JPS5756741A - Article inspection device - Google Patents
Article inspection deviceInfo
- Publication number
- JPS5756741A JPS5756741A JP55131855A JP13185580A JPS5756741A JP S5756741 A JPS5756741 A JP S5756741A JP 55131855 A JP55131855 A JP 55131855A JP 13185580 A JP13185580 A JP 13185580A JP S5756741 A JPS5756741 A JP S5756741A
- Authority
- JP
- Japan
- Prior art keywords
- image processing
- generator
- results
- article
- ray generator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title abstract 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Geophysics And Detection Of Objects (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
PURPOSE:To display more adequate inspection images of high accuracy by adding image processing and an automatic parameter setting function of an X-ray generator based on the results thereof to an ariticle inspecting device. CONSTITUTION:The object inspecting device is provided with an image processor 13 having an automatic parameter setting function of an X-ray generator and a display 14 for the results of image processing, besides conventional devices including an X-ray generator 11, an X-ray sensor 12, etc. The 11-14 are operated by a control console 10, by which X-rays are irradiated to an article 7 by the generator 11, and the transmitted X-rays of the article 7 obtained as a result are detected with the sensor 12, and after they are subjected to necessary image processing, they are displayed in the device 14. Now, if the results of the image processing obtained with the processor 13 is not adequate, a new set value is automatically transmitted to the generator 11, and the images meeting the purpose of the inspection are displayed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55131855A JPS5756741A (en) | 1980-09-22 | 1980-09-22 | Article inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55131855A JPS5756741A (en) | 1980-09-22 | 1980-09-22 | Article inspection device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5756741A true JPS5756741A (en) | 1982-04-05 |
Family
ID=15067692
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55131855A Pending JPS5756741A (en) | 1980-09-22 | 1980-09-22 | Article inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5756741A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005321282A (en) * | 2004-05-07 | 2005-11-17 | Hamamatsu Photonics Kk | X-ray inspection device |
-
1980
- 1980-09-22 JP JP55131855A patent/JPS5756741A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005321282A (en) * | 2004-05-07 | 2005-11-17 | Hamamatsu Photonics Kk | X-ray inspection device |
JP4563072B2 (en) * | 2004-05-07 | 2010-10-13 | 浜松ホトニクス株式会社 | X-ray inspection equipment |
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