JPS5074167A - - Google Patents
Info
- Publication number
- JPS5074167A JPS5074167A JP49124487A JP12448774A JPS5074167A JP S5074167 A JPS5074167 A JP S5074167A JP 49124487 A JP49124487 A JP 49124487A JP 12448774 A JP12448774 A JP 12448774A JP S5074167 A JPS5074167 A JP S5074167A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Toxicology (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US411110A US3868508A (en) | 1973-10-30 | 1973-10-30 | Contactless infrared diagnostic test system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5074167A true JPS5074167A (US07902200-20110308-C00004.png) | 1975-06-18 |
Family
ID=23627605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49124487A Pending JPS5074167A (US07902200-20110308-C00004.png) | 1973-10-30 | 1974-10-30 |
Country Status (8)
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5444769A (en) * | 1977-09-14 | 1979-04-09 | Matsushita Electric Ind Co Ltd | Device for inspecting displacement of chipplike parts |
JPS5638900A (en) * | 1979-09-07 | 1981-04-14 | Pioneer Electronic Corp | Device for inspecting chip mount |
JPS5666216U (US07902200-20110308-C00004.png) * | 1979-10-27 | 1981-06-02 | ||
JPS59218938A (ja) * | 1983-05-27 | 1984-12-10 | Fujitsu Ltd | プリント基板の配線パタ−ン検査方法 |
JPS6042900A (ja) * | 1983-08-18 | 1985-03-07 | ロ−ム株式会社 | 治具上の電子部品等の有無認識装置 |
JPS6189506A (ja) * | 1984-09-20 | 1986-05-07 | ゼネラル・エレクトリツク・カンパニイ | 冷却孔検査法 |
JPS62134568A (ja) * | 1985-12-09 | 1987-06-17 | Nippon Atom Ind Group Co Ltd | 電子基板の劣化診断装置 |
JPS6446638A (en) * | 1987-01-16 | 1989-02-21 | Hughes Aircraft Co | Method and apparatus for testing circuit plate weld connection part |
JPH0212046A (ja) * | 1988-06-30 | 1990-01-17 | Saginomiya Seisakusho Inc | 温度分布検査方法 |
JPH05172772A (ja) * | 1991-12-25 | 1993-07-09 | Shuji Nakada | 電子部品の接合部検査方法 |
Families Citing this family (55)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3991302A (en) * | 1974-11-22 | 1976-11-09 | Grumman Aerospace Corporation | Method for detecting and isolating faults in digital and analog circuits with multiple infrared scanning under conditions of different stimuli |
FR2371685A1 (fr) * | 1976-11-17 | 1978-06-16 | Aerospatiale | Procede et dispositif pour le controle de la qualite de points de soudure par resistance |
US4214164A (en) * | 1978-07-19 | 1980-07-22 | Vanzetti Infrared & Computer System Incorporated | Control of spot weld quality by infrared thermal sensing |
US4358732A (en) * | 1979-05-14 | 1982-11-09 | California Institute Of Technology | Synchronized voltage contrast display analysis system |
JPS5651631A (en) * | 1979-10-02 | 1981-05-09 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Measuring instrument for surface temperature distribution |
US4344146A (en) * | 1980-05-08 | 1982-08-10 | Chesebrough-Pond's Inc. | Video inspection system |
US4445185A (en) * | 1980-05-08 | 1984-04-24 | Chesebrough-Pond's Inc. | Video inspection system |
US4309608A (en) * | 1980-05-16 | 1982-01-05 | The United States Of America As Represented By The Secretary Of The Army | Flightline goggle tester |
EP0054596B1 (fr) * | 1980-12-18 | 1985-05-29 | International Business Machines Corporation | Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre |
DE3070433D1 (en) * | 1980-12-18 | 1985-05-09 | Ibm | Method for the inspection and automatic sorting of objects with configurations of fixed dimensional tolerances, and device for carrying out the method |
US4410381A (en) * | 1982-01-26 | 1983-10-18 | Ford Motor Company | Methods and apparatus for testing the quality of an ultrasonic weld in thermoplastic material |
US4524386A (en) * | 1982-04-12 | 1985-06-18 | The United States Of America As Represented By The Secretary Of The Army | Thermal target display system |
US4520504A (en) * | 1982-07-29 | 1985-05-28 | The United States Of America As Represented By The Secretary Of The Air Force | Infrared system with computerized image display |
