KR940005944A - Surface Defect Inspection System - Google Patents
Surface Defect Inspection System Download PDFInfo
- Publication number
- KR940005944A KR940005944A KR1019930009039A KR930009039A KR940005944A KR 940005944 A KR940005944 A KR 940005944A KR 1019930009039 A KR1019930009039 A KR 1019930009039A KR 930009039 A KR930009039 A KR 930009039A KR 940005944 A KR940005944 A KR 940005944A
- Authority
- KR
- South Korea
- Prior art keywords
- light
- defect
- inspection
- detection means
- defects
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Closed-Circuit Television Systems (AREA)
- Image Analysis (AREA)
Abstract
광도가 변화하는 검사광을 피검사면에 조사하고 그 반7i긍출 포착한 수긍흑릉중극 명조럴뵉를 바팅츠로 피검사면의 표면결함을 검사하는 경우에 상기 한 피검사면의 평면평활성이 나쁜경우나 그 피 검사면 이 곡면헝상으로 되어 있는 경우에도 표면결함의 검출정밀도를 저하시키지 않으면서 결함의 종류를 정화하게 판별할 수가 있도록 하는 것을 목적으로 한다.In the case of irradiating the inspection surface with varying luminosity on the inspection surface and inspecting the surface defects of the inspection surface with the Bartings, the surface flatness of the inspection surface is bad, or Even if the surface to be inspected has a curved surface, an object of the present invention is to enable the type of defect to be purified to be purified without degrading the detection accuracy of the surface defect.
광조사수단(5)에 의해 도장면(1a)에 대해 소정의 명암분포로 점차 밝게 변화하는 명암광(5a)를 조사하고 그 도장면(1a)로부터의 반사광(5a)를 CCD카메라(6)에 의해 포착되어 수광화상을 작성하고 그 수광 화상의 명암변화를 바탕으로 도장결함을 검출함과 동시에 수광화상의 명암분포의 방향과 그 화상중에서 결함부의 명암분포의 방향등을 바탕으로해서 그 결함의 종류를 관정한다.The light irradiation means 5 irradiates the light and shade 5a gradually changing brightly with respect to the coating surface 1a at a predetermined contrast distribution, and reflects the reflected light 5a from the coating surface 1a to the CCD camera 6. Is used to create a light-receiving image, detect paint defects based on changes in the intensity of the received image, and detect defects on the basis of the direction of the light and dark distribution of the light-receiving image and the direction of the intensity distribution of the defects in the image. Determine the kind.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제1도는 표면견함검사장치의 개략구성을 나타낸 사시도.1 is a perspective view showing a schematic configuration of a surface integrity inspection device.
제2도는 광조사수단의 분해사시도.2 is an exploded perspective view of the light irradiation means.
제3도는 명암분포의 패턴을 나타낸 그래프.3 is a graph showing the pattern of contrast distribution.
제4도는 광조사수단에 의한 조사상태 및 CCD카메라에 의한 수광상태를 나타낸 확대도.4 is an enlarged view showing the irradiation state by the light irradiation means and the light receiving state by the CCD camera.
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4155846A JPH05322543A (en) | 1992-05-22 | 1992-05-22 | Surface defect inspection device |
JP92-155846 | 1992-05-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR940005944A true KR940005944A (en) | 1994-03-22 |
Family
ID=15614780
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019930009039A KR940005944A (en) | 1992-05-22 | 1993-05-22 | Surface Defect Inspection System |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH05322543A (en) |
KR (1) | KR940005944A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6606394B1 (en) | 1999-12-09 | 2003-08-12 | Electronics And Telecommunications Research Institute | Surface inspecting apparatus and method therefor |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8615125B2 (en) | 2010-10-08 | 2013-12-24 | Omron Corporation | Apparatus and method for inspecting surface state |
JP6197884B2 (en) * | 2014-11-18 | 2017-09-20 | 三菱ケミカル株式会社 | Metal plate repair method and mold manufacturing method |
JP6570113B2 (en) * | 2015-06-25 | 2019-09-04 | ダイハツ工業株式会社 | How to determine whether a defect is acceptable |
IT201700077459A1 (en) | 2017-07-10 | 2019-01-10 | Tekno Idea Srl | DEVICE AND PROCEDURE FOR DETECTION OF SURFACE DEFECTS |
-
1992
- 1992-05-22 JP JP4155846A patent/JPH05322543A/en active Pending
-
1993
- 1993-05-22 KR KR1019930009039A patent/KR940005944A/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6606394B1 (en) | 1999-12-09 | 2003-08-12 | Electronics And Telecommunications Research Institute | Surface inspecting apparatus and method therefor |
Also Published As
Publication number | Publication date |
---|---|
JPH05322543A (en) | 1993-12-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |