JPS54130983A - Range control mechanism - Google Patents

Range control mechanism

Info

Publication number
JPS54130983A
JPS54130983A JP3316179A JP3316179A JPS54130983A JP S54130983 A JPS54130983 A JP S54130983A JP 3316179 A JP3316179 A JP 3316179A JP 3316179 A JP3316179 A JP 3316179A JP S54130983 A JPS54130983 A JP S54130983A
Authority
JP
Japan
Prior art keywords
control mechanism
range control
range
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3316179A
Other languages
English (en)
Inventor
Shinkeru Uiremu
Buerusurueisu Korunerisu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of JPS54130983A publication Critical patent/JPS54130983A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP3316179A 1978-03-21 1979-03-20 Range control mechanism Pending JPS54130983A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7803026A NL7803026A (nl) 1978-03-21 1978-03-21 Instelmechanisme.

Publications (1)

Publication Number Publication Date
JPS54130983A true JPS54130983A (en) 1979-10-11

Family

ID=19830531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3316179A Pending JPS54130983A (en) 1978-03-21 1979-03-20 Range control mechanism

Country Status (9)

Country Link
US (1) US4236072A (ja)
JP (1) JPS54130983A (ja)
CA (1) CA1135877A (ja)
CH (1) CH640057A5 (ja)
DE (1) DE2908173A1 (ja)
FR (1) FR2420755A1 (ja)
GB (1) GB2017470B (ja)
NL (1) NL7803026A (ja)
SE (1) SE439067B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153153A (ja) * 1983-02-04 1984-09-01 エヌ・ベ−・フイリップス・フル−イランペンファブリケン Ｘ線分析装置
JP2005515435A (ja) * 2002-01-21 2005-05-26 エックスアールディ−トールズ ソシエタ ア レスポンサビリタ リミタータ 回折計及び回折分析方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
GB2198920B (en) * 1986-12-18 1990-11-14 Univ Moskovsk Apparatus for x-ray studies of crystalline matter
NL8702475A (nl) * 1987-10-16 1989-05-16 Philips Nv Roentgen analyse apparaat.
US4959848A (en) * 1987-12-16 1990-09-25 Axic Inc. Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
JP3525188B2 (ja) * 2001-06-06 2004-05-10 理学電機工業株式会社 蛍光ｘ線分析装置
US7310410B2 (en) * 2004-07-28 2007-12-18 General Electric Co. Single-leaf X-ray collimator

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3566111A (en) * 1967-06-19 1971-02-23 Siemens Ag Apparatus for varying the detector slit width in fully focusing x-ray spectrometers

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153153A (ja) * 1983-02-04 1984-09-01 エヌ・ベ−・フイリップス・フル−イランペンファブリケン Ｘ線分析装置
JP2005515435A (ja) * 2002-01-21 2005-05-26 エックスアールディ−トールズ ソシエタ ア レスポンサビリタ リミタータ 回折計及び回折分析方法

Also Published As

Publication number Publication date
US4236072A (en) 1980-11-25
NL7803026A (nl) 1979-09-25
GB2017470A (en) 1979-10-03
FR2420755A1 (fr) 1979-10-19
SE7902405L (sv) 1979-09-22
FR2420755B1 (ja) 1984-01-13
CH640057A5 (de) 1983-12-15
CA1135877A (en) 1982-11-16
GB2017470B (en) 1982-05-26
SE439067B (sv) 1985-05-28
DE2908173A1 (de) 1979-09-27

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