JPH11233909A - Wiring board - Google Patents

Wiring board

Info

Publication number
JPH11233909A
JPH11233909A JP3646098A JP3646098A JPH11233909A JP H11233909 A JPH11233909 A JP H11233909A JP 3646098 A JP3646098 A JP 3646098A JP 3646098 A JP3646098 A JP 3646098A JP H11233909 A JPH11233909 A JP H11233909A
Authority
JP
Japan
Prior art keywords
wiring conductor
organic resin
substrate
conductor layer
resin insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3646098A
Other languages
Japanese (ja)
Inventor
Katsuyuki Takeuchi
勝幸 竹内
Kunihide Yomo
邦英 四方
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP3646098A priority Critical patent/JPH11233909A/en
Publication of JPH11233909A publication Critical patent/JPH11233909A/en
Pending legal-status Critical Current

Links

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the infiltration of noises into electronic components such as semiconductor devices which are installed via wiring conductor layers by forming a magnetic area, containing magnetic powder on a part of the wiring conductor layers which covers an organic resin insulating layer. SOLUTION: A substrate 1 is made of oxide base ceramics, such as an aluminum oxide sintered compact and mullite sintered compact. The substrate 1 supports a multilayered wiring part 4 comprised of organic resin insulating layers 2 and wiring conductor layers 3 on its top. A through-hole 5 is formed in the substrate 1, and its inner walls are coated with a conductive layer 6 whose ends are led out to both upper an lower sides of the substrate 1. The through-hole 5 electrically connects between the wiring conductor layers 3 of the multilayered wiring part 4 formed on the top of the substrate 1 and outer electrical circuits. The through-hole 5 is completely filled with an organic resin filler 7 of epoxy resin or the like. Both ends of the organic resin filler 7 are on flush with the surface of the conductive layer 6 which covers both the upper and lower sides of the substrate 1. Accordingly, the organic resin insulating layers 2 and the wiring conductor layers 3 can be planarized.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、配線基板に関し、
より詳細には情報処理装置等に実装される混成集積回路
装置や半導体装置等に使用される配線基板に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board,
More specifically, the present invention relates to a wiring board used for a hybrid integrated circuit device or a semiconductor device mounted on an information processing device or the like.

【0002】[0002]

【従来の技術】従来、混成集積回路装置や半導体素子収
納用パッケージ等に使用される配線基板はその配線導体
がMoーMn法等の厚膜形成技術によって形成されてい
る。
2. Description of the Related Art Conventionally, a wiring substrate used in a hybrid integrated circuit device, a package for housing a semiconductor element, or the like has a wiring conductor formed by a thick film forming technique such as the Mo-Mn method.

【0003】このMoーMn法は通常、タングステン、
モリブデン、マンガン等の高融点金属粉末に有機溶剤、
溶媒を添加混合し、ペースト状となした金属ペーストを
シート状の生セラミック体の外表面にスクリーン印刷法
により所定パターンに印刷塗布し、次にこれを複数枚積
層するとともに還元雰囲気中で焼成し、高融点金属粉末
と生セラミック体とを焼結一体化させる方法である。
[0003] This Mo-Mn method is generally used for tungsten,
Organic solvents for high melting point metal powders such as molybdenum and manganese,
A solvent is added and mixed, and a paste-like metal paste is printed and applied in a predetermined pattern on the outer surface of a sheet-like green ceramic body by a screen printing method, and then a plurality of these are laminated and fired in a reducing atmosphere. A method of sintering and integrating a high melting point metal powder and a green ceramic body.

【0004】なお、前記配線導体が形成されるセラミッ
ク体としては、通常、酸化アルミニウム質焼結体やムラ
イト質焼結体等の酸化物系セラミックス、或いは表面に
酸化物膜を被着させた窒化アルミニウム質焼結体や炭化
珪素質焼結体等の非酸化物系セラミックスが使用され
る。
The ceramic body on which the wiring conductor is formed is usually an oxide ceramic such as an aluminum oxide sintered body or a mullite sintered body, or a nitride having an oxide film deposited on the surface. Non-oxide ceramics such as an aluminum sintered body and a silicon carbide sintered body are used.