US4849885A (en) * | 1984-02-16 | 1989-07-18 | Stillwagon W Glenn | Thermograph with computer display |
US4628353A (en) * | 1984-04-04 | 1986-12-09 | Chesebrough-Pond's Inc. | Video measuring system |
JPS60263807A (ja) * | 1984-06-12 | 1985-12-27 | Dainippon Screen Mfg Co Ltd | プリント配線板のパタ−ン欠陥検査装置 |
US4733079A (en) * | 1985-12-13 | 1988-03-22 | Lockheed Corporation | Method of and apparatus for thermographic identification of parts |
IT1201779B (it) * | 1986-07-09 | 1989-02-02 | Zanussi Zeltron Inst | Dispositivo di controllo dell'isolamento termico di apparecchiature elettrodomestiche, in particolare frigoriferi |
DE3722715A1 (de) * | 1987-07-09 | 1989-01-26 | Siemens Ag | Verfahren zur bestueckungskontrolle von kondensatoren auf leiterplatten |
US4814870A (en) * | 1987-08-05 | 1989-03-21 | Compix Incorporated | Portable infrared imaging apparatus |
US4755874A (en) * | 1987-08-31 | 1988-07-05 | Kla Instruments Corporation | Emission microscopy system |
US4854039A (en) * | 1988-05-04 | 1989-08-08 | The Technology Congress, Ltd. | Prototype circuit board and method of testing |
FR2640050B1 (fr) * | 1988-12-06 | 1991-03-29 | Bull Sa | Procede pour le controle d'une carte de circuit imprime equipee notamment le controle des composants de la carte et appareillage pour la mise en oeuvre de ce procede |
FR2641870B1 (fr) * | 1989-01-19 | 1991-07-12 | Bull Sa | Procede pour le controle d'une carte de circuit imprime equipee, notamment le controle des soudures de la carte, et appareillage pour la mise en oeuvre de ce procede |
US5208528A (en) * | 1989-01-19 | 1993-05-04 | Bull S.A. | Method for inspecting a populated printed circuit board, particularly for inspecting solder joints on the board and a system for working this method |
JPH03182185A (ja) * | 1989-12-11 | 1991-08-08 | Fujitsu Ltd | 赤外線監視システム |
US5157334A (en) * | 1990-01-22 | 1992-10-20 | Atlantic Richfield Company | Image intensifier monitoring of power line insulator leakage |
US5089700A (en) * | 1990-01-30 | 1992-02-18 | Amdata, Inc. | Apparatus for infrared imaging inspections |
US5168161A (en) * | 1990-04-18 | 1992-12-01 | Texas Instruments Incorporated | System and method of determining surface characteristics using infrared imaging |
US5264819A (en) * | 1990-12-12 | 1993-11-23 | Electric Power Research Institute, Inc. | High energy zinc oxide varistor |
JP3246704B2 (ja) * | 1995-02-27 | 2002-01-15 | シャープ株式会社 | 配線基板の検査装置 |
US5775806A (en) * | 1996-09-12 | 1998-07-07 | The United States Of America As Represented By The Secretary Of The Air Force | Infrared assessment system |
US6650768B1 (en) * | 1998-02-19 | 2003-11-18 | International Business Machines Corporation | Using time resolved light emission from VLSI circuit devices for navigation on complex systems |
US6294923B1 (en) * | 1998-12-07 | 2001-09-25 | Advanced Micro Devices, Inc. | Method and system for detecting faults utilizing an AC power supply |
US6340817B1 (en) * | 1999-04-23 | 2002-01-22 | Creo S.R.L. | Inspection method for unpopulated printed circuit boards |
EP1182449A1 (en) | 2000-08-21 | 2002-02-27 | Motorola, Inc. | Apparatus and method for managing an integrated circuit |
US6440084B1 (en) * | 2000-09-14 | 2002-08-27 | Patrick Gentempo | Thermal scanning system and method |
DE10113523C2 (de) * | 2001-02-22 | 2003-03-27 | Werner Reisinger | Verfahren und Vorrichtung zur Qualitätsprüfung von Leiterplatten |
BR0207772A (pt) * | 2001-02-22 | 2004-09-08 | Werner Reisinger | Procedimento e dispositivo para a verificação de circuitos eletrônicos ou componentes dos mesmos em uma placa de circuitos impressos |
GB0117418D0 (en) * | 2001-07-17 | 2001-09-12 | Storm Mason R | Litecam |
TWI223089B (en) * | 2001-08-27 | 2004-11-01 | Oht Inc | Circuit layout inspection apparatus and circuit layout inspection method |
JP2003098213A (ja) * | 2001-09-20 | 2003-04-03 | Oht Inc | 検査装置並びに検査方法 |
JP2003098212A (ja) * | 2001-09-20 | 2003-04-03 | Oht Inc | 検査装置並びに検査方法 |
