JPS5317383A - Non-contactive detecting method and apparatus for defect in shape of strip type inspected body - Google Patents

Non-contactive detecting method and apparatus for defect in shape of strip type inspected body

Info

Publication number
JPS5317383A
JPS5317383A JP9098476A JP9098476A JPS5317383A JP S5317383 A JPS5317383 A JP S5317383A JP 9098476 A JP9098476 A JP 9098476A JP 9098476 A JP9098476 A JP 9098476A JP S5317383 A JPS5317383 A JP S5317383A
Authority
JP
Japan
Prior art keywords
shape
defect
contactive
detecting method
strip type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9098476A
Other languages
English (en)
Inventor
Masane Suzuki
Kiyoshi Suzuki
Yoichi Yamatari
Nobuaki Oura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
Original Assignee
Fuji Photo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Optical Co Ltd filed Critical Fuji Photo Optical Co Ltd
Priority to JP9098476A priority Critical patent/JPS5317383A/ja
Publication of JPS5317383A publication Critical patent/JPS5317383A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP9098476A 1976-07-30 1976-07-30 Non-contactive detecting method and apparatus for defect in shape of strip type inspected body Pending JPS5317383A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9098476A JPS5317383A (en) 1976-07-30 1976-07-30 Non-contactive detecting method and apparatus for defect in shape of strip type inspected body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9098476A JPS5317383A (en) 1976-07-30 1976-07-30 Non-contactive detecting method and apparatus for defect in shape of strip type inspected body

Publications (1)

Publication Number Publication Date
JPS5317383A true JPS5317383A (en) 1978-02-17

Family

ID=14013767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9098476A Pending JPS5317383A (en) 1976-07-30 1976-07-30 Non-contactive detecting method and apparatus for defect in shape of strip type inspected body

Country Status (1)

Country Link
JP (1) JPS5317383A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01140160U (ja) * 1988-03-18 1989-09-26
WO2022038668A1 (ja) * 2020-08-18 2022-02-24 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 エッジ割れ検出装置及び圧延設備並びにエッジ割れ検出方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01140160U (ja) * 1988-03-18 1989-09-26
WO2022038668A1 (ja) * 2020-08-18 2022-02-24 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 エッジ割れ検出装置及び圧延設備並びにエッジ割れ検出方法
JPWO2022038668A1 (ja) * 2020-08-18 2022-02-24
EP4141428A4 (en) * 2020-08-18 2023-08-16 Primetals Technologies Japan, Ltd. EDGE CRACK DETECTION DEVICE, ROLLING EQUIPMENT AND EDGE CRACK DETECTION METHOD
US11808720B2 (en) 2020-08-18 2023-11-07 Primetals Technologies Japan, Ltd. Edge crack detection device, rolling mill facility and edge crack detection method

Similar Documents

Publication Publication Date Title
IL51321A (en) Apparatus and method for detecting defective fuel rods
IL51636A0 (en) Method and apparatus for analysing the concentration of antigen or antibody by radioimmunoassay
CA959937A (en) Non-destructive testing apparatus for detecting both transverse and longitudinal weld defects with a single inspection
JPS5317383A (en) Non-contactive detecting method and apparatus for defect in shape of strip type inspected body
JPS52148183A (en) Method of projecting and receiving light for hue inspecting apparatus
SE437303B (sv) Forfarande for on-line-metning av koncentrationen av en analyt i en behallare, samt apparat for genomforande av forfarandet
JPS5386294A (en) Inspecting method and apparatus for defect in insulation vessels
JPS5254483A (en) Method of inspecting photo mask patterns, etc.
JPS51126887A (en) Automatic detection method of surface flaw and the apparatus
JPS5329790A (en) Nonndestructive inspecting apparatus
JPS5322370A (en) Inspecting method of semiconductor device
JPS5214477A (en) Method to detect a defect in a transparent test object
JPS52139485A (en) Follow-up apparatus for use in high-speed ultrasonic flaw detection
JPS5312377A (en) Inspecting apparatus for surface
JPS5737253A (en) Defect detection device for transparent body
JPS5238382A (en) Apparatus for inspecting eggs
JPS543590A (en) Photoelectric inspecting apparatus
JPS5769742A (en) Inspecting method for accuracy of pattern
JPS5384795A (en) Inspecting apparatus for corner part of magnetic inspector of square steel material
JPS5340584A (en) Bottle inspector by elliptically focusing system
JPS5235684A (en) Method and apparatus for total reflection absorption measurement at lo w temperatures
JPS5249880A (en) Defect inspecting apparatus
JPS523487A (en) Testing method and device of the bonding quality on the electric part of metal
JPS5337489A (en) Inspecting apparatus by ultrasonic wave
JPS5211980A (en) Phosphor analysis apparatus