JPS5449165A - Automatic appearance inspection apparatus - Google Patents
Automatic appearance inspection apparatusInfo
- Publication number
- JPS5449165A JPS5449165A JP11580277A JP11580277A JPS5449165A JP S5449165 A JPS5449165 A JP S5449165A JP 11580277 A JP11580277 A JP 11580277A JP 11580277 A JP11580277 A JP 11580277A JP S5449165 A JPS5449165 A JP S5449165A
- Authority
- JP
- Japan
- Prior art keywords
- camera
- straight line
- comparator circuit
- signal
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
PURPOSE: To distinguish the flaw, soiling, deformation and other defects of the surface of dry cells or the like and sort good products from defective products, without accurately matching with the specified dimensions, by comparing two signals obtained at adjacent parts on the object being inspected in a comparator circuit.
CONSTITUTION: The object being inspected 6 is placed on a rotary table 7, opposite to a camera 1, and is illuminated by a illumination 5 such as a circle-lined fluorescent lamp or the like. The reflected light is introduced into the camera 1. The beams of light reflected from parts (a), (b), and (c) of the object 6 are successively admitted into the camera 1, and the outputs thereof are temporarily stored in a shift register circuit 11 and are at the same time sent into a comparator circuit 12. This comparator circuit 12 compares the signal on the straight line (a) from the register 11 with the signal on the straight line (b) from the camera 1, and, when a difference beyond a specified value is found, emits a defect detecting signal. In consequence, the output on the straight line (b) is compared with that on the straight line (c), and the observation on the entire surface is terminated when the rotary table 7 makes a 180-degree turn
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11580277A JPS5449165A (en) | 1977-09-26 | 1977-09-26 | Automatic appearance inspection apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11580277A JPS5449165A (en) | 1977-09-26 | 1977-09-26 | Automatic appearance inspection apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5449165A true JPS5449165A (en) | 1979-04-18 |
Family
ID=14671435
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11580277A Pending JPS5449165A (en) | 1977-09-26 | 1977-09-26 | Automatic appearance inspection apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5449165A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60113510U (en) * | 1984-01-06 | 1985-08-01 | パイオニア株式会社 | Physical quantity change detection device |
| JPS62180254A (en) * | 1986-02-05 | 1987-08-07 | Ngk Insulators Ltd | Automatic visual inspection method |
| CN112024422A (en) * | 2020-07-15 | 2020-12-04 | 镇江苏仪德科技有限公司 | Button cell surface defect detecting system |
-
1977
- 1977-09-26 JP JP11580277A patent/JPS5449165A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60113510U (en) * | 1984-01-06 | 1985-08-01 | パイオニア株式会社 | Physical quantity change detection device |
| JPS62180254A (en) * | 1986-02-05 | 1987-08-07 | Ngk Insulators Ltd | Automatic visual inspection method |
| CN112024422A (en) * | 2020-07-15 | 2020-12-04 | 镇江苏仪德科技有限公司 | Button cell surface defect detecting system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ES447225A1 (en) | Method and apparatus for video inspection of articles of manufacture by decussate paths of light | |
| AU2210683A (en) | Photomultiplier testing for defects | |
| JPS5553425A (en) | Pattern inspection | |
| JPS5658676A (en) | Inspection device | |
| CN111721782A (en) | Optical detection device | |
| JPS54114264A (en) | Screw inspection method | |
| JPS5449165A (en) | Automatic appearance inspection apparatus | |
| JPS55134339A (en) | Inspecting device of lens | |
| JPS55149830A (en) | Inspection apparatus for appearance of spherical body | |
| JPS643545A (en) | Method and apparatus for inspection | |
| ES8305929A1 (en) | Method and device for the inspection of transparent material sheets. | |
| JPS51136478A (en) | Defect inspection device | |
| KR940005944A (en) | Surface Defect Inspection System | |
| JPS5224554A (en) | Surface inspection device | |
| JPS5518926A (en) | Flaw inspector for glass bottle drum | |
| JPS57184956A (en) | Inspecting device of surface defect | |
| JPS56126706A (en) | Inspecting device for bottle | |
| JPH0565816B2 (en) | ||
| JPS5720650A (en) | Inspecting method for annular body | |
| JPS57208153A (en) | Inspecting method for defective aluminum pattern of semiconductor or the like | |
| GB899855A (en) | Improvements in inspection of sheet materials by photo-electric means | |
| JPS5312377A (en) | Inspecting apparatus for surface | |
| JPS5669537A (en) | Defect inspection device | |
| JPS5465595A (en) | Defect inspector | |
| JPS5696204A (en) | Inspection system for defect of continuous pattern |