JPS5459199A - Ion concentration measuring apparatus - Google Patents

Ion concentration measuring apparatus

Info

Publication number
JPS5459199A
JPS5459199A JP12602277A JP12602277A JPS5459199A JP S5459199 A JPS5459199 A JP S5459199A JP 12602277 A JP12602277 A JP 12602277A JP 12602277 A JP12602277 A JP 12602277A JP S5459199 A JPS5459199 A JP S5459199A
Authority
JP
Japan
Prior art keywords
switch
standard solutions
kinds
concentration
energize
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12602277A
Other languages
English (en)
Inventor
Kiyozo Koshiishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP12602277A priority Critical patent/JPS5459199A/ja
Priority to US05/950,294 priority patent/US4218746A/en
Priority to DE2845805A priority patent/DE2845805C2/de
Publication of JPS5459199A publication Critical patent/JPS5459199A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus
    • G01N27/4165—Systems checking the operation of, or calibrating, the measuring apparatus for pH meters

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Molecular Biology (AREA)
  • Electrochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP12602277A 1977-10-20 1977-10-20 Ion concentration measuring apparatus Pending JPS5459199A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP12602277A JPS5459199A (en) 1977-10-20 1977-10-20 Ion concentration measuring apparatus
US05/950,294 US4218746A (en) 1977-10-20 1978-10-11 Method and apparatus for calibrating ion concentration measurement
DE2845805A DE2845805C2 (de) 1977-10-20 1978-10-20 Verfahren und Vorrichtung zum Messen von Ionenkonzentrationen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12602277A JPS5459199A (en) 1977-10-20 1977-10-20 Ion concentration measuring apparatus

Publications (1)

Publication Number Publication Date
JPS5459199A true JPS5459199A (en) 1979-05-12

Family

ID=14924762

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12602277A Pending JPS5459199A (en) 1977-10-20 1977-10-20 Ion concentration measuring apparatus

Country Status (3)

Country Link
US (1) US4218746A (ja)
JP (1) JPS5459199A (ja)
DE (1) DE2845805C2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5793248A (en) * 1980-12-01 1982-06-10 Joko:Kk Method and device for measuring ion concentration
JPS6021443A (ja) * 1983-07-15 1985-02-02 Nippon Paint Co Ltd アルミニウム食品罐表面処理液のフツ酸濃度の自動測定装置

