KR940005944A - Surface Defect Inspection System - Google Patents

Surface Defect Inspection System Download PDF

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Publication number
KR940005944A
KR940005944A KR1019930009039A KR930009039A KR940005944A KR 940005944 A KR940005944 A KR 940005944A KR 1019930009039 A KR1019930009039 A KR 1019930009039A KR 930009039 A KR930009039 A KR 930009039A KR 940005944 A KR940005944 A KR 940005944A
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KR
South Korea
Prior art keywords
light
defect
inspection
detection means
defects
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Application number
KR1019930009039A
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Korean (ko)
Inventor
히로시 이께다
가즈모또 다나까
Original Assignee
와다 요시히로
마쓰다 가부시끼가이샤
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Application filed by 와다 요시히로, 마쓰다 가부시끼가이샤 filed Critical 와다 요시히로
Publication of KR940005944A publication Critical patent/KR940005944A/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

광도가 변화하는 검사광을 피검사면에 조사하고 그 반7i긍출 포착한 수긍흑릉중극 명조럴뵉를 바팅츠로 피검사면의 표면결함을 검사하는 경우에 상기 한 피검사면의 평면평활성이 나쁜경우나 그 피 검사면 이 곡면헝상으로 되어 있는 경우에도 표면결함의 검출정밀도를 저하시키지 않으면서 결함의 종류를 정화하게 판별할 수가 있도록 하는 것을 목적으로 한다.In the case of irradiating the inspection surface with varying luminosity on the inspection surface and inspecting the surface defects of the inspection surface with the Bartings, the surface flatness of the inspection surface is bad, or Even if the surface to be inspected has a curved surface, an object of the present invention is to enable the type of defect to be purified to be purified without degrading the detection accuracy of the surface defect.

광조사수단(5)에 의해 도장면(1a)에 대해 소정의 명암분포로 점차 밝게 변화하는 명암광(5a)를 조사하고 그 도장면(1a)로부터의 반사광(5a)를 CCD카메라(6)에 의해 포착되어 수광화상을 작성하고 그 수광 화상의 명암변화를 바탕으로 도장결함을 검출함과 동시에 수광화상의 명암분포의 방향과 그 화상중에서 결함부의 명암분포의 방향등을 바탕으로해서 그 결함의 종류를 관정한다.The light irradiation means 5 irradiates the light and shade 5a gradually changing brightly with respect to the coating surface 1a at a predetermined contrast distribution, and reflects the reflected light 5a from the coating surface 1a to the CCD camera 6. Is used to create a light-receiving image, detect paint defects based on changes in the intensity of the received image, and detect defects on the basis of the direction of the light and dark distribution of the light-receiving image and the direction of the intensity distribution of the defects in the image. Determine the kind.

Description

표면결함검사장치Surface Defect Inspection System

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 표면견함검사장치의 개략구성을 나타낸 사시도.1 is a perspective view showing a schematic configuration of a surface integrity inspection device.

제2도는 광조사수단의 분해사시도.2 is an exploded perspective view of the light irradiation means.

제3도는 명암분포의 패턴을 나타낸 그래프.3 is a graph showing the pattern of contrast distribution.

제4도는 광조사수단에 의한 조사상태 및 CCD카메라에 의한 수광상태를 나타낸 확대도.4 is an enlarged view showing the irradiation state by the light irradiation means and the light receiving state by the CCD camera.

Claims (2)

광도 혹은 복도중의 적어도 한쪽이 변화하는 검사광을 피검사면에 조사해 그 피검사면으로부터의 반싸광을 포착해서 수광화상을 작성함과 동시에 그 수광화상중의 명도련화 흑은 색조변화를 바탕으로 피 검사면의 표면결함을 검사하는 표면결함 검사장치이며 상기한 수광화상중의 명암분포 혹은 색조변화가 구위와 다른 곳을 판별함으로써 피검사면의 표면결함을 검출하는 결항검출수단과 그 결함검출수단에 의해 검출퇸 결함의 주위에 있어서 수광화상의 명암분포 혹은 색조변화의 밧항을 검출하는 제1검출수단과 상기한 수강화상중의 결함부에 있어서 명암 분포 혹은 색조변화의 방향을 검출하는 제2검출 수단과 상기한 제1, 제2검출수단에 의해 겅출된 방항을 비교함으로써 결함의 종류를 판정하는 종류 판정수단을 갖추는 것을 특징으로 하는 표면결함 검출장치.Irradiating inspection light that changes at least one of the light intensity or the corridor to the inspection surface to capture the half-light from the inspection surface to create a light receiving image, and at the same time, based on the change of the brightness of the light receiving image A surface defect inspection apparatus for inspecting surface defects on an inspection surface, which includes a defect detection means and a defect detection means for detecting surface defects on an inspected surface by discriminating the intensity distribution or color tone change in the light-receiving image from a sphere. First detection means for detecting a light intensity distribution or a change in color tone around the detected defect and a second detection means for detecting the direction of light intensity distribution or color tone change at the defect in the above-mentioned water-received image; A table comprising a kind determining means for determining the kind of a defect by comparing the items caused by the first and second detecting means described above. Defect detection device. 제1항에 있어서, 제2검출수단은 결함부에서 밝은 부분 및 어두운 부분의 각 중심위치를 연결하는 직선의 방향에 의해 그 견함부의 명암될포의 방향을 검풀하도록 구성된 것을 특징으로 하는 표면결함검사장치The surface defect inspection as claimed in claim 1, wherein the second detection means is configured to check the direction of the light and dark cloth of the shoulder part by the direction of the straight line connecting the respective central positions of the light and dark portions in the defect portion. Device ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930009039A 1992-05-22 1993-05-22 Surface Defect Inspection System KR940005944A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP92-155846 1992-05-22
JP4155846A JPH05322543A (en) 1992-05-22 1992-05-22 Surface defect inspection device

Publications (1)

Publication Number Publication Date
KR940005944A true KR940005944A (en) 1994-03-22

Family

ID=15614780

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930009039A KR940005944A (en) 1992-05-22 1993-05-22 Surface Defect Inspection System

Country Status (2)

Country Link
JP (1) JPH05322543A (en)
KR (1) KR940005944A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6606394B1 (en) 1999-12-09 2003-08-12 Electronics And Telecommunications Research Institute Surface inspecting apparatus and method therefor

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8615125B2 (en) 2010-10-08 2013-12-24 Omron Corporation Apparatus and method for inspecting surface state
WO2016080401A1 (en) * 2014-11-18 2016-05-26 三菱レイヨン株式会社 Method for mending metallic plate and method for manufacturing mold
JP6570113B2 (en) * 2015-06-25 2019-09-04 ダイハツ工業株式会社 How to determine whether a defect is acceptable
IT201700077459A1 (en) 2017-07-10 2019-01-10 Tekno Idea Srl DEVICE AND PROCEDURE FOR DETECTION OF SURFACE DEFECTS

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6606394B1 (en) 1999-12-09 2003-08-12 Electronics And Telecommunications Research Institute Surface inspecting apparatus and method therefor

Also Published As

Publication number Publication date
JPH05322543A (en) 1993-12-07

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