【0005】しかしながら、このMoーMn法を用いて
配線導体を形成した場合、配線導体は金属ペーストをス
クリーン印刷することにより形成されることから微細化
が困難で配線導体を高密度に形成することができないと
いう欠点を有していた。
However, when the wiring conductor is formed by using the Mo-Mn method, the wiring conductor is formed by screen-printing a metal paste. Had the drawback that it could not be done.

【0006】そこで上記欠点を解消するために配線導体
を従来周知の厚膜形成技術により形成するのに変えて微
細化が可能な薄膜形成技術を用いて高密度に形成した配
線基板が使用されるようになってきた。
In order to solve the above-mentioned drawbacks, instead of forming the wiring conductor by a conventionally known thick film forming technique, a wiring board formed by using a thin film forming technique capable of miniaturization is used. It has become.

【0007】かかる配線導体を薄膜形成技術により形成
した配線基板は、酸化アルミニウム質焼結体から成るセ
ラミックスやガラス繊維を織り込んだガラス布にエポキ
シ樹脂を含浸させて形成されるガラスエポキシ樹脂等か
ら成る基板の上面にスピンコート法及び熱硬化処理によ
って形成されるエポキシ樹脂等の有機樹脂から成る絶縁
層と、銅やアルミニウム等の金属を無電解メッキ法や蒸
着法等の薄膜形成技術及びフォトリソグラフィー技術を
採用することによって形成される配線導体層とを交互に
積層させるとともに、上下に位置する配線導体層を有機
樹脂絶縁層に設けたスルーホール導体を介して電気的に
接続させた構造を有しており、最上層の有機樹脂絶縁層
上面に前記配線導体層と電気的に接続するボンディング
パッドを形成しておき、該ボンディングパッドに半導体
素子等の能動部品や容量素子、抵抗器等の受動部品の電
極を半田等のロウ材を介して接続させるようになってい
る。
A wiring board in which such a wiring conductor is formed by a thin film forming technique is made of a ceramic made of an aluminum oxide sintered body or a glass epoxy resin formed by impregnating a glass cloth woven with glass fibers with an epoxy resin. An insulating layer made of an organic resin such as epoxy resin formed by spin coating and thermosetting on the upper surface of the substrate, and a thin film forming technique such as electroless plating or vapor deposition of a metal such as copper or aluminum, and a photolithography technique. And a wiring conductor layer formed by adopting the structure is alternately laminated, and a wiring conductor layer positioned above and below is electrically connected via a through-hole conductor provided in the organic resin insulating layer. Forming a bonding pad electrically connected to the wiring conductor layer on the upper surface of the uppermost organic resin insulating layer. Can, active component, a capacitor such as a semiconductor element, the passive components of the electrode of the resistor or the like via a brazing material such as solder is adapted to be connected to the bonding pad.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、近時、
情報処理装置は高性能化が急激に進展し、これに伴って
情報処理装置に搭載実装される半導体装置や混成集積回
路装置も高速駆動が行われノイズの影響を極めて受け易
いものになってきたこと、従来の配線基板は有機樹脂絶
縁層に設けた銅やアルミニウム等の金属材料から成る配
線導体層が高調波のノイズを伝搬させ易いこと等から配
線導体層に外部電気回路から高調波のノイズが入り込ん
だ場合、このノイズがそのまま配線導体層を伝搬して半
導体素子等電子部品に入り込み、半導体素子等電子部品
を誤動作させてしまうという欠点を有していた。
However, recently,
Information processing devices have rapidly advanced in performance, and accordingly, semiconductor devices and hybrid integrated circuit devices mounted on information processing devices have been driven at high speeds and have become extremely susceptible to noise. In the conventional wiring board, the wiring conductor layer made of a metal material such as copper or aluminum provided on the organic resin insulating layer easily propagates the harmonic noise. If the noise enters, the noise propagates through the wiring conductor layer as it is and enters the electronic components such as the semiconductor element, thereby causing a malfunction of the electronic component such as the semiconductor element.

【0009】また同時に、有機樹脂絶縁層に設けた配線
導体層に屈曲部を有している場合、電気信号が配線導体
層を伝搬した際、屈曲部において反射すること等により
ノイズが発生し、これが配線導体層を介して半導体素子
等の電子部品に入り込み、半導体素子等を誤動作させて
しまうという欠点も有していた。
At the same time, if the wiring conductor layer provided on the organic resin insulating layer has a bent portion, when an electric signal propagates through the wiring conductor layer, noise is generated due to reflection at the bent portion and the like. This has a drawback that it enters electronic components such as semiconductor elements via the wiring conductor layer and causes the semiconductor elements and the like to malfunction.

