JPS524258A - Retardation measuring system for duplex refraction objects - Google Patents

Retardation measuring system for duplex refraction objects

Info

Publication number
JPS524258A
JPS524258A JP8063375A JP8063375A JPS524258A JP S524258 A JPS524258 A JP S524258A JP 8063375 A JP8063375 A JP 8063375A JP 8063375 A JP8063375 A JP 8063375A JP S524258 A JPS524258 A JP S524258A
Authority
JP
Japan
Prior art keywords
duplex
measuring system
retardation measuring
refraction
objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8063375A
Other languages
Japanese (ja)
Inventor
Nobuyoshi Tanaka
Naoki Ayada
Mitsuo Takeda
Susumu Matsumura
Kazuya Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP8063375A priority Critical patent/JPS524258A/en
Publication of JPS524258A publication Critical patent/JPS524258A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE: To measure rapidly the light path difference of liquid crystals without contacting or damaging, utilizing the distance between the center peak to side peak of multi wave length cross stripes generated in the cross meter.
COPYRIGHT: (C)1977,JPO&Japio
JP8063375A 1975-06-28 1975-06-28 Retardation measuring system for duplex refraction objects Pending JPS524258A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8063375A JPS524258A (en) 1975-06-28 1975-06-28 Retardation measuring system for duplex refraction objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8063375A JPS524258A (en) 1975-06-28 1975-06-28 Retardation measuring system for duplex refraction objects

Publications (1)

Publication Number Publication Date
JPS524258A true JPS524258A (en) 1977-01-13

Family

ID=13723755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8063375A Pending JPS524258A (en) 1975-06-28 1975-06-28 Retardation measuring system for duplex refraction objects

Country Status (1)

Country Link
JP (1) JPS524258A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49109060A (en) * 1973-01-12 1974-10-17

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49109060A (en) * 1973-01-12 1974-10-17

Similar Documents

Publication Publication Date Title
JPS52104256A (en) Thickness measuring device
JPS524258A (en) Retardation measuring system for duplex refraction objects
JPS524260A (en) Physical factor measuring system
JPS5224078A (en) Ic use measuring device
JPS524882A (en) Phase differential meter
JPS524259A (en) Physical factor measuring system
JPS529201A (en) Device for measuring wheel alignment simultaneously
JPS524256A (en) Physical factor measuring system
JPS5337456A (en) Distance measuring device
JPS5210170A (en) Liquid surface detector
JPS5280859A (en) Measuring method using interferometer
JPS5288364A (en) Shape detector for running plate materials
JPS5311072A (en) Phase constant measuring method
JPS5265467A (en) Measuring method
JPS5216177A (en) Probe card
JPS51145353A (en) Angle measuring device
JPS5218379A (en) Travellig wave resonator tupe low-loss dielectric constant meter
SU697963A2 (en) Device for measuring time intervals
SU520177A1 (en) Device for measuring the level of metal in the crystallizer
JPS5263379A (en) Measurement of space filter speeds using coherent light
JPS524257A (en) Physical factor measuring system
JPS524261A (en) Physical factor measuring system
JPS5211075A (en) Measuring system for surface temperature of running thread
JPS51113667A (en) Liquid hydrameter
JPS5383765A (en) Size measuring system