JPS5218392A - Apparatus for analysis of electrn beam energy - Google Patents
Apparatus for analysis of electrn beam energyInfo
- Publication number
- JPS5218392A JPS5218392A JP50094482A JP9448275A JPS5218392A JP S5218392 A JPS5218392 A JP S5218392A JP 50094482 A JP50094482 A JP 50094482A JP 9448275 A JP9448275 A JP 9448275A JP S5218392 A JPS5218392 A JP S5218392A
- Authority
- JP
- Japan
- Prior art keywords
- electrn
- analysis
- beam energy
- sweep voltage
- amplitudeto
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50094482A JPS5218392A (en) | 1975-08-02 | 1975-08-02 | Apparatus for analysis of electrn beam energy |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50094482A JPS5218392A (en) | 1975-08-02 | 1975-08-02 | Apparatus for analysis of electrn beam energy |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5218392A true JPS5218392A (en) | 1977-02-10 |
JPS5432355B2 JPS5432355B2 (ja) | 1979-10-13 |
Family
ID=14111489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50094482A Granted JPS5218392A (en) | 1975-08-02 | 1975-08-02 | Apparatus for analysis of electrn beam energy |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5218392A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6150045A (ja) * | 1985-08-09 | 1986-03-12 | Nec Corp | オージエ電子分光スペクトル測定方法 |
-
1975
- 1975-08-02 JP JP50094482A patent/JPS5218392A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6150045A (ja) * | 1985-08-09 | 1986-03-12 | Nec Corp | オージエ電子分光スペクトル測定方法 |
JPH0130101B2 (ja) * | 1985-08-09 | 1989-06-16 | Nippon Electric Co |
Also Published As
Publication number | Publication date |
---|---|
JPS5432355B2 (ja) | 1979-10-13 |
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