SE0201529D0 (sv) * | 2002-05-21 | 2002-05-21 | Flir Systems Ab | Method and apparatus for IR camera inspections |
JP3756168B2 (ja) * | 2004-03-19 | 2006-03-15 | 株式会社ソニー・コンピュータエンタテインメント | 回路の発熱制御方法、装置およびシステム |
US20060178588A1 (en) * | 2005-01-03 | 2006-08-10 | Lee Brody | System and method for isolating effects of basal autonomic nervous system activity on heart rate variability |
US7528372B2 (en) * | 2005-10-19 | 2009-05-05 | Csi Technology, Inc. | Apparatus and method for infrared imaging with performance algorithm |
US20070249957A1 (en) * | 2006-04-19 | 2007-10-25 | Patrick Gentempo | Mapping spinal muscle tone |
TW200801487A (en) * | 2006-06-23 | 2008-01-01 | Innolux Display Corp | Method and device for detecting circuit |
US7998070B2 (en) | 2006-09-26 | 2011-08-16 | Gentempo Jr Patrick | Quantifying neurospinal function |
DE102007020695A1 (de) * | 2007-05-03 | 2008-11-06 | Iwk Verpackungstechnik Gmbh | Verfahren und Vorrichtung zur Überprüfung einer Schweißnaht einer Tube |
WO2011079208A1 (en) | 2009-12-24 | 2011-06-30 | Flir Systems, Inc. | Cameras with on-board reporting capabilities |
DE102010053766B4 (de) * | 2010-12-08 | 2019-05-23 | Acculogic Corporation | Vorrichtung zum thermischen Testen von Platinen |
DE102010063149A1 (de) * | 2010-12-15 | 2012-06-21 | Siemens Aktiengesellschaft | Testen von Baugruppen |
US9546907B2 (en) * | 2014-04-18 | 2017-01-17 | Quantum Focus Instruments Corporation | Dynamic differential thermal measurement systems and methods |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2895049A (en) * | 1957-06-26 | 1959-07-14 | Barnes Eng Co | Image transducer |
US3283148A (en) * | 1966-04-01 | 1966-11-01 | Barnes Eng Co | Infrared image system with a plurality of infrared radiation emitting reference sources positioned near the object |
US3798366A (en) * | 1972-03-06 | 1974-03-19 | R Winkler | Infrared imaging system |
-
1973
- 1973-10-30 US US411110A patent/US3868508A/en not_active Expired - Lifetime
-
1974
- 1974-09-05 IL IL45600A patent/IL45600A0/xx unknown
- 1974-09-10 NL NL7412011A patent/NL7412011A/xx unknown
- 1974-10-24 ES ES431338A patent/ES431338A1/es not_active Expired
- 1974-10-24 DE DE19742450526 patent/DE2450526A1/de active Pending
- 1974-10-29 BE BE1006258A patent/BE821649A/xx unknown
- 1974-10-30 FR FR7436307A patent/FR2249520A1/fr not_active Withdrawn
- 1974-10-30 JP JP49124487A patent/JPS5074167A/ja active Pending
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5444769A (en) * | 1977-09-14 | 1979-04-09 | Matsushita Electric Ind Co Ltd | Device for inspecting displacement of chipplike parts |
JPS6036120B2 (ja) * | 1977-09-14 | 1985-08-19 | 松下電器産業株式会社 | チツプ状部品位置ずれ検査装置 |
JPS5638900A (en) * | 1979-09-07 | 1981-04-14 | Pioneer Electronic Corp | Device for inspecting chip mount |
JPS5833847Y2 (ja) * | 1979-10-27 | 1983-07-29 | 松山株式会社 | 収穫機 |
JPS5666216U (US07902200-20110308-C00004.png) * | 1979-10-27 | 1981-06-02 | ||
JPS59218938A (ja) * | 1983-05-27 | 1984-12-10 | Fujitsu Ltd | プリント基板の配線パタ−ン検査方法 |
JPH0249650B2 (US07902200-20110308-C00004.png) * | 1983-05-27 | 1990-10-30 | Fujitsu Ltd | |
JPS6042900A (ja) * | 1983-08-18 | 1985-03-07 | ロ−ム株式会社 | 治具上の電子部品等の有無認識装置 |
JPS6189506A (ja) * | 1984-09-20 | 1986-05-07 | ゼネラル・エレクトリツク・カンパニイ | 冷却孔検査法 |
JPS62134568A (ja) * | 1985-12-09 | 1987-06-17 | Nippon Atom Ind Group Co Ltd | 電子基板の劣化診断装置 |
JPS6446638A (en) * | 1987-01-16 | 1989-02-21 | Hughes Aircraft Co | Method and apparatus for testing circuit plate weld connection part |
JPH0212046A (ja) * | 1988-06-30 | 1990-01-17 | Saginomiya Seisakusho Inc | 温度分布検査方法 |
JPH05172772A (ja) * | 1991-12-25 | 1993-07-09 | Shuji Nakada | 電子部品の接合部検査方法 |
Also Published As
Publication number | Publication date |
---|---|
NL7412011A (nl) | 1975-05-02 |
ES431338A1 (es) | 1976-11-01 |
FR2249520A1 (US07902200-20110308-C00004.png) | 1975-05-23 |
US3868508A (en) | 1975-02-25 |
BE821649A (fr) | 1975-04-29 |
DE2450526A1 (de) | 1975-05-07 |
IL45600A0 (en) | 1974-11-29 |