photoelectron Corporation Method for treating brain tumors
US5115457A (en) * 1990-10-01 1992-05-19 E. I. Du Pont De Nemours And Company Method of determining titanium dioxide content in paint
WO1997007740A1 (en) 1995-08-24 1997-03-06 Interventional Innovations Corporation X-ray catheter
US6377846B1 (en) 1997-02-21 2002-04-23 Medtronic Ave, Inc. Device for delivering localized x-ray radiation and method of manufacture
DE69823406T2 (de) * 1997-02-21 2005-01-13 Medtronic AVE, Inc., Santa Rosa Röntgenvorrichtung versehen mit einer Dehnungsstruktur zur lokalen Bestrahlung des Inneren eines Körpers
FI102697B1 (fi) * 1997-06-26 1999-01-29 Metorex Int Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärjestely ja röntgenputki
US5854822A (en) * 1997-07-25 1998-12-29 Xrt Corp. Miniature x-ray device having cold cathode
US6108402A (en) * 1998-01-16 2000-08-22 Medtronic Ave, Inc. Diamond vacuum housing for miniature x-ray device
US6069938A (en) * 1998-03-06 2000-05-30 Chornenky; Victor Ivan Method and x-ray device using pulse high voltage source
US6195411B1 (en) 1999-05-13 2001-02-27 Photoelectron Corporation Miniature x-ray source with flexible probe
JP2003142294A (ja) * 2001-10-31 2003-05-16 Ge Medical Systems Global Technology Co Llc 高電圧発生回路およびｘ線発生装置
RU2272278C1 (ru) * 2004-11-22 2006-03-20 Государственное образовательное учреждение высшего профессионального образования Томский политехнический университет Способ определения рения, рения в присутствии молибдена и вольфрама методом рентгенофлуоресцентного анализа
KR101428122B1 (ko) 2006-12-15 2014-08-07 라이프본드 엘티디. 젤라틴-트랜스글루타미나아제 지혈 드레싱 및 실란트
US20100008989A1 (en) 2008-06-12 2010-01-14 Ishay Attar Process for manufacture of gelatin solutions and products thereof
EP2543394A1 (en) * 2008-06-18 2013-01-09 Lifebond Ltd A method for enzymatic cross-linking of a protein
CA2728186A1 (en) * 2008-06-18 2009-12-23 Lifebond Ltd Methods and devices for use with sealants
JP5450612B2 (ja) 2008-06-18 2014-03-26 ライフボンド リミテッド 改良された架橋組成物
BR112012015029A2 (pt) 2009-12-22 2017-06-27 Lifebond Ltd matriz reticulada, método para controlar a formação de uma matriz, método ou matriz, método para vedar um tecido contra vazamento de um fluído corporal, agente hemostático ou vedante cirúrgico, composição para vedar um ferimento, uso da composição, composição para um veículo para entrega localizada de fármaco, composição para engenharia de tecido, e método para modificar uma composição
EP2600910B1 (en) 2010-08-05 2016-01-20 Lifebond Ltd Dry composition wound dressings and adhesives
US11998654B2 (en) 2018-07-12 2024-06-04 Bard Shannon Limited Securing implants and medical devices

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE957852C (de) * 1952-02-20 1957-01-17 Telefunken GmbH, Berlin Schaltungsanordnung fur Fernsprechanlagen mit Haupt- und Unteramtern
US2999937A (en) * 1958-10-20 1961-09-12 Philips Corp X-ray apparatus
DE1773759A1 (de) * 1968-07-03 1972-03-16 Vnii Raswedotschnoj Geofisiki Vorrichtung fuer Roentgenspektralanalyse
JPS5435078B1 (OSRAM) * 1970-07-30 1979-10-31
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
JPS5232593B2 (OSRAM) * 1973-09-06 1977-08-23
JPS5346062Y2 (OSRAM) * 1973-11-06 1978-11-04
JPS5139580U (OSRAM) * 1974-09-18 1976-03-24
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
GB1537099A (en) * 1976-06-15 1978-12-29 United Scient Corp X-ray fluorescence device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01503803A (ja) * 1986-09-12 1989-12-21 ブリティッシュ・テクノロジー・グループ・リミテッド 鉱石分析

Also Published As

Publication number Publication date
ZA793095B (en) 1980-08-27
DE2924244C2 (de) 1987-05-07
AU522334B2 (en) 1982-05-27
FR2429425B1 (OSRAM) 1985-04-26
SE415804B (sv) 1980-10-27
FR2429425A1 (fr) 1980-01-18
NL7904500A (nl) 1979-12-28
JPS6419160U (OSRAM) 1989-01-31
FI72814B (fi) 1987-03-31
US4344181A (en) 1982-08-10
DE2924244A1 (de) 1980-01-03
GB2025040A (en) 1980-01-16
FI72814C (fi) 1987-07-10
CA1139021A (en) 1983-01-04
JPH0334681Y2 (OSRAM) 1991-07-23
FI791817A7 (fi) 1979-12-22
SE7807078L (sv) 1979-12-22
AU4823679A (en) 1980-01-03
GB2025040B (en) 1982-11-17

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