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2929387C3 (de) * 1979-07-20 1982-01-07 Drägerwerk AG, 2400 Lübeck Elektronische Kalibrierung elektrochemischer Sensoren
DE2937227C2 (de) * 1979-09-14 1982-09-23 Dipl.Ing. Ulrich Knick Elektronische Meßgeräte GmbH & Co, 1000 Berlin Verfahren zum Eichen eines elektrometrischen pH-Meßgeräts und eine Vorrichtung zur Durchführung des Verfahrens
FR2482306A1 (fr) * 1980-05-08 1981-11-13 Eaux Cie Gle Procede d'etalonnage d'appareils automatiques de mesure et dispositif pour sa mise en oeuvre
US4443117A (en) * 1980-09-26 1984-04-17 Terumo Corporation Measuring apparatus, method of manufacture thereof, and method of writing data into same
HU180405B (en) * 1981-03-26 1983-03-28 Nii Ex I Avtomobil Elektroobor Device for individual feeding winding units to winding machines
US4460967A (en) * 1981-07-16 1984-07-17 Krull Irwin H Electronic circuit for measuring and displaying ion concentration in fluid
EP0074498B1 (de) * 1981-09-04 1985-12-04 F. HOFFMANN-LA ROCHE & CO. Aktiengesellschaft Verfahren und Vorrichtung zum Eichen von Messfühlern
US4482967A (en) * 1981-09-18 1984-11-13 Dionex Corporation Conductivity detector and method
JPS58109837A (ja) * 1981-12-24 1983-06-30 Olympus Optical Co Ltd 検量線補正方法
JPS5951338A (ja) * 1982-09-17 1984-03-24 Horiba Ltd 光フアイバ−結合型イオン濃度測定装置
NL8303792A (nl) * 1983-11-03 1985-06-03 Cordis Europ Inrichting voorzien van een op een isfet gebaseerd meetcircuit; voor toepassing in het meetcircuit geschikte isfet en werkwijze ter vervaardiging van een in het meetcircuit toe te passen isfet.
US4627014A (en) * 1984-04-09 1986-12-02 Eastman Kodak Company Method and apparatus for determination of an analyte and method of calibrating such apparatus
US4784729A (en) * 1986-08-29 1988-11-15 Cities Service Oil And Gas Corporation Electrochemical analysis method using corrosion probe
DE3437445A1 (de) * 1984-10-12 1986-05-07 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren und einrichtung zur kompensation der temperaturabhaengigkeit einer elektrochemischen messzelle
DE3505342C2 (de) * 1985-02-15 1995-06-22 Wtw Weilheim Verfahren zum automatischen Eichen eines elektrischen Meßgerätes mit potentiometrischen Meßketten, insbesondree pH-Elektroden
US4766550A (en) * 1985-10-30 1988-08-23 Westinghouse Electric Corp. Automatic on-line chemistry monitoring system
EP0241601B1 (en) * 1986-04-15 1990-02-07 Yokogawa Europe B.V. Device for testing the integrity of an electrode in a potentiometric measuring electrode system
FR2599835B1 (fr) * 1986-06-04 1988-08-26 Bendix Electronics Sa Procede et dispositif de mesure du niveau de la surface libre d'un liquide
US4935875A (en) * 1987-12-02 1990-06-19 Data Chem, Inc. Chemical analyzer
US4956610A (en) * 1988-02-12 1990-09-11 Pgm Diversified Industries, Inc. Current density measurement system by self-sustaining magnetic oscillation
US5022980A (en) * 1988-12-30 1991-06-11 Kabushiki Kaisha Toshiba System for determining concentration of an electrolyte
US5180968A (en) * 1991-03-01 1993-01-19 Research Foundation Of State University Of New York Method and apparatus for compensation of double layer charging current in electrochemical cells
GB9107036D0 (en) * 1991-04-04 1991-05-22 Kodak Ltd Electrode calibration
FR2677454B1 (fr) * 1991-06-10 1994-08-05 Electronique Appliquee Ste Lyo Procede et appareil pour la mesure potentiometrique de la concentration d'une espece chimique chargee ou d'un gaz dissous.
US5469070A (en) * 1992-10-16 1995-11-21 Rosemount Analytical Inc. Circuit for measuring source resistance of a sensor
GB9726534D0 (en) * 1997-12-17 1998-02-11 Eastman Kodak Co Determination of silver in a photographic solution
DE19825159A1 (de) * 1998-06-05 1999-12-09 Bosch Gmbh Robert Elektronische Schaltung
WO2000077476A1 (de) * 1999-06-15 2000-12-21 Siemens Aktiengesellschaft Messumformer
WO2003052387A2 (en) 2001-12-14 2003-06-26 Rosemount Analytical Inc. A pH SENSOR WITH INTERNAL SOLUTION GROUND
JP6888872B2 (ja) 2015-09-30 2021-06-16 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． マグネシウムイオン測定用流体分析装置及びその中の電位差式マグネシウムイオンセンサの較正方法
CA3126048C (en) * 2019-03-08 2023-09-12 Ball Wave Inc. System, method and program for calibrating moisture sensor
CN112540110B (zh) * 2020-11-30 2022-05-20 正大康地(开封)生物科技有限公司 一种利用离子选择性电极测定饲料中钙含量的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3600567A (en) * 1969-03-17 1971-08-17 Angstrom Inc Method and apparatus for analog computation of concentrations
US3824453A (en) * 1969-11-05 1974-07-16 Texas Instruments Inc Method of determining concentrations
US3865708A (en) * 1969-12-22 1975-02-11 Foxboro Co Apparatus for measuring ionic concentration
US3862895A (en) * 1970-06-05 1975-01-28 Great Lakes Instruments Inc Self-compensating electrode system
US4020329A (en) * 1971-10-21 1977-04-26 Austrailian Atomic Energy Commission Apparatus for radiation dose measurement
FI58698C (fi) * 1974-08-05 1981-03-10 Mitsui Mining & Smelting Co System foer automatisk och kontinuerlig maetning av zink- och svavelsyrakoncentrationer i cirkulerande elektrolyt
US3960497A (en) * 1975-08-19 1976-06-01 Beckman Instruments, Inc. Chemical analyzer with automatic calibration
US4060717A (en) * 1975-10-30 1977-11-29 Leco Corporation Acid tester
US4039933A (en) * 1976-03-25 1977-08-02 Instrumentation Laboratory, Inc. Continuous calibration system and method for analytical instruments
US4028534A (en) * 1976-04-14 1977-06-07 The United States Of America As Represented By The Secretary Of The Army Automatic span circuit
US4048041A (en) * 1976-05-24 1977-09-13 The United States Of America As Represented By The Secretary Of The Army Electronic system for providing specificity in an electrochemical analytical device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5793248A (en) * 1980-12-01 1982-06-10 Joko:Kk Method and device for measuring ion concentration
JPS6021443A (ja) * 1983-07-15 1985-02-02 Nippon Paint Co Ltd アルミニウム食品罐表面処理液のフツ酸濃度の自動測定装置

Also Published As

Publication number Publication date
DE2845805A1 (de) 1979-04-26
US4218746A (en) 1980-08-19
DE2845805C2 (de) 1983-10-06

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