JPS5582025A - Spectrophotometer of sample alternate measurement type - Google Patents
Spectrophotometer of sample alternate measurement typeInfo
- Publication number
- JPS5582025A JPS5582025A JP15555178A JP15555178A JPS5582025A JP S5582025 A JPS5582025 A JP S5582025A JP 15555178 A JP15555178 A JP 15555178A JP 15555178 A JP15555178 A JP 15555178A JP S5582025 A JPS5582025 A JP S5582025A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- fed
- difference
- unit
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
Abstract
PURPOSE:To avoid the effect of drift of the unit and to enable measurement with good S/N, by the alternate measurement of reference sample and sampled test piece and sequentially integrating the difference or ratio. CONSTITUTION:The light from the light source 1 transmits the sample after spectrum at the spectro unit 2, it is converted into electric signal at the detector 5 and enters the amplifier 6 and fed to the computer 7 and stored. The sample consists of the sample test piece 3 and the reference sample 4, the both are fitted on the sample exchanger 8 and are fed to the optical path alternately and measurement is made. Thus, the said both samples are fed to the light path alternately and in continuous manner, the computer integrates the difference or ratio of the both signals sequentially with the repetition of the said operation, and final measuring result is obtained after the elapse of a given time. Since the difference of the measuring time to obtain the both said signals is slight, the measuring condition is kept constant and the drift of the unit can not be almost produced.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15555178A JPS5582025A (en) | 1978-12-16 | 1978-12-16 | Spectrophotometer of sample alternate measurement type |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15555178A JPS5582025A (en) | 1978-12-16 | 1978-12-16 | Spectrophotometer of sample alternate measurement type |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5582025A true JPS5582025A (en) | 1980-06-20 |
Family
ID=15608528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15555178A Pending JPS5582025A (en) | 1978-12-16 | 1978-12-16 | Spectrophotometer of sample alternate measurement type |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5582025A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0966674A4 (en) * | 1997-03-10 | 2001-09-12 | Bio Rad Laboratories | Method and apparatus for removal of non-uniformities in an electrophoresis apparatus |
| WO2005114232A2 (en) * | 2004-05-14 | 2005-12-01 | Ihp Gmbh - Innovations For High Performance Microelectronics / Institut Für Innovative Mikroelektronik | Method and apparatus for the determination of the concentration of impurities in a wafer |
-
1978
- 1978-12-16 JP JP15555178A patent/JPS5582025A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0966674A4 (en) * | 1997-03-10 | 2001-09-12 | Bio Rad Laboratories | Method and apparatus for removal of non-uniformities in an electrophoresis apparatus |
| WO2005114232A2 (en) * | 2004-05-14 | 2005-12-01 | Ihp Gmbh - Innovations For High Performance Microelectronics / Institut Für Innovative Mikroelektronik | Method and apparatus for the determination of the concentration of impurities in a wafer |
| WO2005114232A3 (en) * | 2004-05-14 | 2006-08-31 | Ik Ihp Gmbh Innovations For Hi | Method and apparatus for the determination of the concentration of impurities in a wafer |
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