JPS5442196A - Sample analyzing apparatus by charged particle beams - Google Patents
Sample analyzing apparatus by charged particle beamsInfo
- Publication number
- JPS5442196A JPS5442196A JP10904677A JP10904677A JPS5442196A JP S5442196 A JPS5442196 A JP S5442196A JP 10904677 A JP10904677 A JP 10904677A JP 10904677 A JP10904677 A JP 10904677A JP S5442196 A JPS5442196 A JP S5442196A
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- analyzing apparatus
- particle beams
- sample analyzing
- common use
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 title abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10904677A JPS5442196A (en) | 1977-09-09 | 1977-09-09 | Sample analyzing apparatus by charged particle beams |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10904677A JPS5442196A (en) | 1977-09-09 | 1977-09-09 | Sample analyzing apparatus by charged particle beams |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5442196A true JPS5442196A (en) | 1979-04-03 |
JPS6212464B2 JPS6212464B2 (enrdf_load_stackoverflow) | 1987-03-18 |
Family
ID=14500226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10904677A Granted JPS5442196A (en) | 1977-09-09 | 1977-09-09 | Sample analyzing apparatus by charged particle beams |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5442196A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6245648U (enrdf_load_stackoverflow) * | 1985-09-09 | 1987-03-19 | ||
JPS63162269U (enrdf_load_stackoverflow) * | 1987-04-13 | 1988-10-24 |
-
1977
- 1977-09-09 JP JP10904677A patent/JPS5442196A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6212464B2 (enrdf_load_stackoverflow) | 1987-03-18 |
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