JPS5315769A - Production of semiconductor device - Google Patents
Production of semiconductor deviceInfo
- Publication number
- JPS5315769A JPS5315769A JP8994176A JP8994176A JPS5315769A JP S5315769 A JPS5315769 A JP S5315769A JP 8994176 A JP8994176 A JP 8994176A JP 8994176 A JP8994176 A JP 8994176A JP S5315769 A JPS5315769 A JP S5315769A
- Authority
- JP
- Japan
- Prior art keywords
- production
- semiconductor device
- patterns
- pattern
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70466—Multiple exposures, e.g. combination of fine and coarse exposures, double patterning or multiple exposures for printing a single feature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To accurately form fine patterns by forming a pattern using a second mask allowing for the change component of the relative relation of the patterns on a substrate before and after intermediate treatment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8994176A JPS5315769A (en) | 1976-07-28 | 1976-07-28 | Production of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8994176A JPS5315769A (en) | 1976-07-28 | 1976-07-28 | Production of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5315769A true JPS5315769A (en) | 1978-02-14 |
Family
ID=13984718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8994176A Pending JPS5315769A (en) | 1976-07-28 | 1976-07-28 | Production of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5315769A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10435072B2 (en) | 2017-03-17 | 2019-10-08 | Ford Global Technologies, Llc | Road camber compensation |
-
1976
- 1976-07-28 JP JP8994176A patent/JPS5315769A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10435072B2 (en) | 2017-03-17 | 2019-10-08 | Ford Global Technologies, Llc | Road camber compensation |
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