JPS5512713A - Silicone gate mos semiconductor device - Google Patents
Silicone gate mos semiconductor deviceInfo
- Publication number
- JPS5512713A JPS5512713A JP8407278A JP8407278A JPS5512713A JP S5512713 A JPS5512713 A JP S5512713A JP 8407278 A JP8407278 A JP 8407278A JP 8407278 A JP8407278 A JP 8407278A JP S5512713 A JPS5512713 A JP S5512713A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- polysilicone
- doped
- resistor
- silicone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229920001296 polysiloxane Polymers 0.000 title abstract 4
- 239000004065 semiconductor Substances 0.000 title 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 4
- 230000001681 protective effect Effects 0.000 abstract 3
- 229910052681 coesite Inorganic materials 0.000 abstract 2
- 229910052906 cristobalite Inorganic materials 0.000 abstract 2
- 239000000377 silicon dioxide Substances 0.000 abstract 2
- 235000012239 silicon dioxide Nutrition 0.000 abstract 2
- 229910052682 stishovite Inorganic materials 0.000 abstract 2
- 229910052905 tridymite Inorganic materials 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0288—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using passive elements as protective elements, e.g. resistors, capacitors, inductors, spark-gaps
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Amplifiers (AREA)
Abstract
PURPOSE:To improve heat radiation from a resistor layer in a protective circuit by forming the resistor in the input protective circuit by a doped polysilicone layer in which an undoped silicone layer is used as a polysilicone layer. CONSTITUTION:A resistor layer 32 that is made of a polysilicone doped by P<+> or N<+> is in closely contact with a polysilicone layer 42 that consists of (a); an undoped polysilicone layer, (b); a low density doped polysilicone layer that is the same conductive or opposite conductive type to a doped polysilicone layer in the resistor layer, and (c); a high density doped silicone layer that is oppodite conductive type to the doped polysilicone layer in the resistor layer. Then the first SiO2 layer 33 is cobered on a silicone substrate for instance, and one end of the resistor layer 32 is connected to an input terminal pad 34 and the other end, to 2 pad 44 used for an input protective diode and a gate of MOSIC. Then the second SiO2 layer 43 is covered.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8407278A JPS5512713A (en) | 1978-07-12 | 1978-07-12 | Silicone gate mos semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8407278A JPS5512713A (en) | 1978-07-12 | 1978-07-12 | Silicone gate mos semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5512713A true JPS5512713A (en) | 1980-01-29 |
Family
ID=13820276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8407278A Pending JPS5512713A (en) | 1978-07-12 | 1978-07-12 | Silicone gate mos semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5512713A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5024229A (en) * | 1973-06-30 | 1975-03-15 |
-
1978
- 1978-07-12 JP JP8407278A patent/JPS5512713A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5024229A (en) * | 1973-06-30 | 1975-03-15 |
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