JPS5057776A - - Google Patents
Info
- Publication number
- JPS5057776A JPS5057776A JP49096291A JP9629174A JPS5057776A JP S5057776 A JPS5057776 A JP S5057776A JP 49096291 A JP49096291 A JP 49096291A JP 9629174 A JP9629174 A JP 9629174A JP S5057776 A JPS5057776 A JP S5057776A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6304—Formation by oxidation, e.g. oxidation of the substrate
- H10P14/6306—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
- H10P14/6308—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors
- H10P14/6309—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors of silicon in uncombined form, i.e. pure silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6322—Formation by thermal treatments
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/668—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials
- H10P14/6681—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si
- H10P14/6682—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/69215—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material being a silicon oxide, e.g. SiO2
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/14—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
- H10P32/1408—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers
- H10P32/141—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers the applied layer comprising oxides only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/17—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material
- H10P32/171—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material being group IV material
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US39810273A | 1973-09-17 | 1973-09-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5057776A true JPS5057776A (enExample) | 1975-05-20 |
| JPS5132422B2 JPS5132422B2 (enExample) | 1976-09-13 |
Family
ID=23573993
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49096291A Expired JPS5132422B2 (enExample) | 1973-09-17 | 1974-08-23 |
Country Status (9)
| Country | Link |
|---|---|
| JP (1) | JPS5132422B2 (enExample) |
| BR (1) | BR7407742D0 (enExample) |
| CH (1) | CH574678A5 (enExample) |
| DE (1) | DE2439535A1 (enExample) |
| FR (1) | FR2246066B1 (enExample) |
| GB (1) | GB1464734A (enExample) |
| IT (1) | IT1020140B (enExample) |
| NL (1) | NL7412217A (enExample) |
| SE (1) | SE402182B (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5220763A (en) * | 1975-08-08 | 1977-02-16 | Matsushita Electric Ind Co Ltd | Impurity diffusion system |
| JPS5580314A (en) * | 1978-12-13 | 1980-06-17 | Hitachi Ltd | Manufacture of silicon semiconductor device |
| JPS56148868A (en) * | 1980-04-18 | 1981-11-18 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
| JPS61121326A (ja) * | 1984-11-19 | 1986-06-09 | Oki Electric Ind Co Ltd | 半導体装置の製造方法 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4152824A (en) * | 1977-12-30 | 1979-05-08 | Mobil Tyco Solar Energy Corporation | Manufacture of solar cells |
| DE4013929C2 (de) * | 1989-05-02 | 1995-12-07 | Toshiba Kawasaki Kk | Verfahren zum Einbringen von Störstoffen in eine Halbleitermaterial-Schicht beim Herstellen eines Halbleiterbauelements und Anwendung des Verfahrens |
| EP0598438A1 (en) * | 1992-11-17 | 1994-05-25 | Koninklijke Philips Electronics N.V. | Method for diffusing a dopant into a semiconductor |
| DE19908400A1 (de) * | 1999-02-26 | 2000-09-07 | Bosch Gmbh Robert | Verfahren zur Herstellung hochdotierter Halbleiterbauelemente |
| US12125705B2 (en) | 2019-03-22 | 2024-10-22 | Lam Research Corporation | Method for providing doped silicon using a diffusion barrier layer |
-
1974
- 1974-08-02 FR FR7427487A patent/FR2246066B1/fr not_active Expired
- 1974-08-17 DE DE2439535A patent/DE2439535A1/de active Pending
- 1974-08-22 GB GB3685574A patent/GB1464734A/en not_active Expired
- 1974-08-23 IT IT26540/74A patent/IT1020140B/it active
- 1974-08-23 JP JP49096291A patent/JPS5132422B2/ja not_active Expired
- 1974-09-06 CH CH1213874A patent/CH574678A5/xx not_active IP Right Cessation
- 1974-09-12 SE SE7411498A patent/SE402182B/xx unknown
- 1974-09-13 NL NL7412217A patent/NL7412217A/xx not_active Application Discontinuation
- 1974-09-17 BR BR7742/74A patent/BR7407742D0/pt unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5220763A (en) * | 1975-08-08 | 1977-02-16 | Matsushita Electric Ind Co Ltd | Impurity diffusion system |
| JPS5580314A (en) * | 1978-12-13 | 1980-06-17 | Hitachi Ltd | Manufacture of silicon semiconductor device |
| JPS56148868A (en) * | 1980-04-18 | 1981-11-18 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
| JPS61121326A (ja) * | 1984-11-19 | 1986-06-09 | Oki Electric Ind Co Ltd | 半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| SE7411498L (enExample) | 1975-03-18 |
| GB1464734A (en) | 1977-02-16 |
| FR2246066A1 (enExample) | 1975-04-25 |
| NL7412217A (nl) | 1975-03-19 |
| IT1020140B (it) | 1977-12-20 |
| BR7407742D0 (pt) | 1975-07-15 |
| DE2439535A1 (de) | 1975-07-03 |
| FR2246066B1 (enExample) | 1976-12-31 |
| CH574678A5 (enExample) | 1976-04-15 |
| SE402182B (sv) | 1978-06-19 |
| JPS5132422B2 (enExample) | 1976-09-13 |