JPS5265467A - Measuring method - Google Patents
Measuring methodInfo
- Publication number
- JPS5265467A JPS5265467A JP14151175A JP14151175A JPS5265467A JP S5265467 A JPS5265467 A JP S5265467A JP 14151175 A JP14151175 A JP 14151175A JP 14151175 A JP14151175 A JP 14151175A JP S5265467 A JPS5265467 A JP S5265467A
- Authority
- JP
- Japan
- Prior art keywords
- measuring method
- round
- film
- rediating
- unilaterally
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE: To measure the physical attribute such as the thickness of film, by rediating the wide light flux to the wave length distribution of the same source of light, and conducting to the interference optical system the beam which has unilaterally passed through between the opposite faces of the transparent film, the beam which has made one round, and the beam which has made one and half round.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14151175A JPS5265467A (en) | 1975-11-26 | 1975-11-26 | Measuring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14151175A JPS5265467A (en) | 1975-11-26 | 1975-11-26 | Measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5265467A true JPS5265467A (en) | 1977-05-30 |
Family
ID=15293648
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14151175A Pending JPS5265467A (en) | 1975-11-26 | 1975-11-26 | Measuring method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5265467A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007114206A (en) * | 2006-11-30 | 2007-05-10 | National Institute Of Advanced Industrial & Technology | Method for precision measurement of group refractive index of optical material |
JP2009080120A (en) * | 2002-04-26 | 2009-04-16 | Optrex Corp | Method of inspecting transparent substrates |
-
1975
- 1975-11-26 JP JP14151175A patent/JPS5265467A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009080120A (en) * | 2002-04-26 | 2009-04-16 | Optrex Corp | Method of inspecting transparent substrates |
JP2007114206A (en) * | 2006-11-30 | 2007-05-10 | National Institute Of Advanced Industrial & Technology | Method for precision measurement of group refractive index of optical material |
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