JPS52104256A - Thickness measuring device - Google Patents

Thickness measuring device

Info

Publication number
JPS52104256A
JPS52104256A JP2079876A JP2079876A JPS52104256A JP S52104256 A JPS52104256 A JP S52104256A JP 2079876 A JP2079876 A JP 2079876A JP 2079876 A JP2079876 A JP 2079876A JP S52104256 A JPS52104256 A JP S52104256A
Authority
JP
Japan
Prior art keywords
measuring device
thickness measuring
transparent body
thickness
contacting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2079876A
Other languages
Japanese (ja)
Inventor
Kozo Uchida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwatsu Electric Co Ltd
Original Assignee
Iwatsu Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwatsu Electric Co Ltd filed Critical Iwatsu Electric Co Ltd
Priority to JP2079876A priority Critical patent/JPS52104256A/en
Publication of JPS52104256A publication Critical patent/JPS52104256A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: To make it possible to measure the thickness of transparent body not only with ordinary temperature but also in the state of high temperature, without contacting it, by means of radiating light beam from the oblique direction on a transparent body such as sheet glass and so on.
COPYRIGHT: (C)1977,JPO&Japio
JP2079876A 1976-02-27 1976-02-27 Thickness measuring device Pending JPS52104256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2079876A JPS52104256A (en) 1976-02-27 1976-02-27 Thickness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2079876A JPS52104256A (en) 1976-02-27 1976-02-27 Thickness measuring device

Publications (1)

Publication Number Publication Date
JPS52104256A true JPS52104256A (en) 1977-09-01

Family

ID=12037070

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2079876A Pending JPS52104256A (en) 1976-02-27 1976-02-27 Thickness measuring device

Country Status (1)

Country Link
JP (1) JPS52104256A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60117230A (en) * 1983-11-29 1985-06-24 Mita Ind Co Ltd Focus controller of optical scanning part
JPS60117232A (en) * 1983-11-29 1985-06-24 Mita Ind Co Ltd Controller for optical scanning part
JPS60117231A (en) * 1983-11-29 1985-06-24 Mita Ind Co Ltd Correcting device of image distortion
JPS643503A (en) * 1987-06-25 1989-01-09 Fujitsu Ltd Method for measuring thickness of crystal layer
JPH06160031A (en) * 1992-08-19 1994-06-07 Owens Brockway Glass Container Inc Measurement of thickness of wall of transparent container
FR2751068A1 (en) * 1996-07-09 1998-01-16 Lasers Et Tech Avancees Bureau Contactless glass thickness measuring optical device
JP2008506095A (en) * 2004-07-06 2008-02-28 コミサリア、ア、レネルジ、アトミク Optical device for measuring the thickness of at least partly transparent media
JP2008527380A (en) * 2005-01-11 2008-07-24 コーニング インコーポレイテッド Online thickness measuring device and measuring method of thickness of moving glass substrate
JP2009059427A (en) * 2007-08-31 2009-03-19 Hoya Corp Method for manufacturing glass substrate for magnetic disk, method for manufacturing magnetic disk, and apparatus for measuring substrate thickness
JP2009223164A (en) * 2008-03-18 2009-10-01 Olympus Corp Microscopic image photographing apparatus
JP2016500817A (en) * 2012-10-18 2016-01-14 エムエスセ エ エスジェセセＭｓｃ ＆ Ｓｇｃｃ Equipment for measuring wall thickness of containers
JP2017015675A (en) * 2015-07-02 2017-01-19 達仁 郭 Device and method for highly accurately and promptly discriminating photoelectric glass substrate

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499264A (en) * 1972-05-12 1974-01-26
JPS4943660A (en) * 1972-05-22 1974-04-24

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499264A (en) * 1972-05-12 1974-01-26
JPS4943660A (en) * 1972-05-22 1974-04-24

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60117230A (en) * 1983-11-29 1985-06-24 Mita Ind Co Ltd Focus controller of optical scanning part
JPS60117232A (en) * 1983-11-29 1985-06-24 Mita Ind Co Ltd Controller for optical scanning part
JPS60117231A (en) * 1983-11-29 1985-06-24 Mita Ind Co Ltd Correcting device of image distortion
JPS643503A (en) * 1987-06-25 1989-01-09 Fujitsu Ltd Method for measuring thickness of crystal layer
JPH06160031A (en) * 1992-08-19 1994-06-07 Owens Brockway Glass Container Inc Measurement of thickness of wall of transparent container
FR2751068A1 (en) * 1996-07-09 1998-01-16 Lasers Et Tech Avancees Bureau Contactless glass thickness measuring optical device
JP2008506095A (en) * 2004-07-06 2008-02-28 コミサリア、ア、レネルジ、アトミク Optical device for measuring the thickness of at least partly transparent media
JP2008527380A (en) * 2005-01-11 2008-07-24 コーニング インコーポレイテッド Online thickness measuring device and measuring method of thickness of moving glass substrate
KR101325426B1 (en) * 2005-01-11 2013-11-04 코닝 인코포레이티드 On-line thickness gauge and method for measuring the thickness of a moving glass substrate
JP2009059427A (en) * 2007-08-31 2009-03-19 Hoya Corp Method for manufacturing glass substrate for magnetic disk, method for manufacturing magnetic disk, and apparatus for measuring substrate thickness
JP2009223164A (en) * 2008-03-18 2009-10-01 Olympus Corp Microscopic image photographing apparatus
JP2016500817A (en) * 2012-10-18 2016-01-14 エムエスセ エ エスジェセセＭｓｃ ＆ Ｓｇｃｃ Equipment for measuring wall thickness of containers
JP2017015675A (en) * 2015-07-02 2017-01-19 達仁 郭 Device and method for highly accurately and promptly discriminating photoelectric glass substrate

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