【0010】本発明は上記諸欠点に鑑み案出されたもの
で、その目的は配線導体層を介して実装される半導体素
子等の電子部品にノイズが入り込むのを有効に防止し、
半導体素子等の電子部品を長期間にわたり正常に作動さ
せることができる配線基板を提供することにある。
The present invention has been devised in view of the above-mentioned drawbacks, and has as its object to effectively prevent noise from entering an electronic component such as a semiconductor element mounted via a wiring conductor layer,
It is an object of the present invention to provide a wiring board capable of operating electronic components such as semiconductor elements normally for a long period of time.

【0011】[0011]

【課題を解決するための手段】本発明は、有機樹脂絶縁
層に配線導体層を被着形成して成る配線基板であって、
前記配線導体層の一部に磁性粉末を含有させた磁性領域
を形成したことを特徴とするものである。
SUMMARY OF THE INVENTION The present invention provides a wiring board comprising a wiring conductor layer formed on an organic resin insulating layer,
A magnetic region containing a magnetic powder is formed in a part of the wiring conductor layer.

【0012】また本発明は、前記配線導体層の磁性領域
における磁性粉末の含有量が10乃至70重量%である
ことを特徴とするのである。
Further, in the present invention, the content of the magnetic powder in the magnetic region of the wiring conductor layer is 10 to 70% by weight.

【0013】更に本発明は、前記配線導体層が金、銀、
銅、アルミニウムもしくはこれらの合金を主成分とし、
磁性粉末がフェライトを主成分として形成されているこ
とを特徴とするものである。
Further, according to the present invention, the wiring conductor layer may be made of gold, silver,
Copper, aluminum or their alloys as the main component,
The magnetic powder is mainly formed of ferrite.

【0014】本発明の配線基板によれば、金、銀、銅等
から成る配線導体層の少なくとも一部に、フェライト等
から成る磁性粉末を含有させ磁性領域を形成したことか
ら外部電気回路より配線導体層に入り込んだノイズ及び
配線導体層を伝搬する電気信号が配線導体層の屈曲部に
おいて反射すること等により発生したノイズは実装され
る半導体素子等の電子部品に入り込む前に配線導体層に
含有されている磁性粉末で熱エネルギーに変換されて吸
収され、その結果、半導体素子等の電子部品にノイズが
入り込むことはなく、半導体素子等の電子部品を常に正
常に作動させることが可能となる。
According to the wiring board of the present invention, since a magnetic region is formed in at least a part of the wiring conductor layer made of gold, silver, copper or the like by containing a magnetic powder made of ferrite or the like, wiring from an external electric circuit is performed. Noise generated by reflection of noise entering the conductor layer and electric signals propagating through the wiring conductor layer at the bent portion of the wiring conductor layer is contained in the wiring conductor layer before entering the electronic component such as a semiconductor element to be mounted. The converted magnetic powder is converted into heat energy and absorbed, and as a result, noise does not enter the electronic components such as the semiconductor device, and the electronic components such as the semiconductor device can always be normally operated.

【0015】[0015]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。図1は、本発明の配線基板の一実施例
を示し、1は基板、2は有機樹脂絶縁層、3は配線導体
層である。
Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment of a wiring board according to the present invention, wherein 1 is a substrate, 2 is an organic resin insulating layer, and 3 is a wiring conductor layer.

【0016】前記基板1はその上面に有機樹脂絶縁層2
と配線導体層3とからなる多層配線部4が配設されてお
り、該多層配線部4を支持する支持部材として作用す
る。
The substrate 1 has an organic resin insulating layer 2 on its upper surface.
And a wiring conductor layer 3, which serves as a support member for supporting the multilayer wiring portion 4.

