JPS55130226A - Voltage division circuit - Google Patents
Voltage division circuitInfo
- Publication number
- JPS55130226A JPS55130226A JP3764179A JP3764179A JPS55130226A JP S55130226 A JPS55130226 A JP S55130226A JP 3764179 A JP3764179 A JP 3764179A JP 3764179 A JP3764179 A JP 3764179A JP S55130226 A JPS55130226 A JP S55130226A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- voltage
- voltages
- resistance
- turned
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/24—Frequency-independent attenuators
- H03H11/245—Frequency-independent attenuators using field-effect transistor
Landscapes
- Analogue/Digital Conversion (AREA)
- Attenuators (AREA)
- Transmission Systems Not Characterized By The Medium Used For Transmission (AREA)
Abstract
PURPOSE:To obtain a voltage division circuit which can extract the voltage fractionated accurately in the optional way via a comparatively small number of the resistance element featuring the accurate value plus the resistance circuit network to which the connection can be altered from outside. CONSTITUTION:Resistance circuit networks RR-A and RR-B receive the alteration and control for their internal connection structure via external control circuit CTC, and division voltage Vm plus V1-Vn are delivered through the connection points of serial resistance circuit groups R1-Rn which are provided between those circuit networks. Then the resistance value shown in the diagram is set as RA=RB=R1= ...=Rn, and then the P-channel FET within both the resistance circuit networks is turned on via circuit CTC. As a result, voltages VP and VQ applied across the circuit are divided as shown in diagram A to be then delivered to each connection point in the form of voltages Vm-Vn. On the other hand, when the N-channel FET is turned on, voltages Vm-Vn are turned into voltages Vm'-Vn'which are shifted toward voltage VP by the voltage which is half of the difference of the adjacent output voltage as shown in diagram B.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3764179A JPS55130226A (en) | 1979-03-29 | 1979-03-29 | Voltage division circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3764179A JPS55130226A (en) | 1979-03-29 | 1979-03-29 | Voltage division circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55130226A true JPS55130226A (en) | 1980-10-08 |
Family
ID=12503269
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3764179A Pending JPS55130226A (en) | 1979-03-29 | 1979-03-29 | Voltage division circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55130226A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5797279U (en) * | 1980-12-08 | 1982-06-15 | ||
JPS6029037A (en) * | 1983-06-20 | 1985-02-14 | Nec Corp | Non-linear analog/digital converter |
JPS61274424A (en) * | 1985-05-29 | 1986-12-04 | Nec Corp | Analog-to-digital converter |
CN102253253A (en) * | 2011-02-11 | 2011-11-23 | 钰创科技股份有限公司 | Circuit with external test voltage |
-
1979
- 1979-03-29 JP JP3764179A patent/JPS55130226A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5797279U (en) * | 1980-12-08 | 1982-06-15 | ||
JPS6029037A (en) * | 1983-06-20 | 1985-02-14 | Nec Corp | Non-linear analog/digital converter |
JPH0144052B2 (en) * | 1983-06-20 | 1989-09-25 | Nippon Electric Co | |
JPS61274424A (en) * | 1985-05-29 | 1986-12-04 | Nec Corp | Analog-to-digital converter |
CN102253253A (en) * | 2011-02-11 | 2011-11-23 | 钰创科技股份有限公司 | Circuit with external test voltage |
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