FR2420755A1 - Mecanisme de mise au point, notamment pour spectrometre a rayons x - Google Patents

Mecanisme de mise au point, notamment pour spectrometre a rayons x

Info

Publication number
FR2420755A1
FR2420755A1 FR7907169A FR7907169A FR2420755A1 FR 2420755 A1 FR2420755 A1 FR 2420755A1 FR 7907169 A FR7907169 A FR 7907169A FR 7907169 A FR7907169 A FR 7907169A FR 2420755 A1 FR2420755 A1 FR 2420755A1
Authority
FR
France
Prior art keywords
crystal
disc
indicator
shaft
ray spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7907169A
Other languages
English (en)
Other versions
FR2420755B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of FR2420755A1 publication Critical patent/FR2420755A1/fr
Application granted granted Critical
Publication of FR2420755B1 publication Critical patent/FR2420755B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Mécanisme servant à modifier l'espacement entre l'indicateur et un cristal de mesure dans un spectromètre à rayons X, le cristal étant disposé sur un arbre rotatif et l'indicateur sur un bras pouvant effectuer un mouvement circulaire autour de l'arbre du cristal, ce dernier et le bras de l'indicateur étant accouplés de façon qu'une rotation de l'arbre de cristal d'un angle theta s'accompagne d'une rotation du bras d'indicateur d'un angle theta alors que sur l'arbre de cristal est disposé un premier disque à rayon r et, de façon rotative, un second disque présentant un rayon 2r, une bande ou une corde passe par chacun des deux galets de guidage, alors qu'une extrémité de cette dernière est fixée au premier disque, l'autre extrémité au second disque. Application aux spectromètres à rayons X.
FR7907169A 1978-03-21 1979-03-21 Mecanisme de mise au point, notamment pour spectrometre a rayons x Granted FR2420755A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7803026A NL7803026A (nl) 1978-03-21 1978-03-21 Instelmechanisme.

Publications (2)

Publication Number Publication Date
FR2420755A1 true FR2420755A1 (fr) 1979-10-19
FR2420755B1 FR2420755B1 (fr) 1984-01-13

Family

ID=19830531

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7907169A Granted FR2420755A1 (fr) 1978-03-21 1979-03-21 Mecanisme de mise au point, notamment pour spectrometre a rayons x

Country Status (9)

Country Link
US (1) US4236072A (fr)
JP (1) JPS54130983A (fr)
CA (1) CA1135877A (fr)
CH (1) CH640057A5 (fr)
DE (1) DE2908173A1 (fr)
FR (1) FR2420755A1 (fr)
GB (1) GB2017470B (fr)
NL (1) NL7803026A (fr)
SE (1) SE439067B (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0068045A2 (fr) * 1981-06-30 1983-01-05 Siemens Aktiengesellschaft Spectromètre X séquentiel à crystal

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8300420A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
GB2198920B (en) * 1986-12-18 1990-11-14 Univ Moskovsk Apparatus for x-ray studies of crystalline matter
NL8702475A (nl) * 1987-10-16 1989-05-16 Philips Nv Roentgen analyse apparaat.
US4959848A (en) * 1987-12-16 1990-09-25 Axic Inc. Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
JP3525188B2 (ja) * 2001-06-06 2004-05-10 理学電機工業株式会社 蛍光ｘ線分析装置
ITMI20020097A1 (it) * 2002-01-21 2003-07-21 Consorzio Pisa Ricerche Diffrattometro e metodo per svolgere analisi diffrattrometriche
US7310410B2 (en) * 2004-07-28 2007-12-18 General Electric Co. Single-leaf X-ray collimator

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1572651A (fr) * 1967-06-19 1969-06-27

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0068045A2 (fr) * 1981-06-30 1983-01-05 Siemens Aktiengesellschaft Spectromètre X séquentiel à crystal
EP0068045A3 (en) * 1981-06-30 1984-04-11 Siemens Aktiengesellschaft Crystal x-ray sequential spectrometer

Also Published As

Publication number Publication date
DE2908173A1 (de) 1979-09-27
GB2017470B (en) 1982-05-26
SE7902405L (sv) 1979-09-22
US4236072A (en) 1980-11-25
FR2420755B1 (fr) 1984-01-13
CH640057A5 (de) 1983-12-15
CA1135877A (fr) 1982-11-16
GB2017470A (en) 1979-10-03
NL7803026A (nl) 1979-09-25
JPS54130983A (en) 1979-10-11
SE439067B (sv) 1985-05-28

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Legal Events

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