SE439067B - Mekanism for variering av leget mellan en detektor och en metkristall i forhallande till varandra och foretredesvis avsedd for anvendning i en rontgenspektrometer - Google Patents
Mekanism for variering av leget mellan en detektor och en metkristall i forhallande till varandra och foretredesvis avsedd for anvendning i en rontgenspektrometerInfo
- Publication number
- SE439067B SE439067B SE7902405A SE7902405A SE439067B SE 439067 B SE439067 B SE 439067B SE 7902405 A SE7902405 A SE 7902405A SE 7902405 A SE7902405 A SE 7902405A SE 439067 B SE439067 B SE 439067B
- Authority
- SE
- Sweden
- Prior art keywords
- crystal
- axis
- pulley
- detector
- belt
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL7803026A NL7803026A (nl) | 1978-03-21 | 1978-03-21 | Instelmechanisme. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SE7902405L SE7902405L (sv) | 1979-09-22 |
| SE439067B true SE439067B (sv) | 1985-05-28 |
Family
ID=19830531
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE7902405A SE439067B (sv) | 1978-03-21 | 1979-03-19 | Mekanism for variering av leget mellan en detektor och en metkristall i forhallande till varandra och foretredesvis avsedd for anvendning i en rontgenspektrometer |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US4236072A (ja) |
| JP (1) | JPS54130983A (ja) |
| CA (1) | CA1135877A (ja) |
| CH (1) | CH640057A5 (ja) |
| DE (1) | DE2908173A1 (ja) |
| FR (1) | FR2420755A1 (ja) |
| GB (1) | GB2017470B (ja) |
| NL (1) | NL7803026A (ja) |
| SE (1) | SE439067B (ja) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3125803A1 (de) * | 1981-06-30 | 1983-01-13 | Siemens AG, 1000 Berlin und 8000 München | Kristall-roentgen-sequenzspektrometer |
| NL8300420A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen analyse apparaat. |
| US4752945A (en) * | 1985-11-04 | 1988-06-21 | North American Philips Corp. | Double crystal X-ray spectrometer |
| GB2198920B (en) * | 1986-12-18 | 1990-11-14 | Univ Moskovsk | Apparatus for x-ray studies of crystalline matter |
| NL8702475A (nl) * | 1987-10-16 | 1989-05-16 | Philips Nv | Roentgen analyse apparaat. |
| US4959848A (en) * | 1987-12-16 | 1990-09-25 | Axic Inc. | Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis |
| JP3525188B2 (ja) * | 2001-06-06 | 2004-05-10 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| ITMI20020097A1 (it) * | 2002-01-21 | 2003-07-21 | Consorzio Pisa Ricerche | Diffrattometro e metodo per svolgere analisi diffrattrometriche |
| US7310410B2 (en) * | 2004-07-28 | 2007-12-18 | General Electric Co. | Single-leaf X-ray collimator |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
-
1978
- 1978-03-21 NL NL7803026A patent/NL7803026A/xx not_active Application Discontinuation
-
1979
- 1979-03-02 DE DE19792908173 patent/DE2908173A1/de not_active Ceased
- 1979-03-08 US US06/018,494 patent/US4236072A/en not_active Expired - Lifetime
- 1979-03-12 CA CA000323255A patent/CA1135877A/en not_active Expired
- 1979-03-16 GB GB7909417A patent/GB2017470B/en not_active Expired
- 1979-03-16 CH CH251879A patent/CH640057A5/de not_active IP Right Cessation
- 1979-03-19 SE SE7902405A patent/SE439067B/sv not_active Application Discontinuation
- 1979-03-20 JP JP3316179A patent/JPS54130983A/ja active Pending
- 1979-03-21 FR FR7907169A patent/FR2420755A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| US4236072A (en) | 1980-11-25 |
| NL7803026A (nl) | 1979-09-25 |
| GB2017470A (en) | 1979-10-03 |
| FR2420755A1 (fr) | 1979-10-19 |
| SE7902405L (sv) | 1979-09-22 |
| FR2420755B1 (ja) | 1984-01-13 |
| CH640057A5 (de) | 1983-12-15 |
| CA1135877A (en) | 1982-11-16 |
| JPS54130983A (en) | 1979-10-11 |
| GB2017470B (en) | 1982-05-26 |
| DE2908173A1 (de) | 1979-09-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| NAV | Patent application has lapsed |
Ref document number: 7902405-5 |