JPS5484789A - Diagnosis method of surface inspector - Google Patents

Diagnosis method of surface inspector

Info

Publication number
JPS5484789A
JPS5484789A JP15260777A JP15260777A JPS5484789A JP S5484789 A JPS5484789 A JP S5484789A JP 15260777 A JP15260777 A JP 15260777A JP 15260777 A JP15260777 A JP 15260777A JP S5484789 A JPS5484789 A JP S5484789A
Authority
JP
Japan
Prior art keywords
counter
abnormality
outputs
surface inspector
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15260777A
Other languages
Japanese (ja)
Other versions
JPS596383B2 (en
Inventor
Shigeru Suzuki
Nobumasa Oya
Yoshio Tomioka
Toyoji Maruyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Steel Corp
Original Assignee
Fujitsu Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Steel Corp filed Critical Fujitsu Ltd
Priority to JP15260777A priority Critical patent/JPS596383B2/en
Publication of JPS5484789A publication Critical patent/JPS5484789A/en
Publication of JPS596383B2 publication Critical patent/JPS596383B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To inspect the normality and abnormality of the surface inspector by alarming the abnormality of the surface inspector when the times of image pickup when the edge of the object being examined is not detected exceed a fixed time. CONSTITUTION:When an abnormality detection circuit 34 corresponding to flaw detection systems 2 thus 5 produces an output, it sets a flip-flop 35 which is reset by the vertical synchronizing signal VD. The outputs of these flip-flops 33, 35 are led to an AND gate 36 and the outputs of the AND gate 36 are counted by a counter 37. Hence, the count value of this counter 37 indicates the number of the pictures where no edges are detected and the abnormality detection circuit 34 has produced outputs. When the count value of this counter reaches a specified value, the counter produces a carrier signal, by which an alarm ALM is emitted to the operator.
JP15260777A 1977-12-19 1977-12-19 Diagnostic method for surface inspection equipment Expired JPS596383B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15260777A JPS596383B2 (en) 1977-12-19 1977-12-19 Diagnostic method for surface inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15260777A JPS596383B2 (en) 1977-12-19 1977-12-19 Diagnostic method for surface inspection equipment

Publications (2)

Publication Number Publication Date
JPS5484789A true JPS5484789A (en) 1979-07-05
JPS596383B2 JPS596383B2 (en) 1984-02-10

Family

ID=15544088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15260777A Expired JPS596383B2 (en) 1977-12-19 1977-12-19 Diagnostic method for surface inspection equipment

Country Status (1)

Country Link
JP (1) JPS596383B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5828653A (en) * 1981-08-13 1983-02-19 Nec Corp Detector for defect on surface of material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5828653A (en) * 1981-08-13 1983-02-19 Nec Corp Detector for defect on surface of material

Also Published As

Publication number Publication date
JPS596383B2 (en) 1984-02-10

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