【0017】前記基板1は酸化アルミニウム質焼結体や
ムライト質焼結体等の酸化物系セラミックス、或いは表
面に酸化物膜を有する窒化アルミニウム質焼結体や炭化
珪素質焼結体等の非酸化物系セラミックス、更にはガラ
ス繊維を織り込んだ布にエポキシ樹脂を含浸させたガラ
スエポキシ樹脂等の電気絶縁材料で形成されており、例
えば、酸化アルミニウム質焼結体で形成されている場合
には、酸化アルミニウム、酸化珪素、酸化マグネシウ
ム、酸化カルシウム等の原料粉末に適当な有機溶剤、溶
媒を添加混合して泥漿状となすとともにこれを従来周知
のドクターブレード法やカレンダーロール法を採用する
ことによってセラミックグリーンシート(セラミック生
シート)を形成し、しかる後、前記セラミックグリーン
シートに適当な打ち抜き加工を施し、所定形状となすと
ともに高温(約1600℃)で焼成することによって、
或いは酸化アルミニウム等の原料粉末に適当な有機溶
剤、溶媒を添加混合して原料粉末を調整するとともに該
原料粉末をプレス成型機によって所定形状に成形し、最
後に前記成形体を約1600℃の温度で焼成することに
よって製作され、またガラスエポキシ樹脂からなる場合
には、例えば、ガラス繊維を織り込んだ布にエポキシ樹
脂の前駆体を含浸させるとともに該エポキシ樹脂前駆体
を所定の温度で熱硬化させることによって製作される。
The substrate 1 is made of an oxide ceramic such as an aluminum oxide sintered body or a mullite sintered body, or a non-conductive material such as an aluminum nitride sintered body or a silicon carbide sintered body having an oxide film on its surface. Oxide ceramics, and further made of an electrically insulating material such as glass epoxy resin impregnated with epoxy resin in a cloth woven with glass fiber, for example, when formed of aluminum oxide sintered body By adding an appropriate organic solvent and a solvent to raw material powders such as aluminum oxide, silicon oxide, magnesium oxide, and calcium oxide to form a slurry, and using a conventionally known doctor blade method or calender roll method, A ceramic green sheet (ceramic green sheet) is formed, and then a suitable punch is formed on the ceramic green sheet. By baking at a high temperature (about 1600 ° C.) with can process the applied and forms a predetermined shape,
Alternatively, an appropriate organic solvent and a solvent are added to and mixed with a raw material powder such as aluminum oxide to prepare the raw material powder, and at the same time, the raw material powder is formed into a predetermined shape by a press molding machine. In the case of being manufactured by baking with, and made of glass epoxy resin, for example, impregnating an epoxy resin precursor into a cloth woven of glass fiber and thermally curing the epoxy resin precursor at a predetermined temperature Produced by

【0018】また前記基板1には上下両面に貫通する孔
径が、例えば、300μm〜500μmの貫通孔5が形
成されており、該貫通孔5の内壁には両端が基板1の上
下両面に導出する導電層6が被着されている。
The substrate 1 is formed with through holes 5 having a hole diameter of, for example, 300 μm to 500 μm, which penetrate the upper and lower surfaces of the substrate 1. A conductive layer 6 is applied.

【0019】前記貫通孔5は後述する基板1の上面に形
成される多層配線部4の配線導体層3と外部電気回路と
を電気的に接続する、或いは基板1の上下両面に多層配
線部4を配設した場合には両面の多層配線部4の配線導
体層3同士を電気的に接続する導電層6を形成するため
の形成孔として作用し、基板1にドリル孔あけ加工法を
施すことによって基板1の所定位置に所定形状に形成さ
れる。
The through hole 5 electrically connects the wiring conductor layer 3 of the multilayer wiring portion 4 formed on the upper surface of the substrate 1 to be described later and an external electric circuit, or the multilayer wiring portion 4 is formed on both upper and lower surfaces of the substrate 1. Is provided, it acts as a forming hole for forming a conductive layer 6 for electrically connecting the wiring conductor layers 3 of the multilayer wiring portion 4 on both sides, and the substrate 1 is subjected to a drilling method. Thereby, a predetermined shape is formed at a predetermined position on the substrate 1.

【0020】更に前記貫通孔5の内壁及び基板1の上下
両面に被着形成されている導電層6は例えば、銅やニッ
ケル等の金属材料からなり、従来周知のメッキ法及びエ
ッチング法を採用することによって貫通孔5の内壁に両
端を基板1の上下両面に導出させた状態で被着形成され
る。
The conductive layer 6 formed on the inner wall of the through hole 5 and on the upper and lower surfaces of the substrate 1 is made of a metal material such as copper or nickel, for example, and employs well-known plating and etching methods. As a result, it is formed on the inner wall of the through hole 5 with both ends being led out to the upper and lower surfaces of the substrate 1.

【0021】前記導電層6は基板1の上面に形成される
多層配線部4の配線導体層3を外部電気回路に電気的に
接続したり、基板1の上下両面に形成される各々の多層
配線部4の配線導体層3同士を電気的に接続するさよう
をなす。
The conductive layer 6 is used to electrically connect the wiring conductor layer 3 of the multilayer wiring portion 4 formed on the upper surface of the substrate 1 to an external electric circuit, or to form a multilayer wiring formed on both upper and lower surfaces of the substrate 1. The wiring conductor layers 3 of the portion 4 are electrically connected to each other.

【0022】また前記基板1に形成した貫通孔5はその
内部にエポキシ樹脂等から成る有機樹脂充填体7が充填
されており、該有機樹脂充填体7によって貫通孔5が完
全に埋められ、同時に有機樹脂充填体7の両端面が基板
1の上下両面に被着させた導電層6の面と同一平面とな
っている。
The through-hole 5 formed in the substrate 1 is filled with an organic resin filler 7 made of epoxy resin or the like, and the through-hole 5 is completely filled with the organic resin filler 7, and at the same time, Both end surfaces of the organic resin filler 7 are flush with the surface of the conductive layer 6 attached to the upper and lower surfaces of the substrate 1.

【0023】前記有機樹脂充填体7は基板1の上面及び
/又は下面に後述する有機樹脂絶縁層2と配線導体層3
とから成る多層配線部4を形成する際、多層配線部4の
有機樹脂絶縁層2と配線導体層3の平坦化を維持する作
用をなす。
The organic resin filler 7 is provided on the upper and / or lower surface of the substrate 1 with an organic resin insulating layer 2 and a wiring conductor layer 3 which will be described later.
When the multilayer wiring portion 4 is formed, the organic resin insulating layer 2 and the wiring conductor layer 3 of the multilayer wiring portion 4 function to maintain flatness.

【0024】なお、前記有機樹脂充填体7は基板1の貫
通孔5内にエポキシ樹脂等の前駆体を充填し、しかる
後、これに80〜200℃の温度を0.5〜3時間印加
し、完全に熱硬化させることによって基板1の貫通孔5
内に充填される。
The organic resin filler 7 fills the through hole 5 of the substrate 1 with a precursor such as an epoxy resin, and then is applied with a temperature of 80 to 200 ° C. for 0.5 to 3 hours. Is completely cured by heat so that the through holes 5 of the substrate 1 are formed.
Is filled in.

【0025】前記基板1はまたその上面に有機樹脂絶縁
層2と配線導体層3とが交互に多層に配設されて形成さ
れる多層配線部4が被着されており、該多層配線部4を
構成する有機樹脂絶縁層2は上下に位置する配線導体層
3の電気的絶縁を図る作用をなし、また配線導体層3は
電気信号を伝達するための伝送路として作用する。
On the upper surface of the substrate 1, a multilayer wiring portion 4 formed by alternately arranging an organic resin insulating layer 2 and a wiring conductor layer 3 in multiple layers is attached. The organic resin insulating layer 2 serves to electrically insulate the upper and lower wiring conductor layers 3, and the wiring conductor layer 3 functions as a transmission path for transmitting electric signals.

【0026】前記多層配線部4の有機樹脂絶縁層2は、
エポキシ樹脂、ビスマレイミドトリアジン樹脂、ポリフ
ェニレンエーテル樹脂、フッ素樹脂等の有機樹脂から成
り、例えば、エポキシ樹脂からなる場合、ビスフェノー
ルA型エポキシ樹脂、ノボラック型エポキシ樹脂、グリ
シジルエステル型エポキシ樹脂等にアミン系硬化剤、イ
ミダゾール系硬化剤、酸無水物系硬化剤等の硬化剤を添
加混合してペースト状のエポキシ樹脂前駆体を得るとと
もに該エポキシ樹脂前駆体を基板1の上部にスピンコー
ト法により被着させ、しかる後、これを80℃〜200
℃の熱で0.5〜3時間熱処理し、熱硬化させることに
よって形成させる。
The organic resin insulating layer 2 of the multilayer wiring section 4
It is made of an organic resin such as an epoxy resin, a bismaleimide triazine resin, a polyphenylene ether resin, and a fluororesin. For example, when the resin is made of an epoxy resin, it is amine-cured to a bisphenol A type epoxy resin, a novolak type epoxy resin, a glycidyl ester type epoxy resin, or the like. A curing agent such as a curing agent, an imidazole-based curing agent, an acid anhydride-based curing agent is added and mixed to obtain a paste-like epoxy resin precursor, and the epoxy resin precursor is adhered to the upper portion of the substrate 1 by spin coating. After that, this is brought to 80 ° C. to 200 ° C.
The film is formed by heat-treating with heat of 0.5 ° C. for 0.5 to 3 hours and heat-curing.

【0027】更に前記多層配線部4の有機樹脂絶縁層2
はその各々の所定位置に最小径が有機樹脂絶縁層2の厚
みに対して約1.5倍程度のスルーホール8が形成され
ており、該スルーホール8は後述する有機樹脂絶縁層2
を介して上下に位置する配線導体層3の各々を電気的に
接続するスルーホール導体9を形成するための形成孔と
して作用する。
Further, the organic resin insulating layer 2 of the multilayer wiring section 4
Has a through hole 8 having a minimum diameter of about 1.5 times the thickness of the organic resin insulating layer 2 at each predetermined position.
And serves as a forming hole for forming a through-hole conductor 9 that electrically connects each of the wiring conductor layers 3 located above and below via the through hole.

【0028】前記有機樹脂絶縁層2に設けるスルーホー
ル8は有機樹脂絶縁層2に従来周知のフォトリソグラフ
ィー技術を採用することによって所定の径に形成され
る。
The through holes 8 provided in the organic resin insulating layer 2 are formed in the organic resin insulating layer 2 to have a predetermined diameter by employing a conventionally known photolithography technique.

【0029】また前記各有機樹脂絶縁層2の上面には所
定パターンの配線導体層3が、更に各有機樹脂絶縁層2
に設けたスルーホール8の内壁にはスルーホール導体9
が各々配設されており、スルーホール導体9によって間
に有機樹脂絶縁層2を挟んで上下に位置する各配線導体
層3の各々が電気的に接続されるようになっている。
A wiring conductor layer 3 having a predetermined pattern is formed on the upper surface of each organic resin insulating layer 2.
The through hole conductor 9 is provided on the inner wall of the through hole 8
Are arranged, and each of the wiring conductor layers 3 located vertically above and below the organic resin insulating layer 2 with the through-hole conductor 9 therebetween is electrically connected.

【0030】前記各有機樹脂絶縁層2の上面及びスルー
ホール8の内壁に配設される配線導体層3及びスルーホ
ール導体層9は銅、金、銀、アルミニウムの金属材料を
無電解メッキ法や蒸着法、スパッタリング法等の薄膜形
成技術及びフォトリソグラフィー技術を採用することに
よって形成され、例えば、銅で形成されている場合に
は、有機樹脂絶縁層2の上面及びスルーホール8の内表
面に、硫酸銅0.06モル/リットル、ホルマリン0.
3モル/リットル、水酸化ナトリウム0.35モル/リ
ットル、エチレンジアミン四酢酸0.35モル/リット
ルから成る無電解銅メッキ浴を用いて厚さ1μm乃至4
0μmの銅を被着させ、しかる後、前記銅層をフォトリ
ソグラフィー技術により所定パターンに加工することに
よって各有機樹脂絶縁層2間、及びスルーホール8内壁
に配設される。この場合、配線導体層3及びスルーホー
ル導体9は薄膜形成技術により形成されることから配線
の微細化が可能であり、これによって配線導体層3を極
めて高密度に形成することが可能となる。また前記配線
導体層3及びスルーホール導体9を銅、金、銀、アルミ
ニウムもしくはこれらを主成分とする金属で形成してお
くと該銅、金等はその電気抵抗率が3μΩ・cm以下と
低いことから配線導体層3及びスルーホール導体9を電
気信号が伝搬しても電気信号に大きな減衰等が生じるこ
とはなく、これによって配線導体層3及びスルーホール
導体9を介し搭載実装される半導体素子等の電子部品A
に対し電気信号を確実に出し入れすることができる。更
に前記配線導体層3はそれを銅、金、銀、アルミニウム
もしくはこれらを主成分とする金属で形成した場合、該
銅、金等の融点は660〜1080℃程度であり、多少
低いものの有機樹脂絶縁層2の熱硬化温度が80〜20
0℃と極めて低いことから有機樹脂絶縁層2を熱硬化処
理によって形成する際、配線導体層3が気散することは
なく、有機樹脂絶縁層2間に所定パターンの配線導体層
3を形成することができる。
The wiring conductor layer 3 and the through-hole conductor layer 9 provided on the upper surface of each of the organic resin insulating layers 2 and the inner wall of the through-hole 8 are made of a metal material such as copper, gold, silver or aluminum by electroless plating. It is formed by employing a thin film forming technique such as a vapor deposition method and a sputtering method and a photolithography technique. For example, in the case of being formed of copper, on the upper surface of the organic resin insulating layer 2 and the inner surface of the through hole 8, Copper sulfate 0.06 mol / l, formalin 0.
An electroless copper plating bath consisting of 3 mol / l, sodium hydroxide 0.35 mol / l and ethylenediaminetetraacetic acid 0.35 mol / l has a thickness of 1 μm to 4 μm.
Copper having a thickness of 0 μm is deposited, and thereafter, the copper layer is processed into a predetermined pattern by a photolithography technique to be disposed between the organic resin insulating layers 2 and on the inner wall of the through hole 8. In this case, since the wiring conductor layer 3 and the through-hole conductor 9 are formed by a thin film forming technique, the wiring can be miniaturized, and thus the wiring conductor layer 3 can be formed at an extremely high density. When the wiring conductor layer 3 and the through-hole conductor 9 are formed of copper, gold, silver, aluminum or a metal containing these as a main component, the electric resistivity of the copper, gold, etc. is as low as 3 μΩ · cm or less. Therefore, even if an electric signal propagates through the wiring conductor layer 3 and the through-hole conductor 9, no large attenuation or the like occurs in the electric signal, whereby the semiconductor element mounted and mounted via the wiring conductor layer 3 and the through-hole conductor 9 is formed. Electronic parts A such as
The electric signal can be reliably transmitted and received with respect to. Further, when the wiring conductor layer 3 is made of copper, gold, silver, aluminum or a metal containing these as a main component, the melting point of the copper, gold, etc. is about 660 to 1080 ° C. The thermosetting temperature of the insulating layer 2 is 80 to 20
Since the temperature is extremely low at 0 ° C., when the organic resin insulating layer 2 is formed by the thermosetting treatment, the wiring conductor layer 3 does not diffuse and the wiring conductor layer 3 having a predetermined pattern is formed between the organic resin insulating layers 2. be able to.

【0031】なお、前記有機樹脂絶縁層2と配線導体層
3とを交互に多層に配設して形成される多層配線部4は
各有機樹脂絶縁層2の上面を中心線平均粗さ(Ra)で
0.05μm≦Ra≦5μmの粗面としておくと有機樹
脂絶縁層2と配線導体層3との接合及び上下に位置する
有機樹脂絶縁層2同士の接合を強固となすことができ
る。従って、前記多層配線部4の各有機樹脂絶縁層2は
その上面をエッチング加工法等によって粗し、中心線平
均粗さ(Ra)で0.05μm≦Ra≦5μmの粗面と
しておくことが好ましい。
The multilayer wiring portion 4 formed by alternately arranging the organic resin insulating layers 2 and the wiring conductor layers 3 in multiple layers has a center line average roughness (Ra) on the upper surface of each organic resin insulating layer 2. If the rough surface is set to 0.05 μm ≦ Ra ≦ 5 μm in ()), the bonding between the organic resin insulating layer 2 and the wiring conductor layer 3 and the bonding between the organic resin insulating layers 2 located above and below can be made strong. Therefore, it is preferable that the upper surface of each organic resin insulating layer 2 of the multilayer wiring section 4 is roughened by an etching method or the like, and the roughened surface has a center line average roughness (Ra) of 0.05 μm ≦ Ra ≦ 5 μm. .

【0032】また前記有機樹脂絶縁層2はその表面の
2.5mmの長さにおける凹凸の高さ(Pc)のカウン
ト値を、1μm≦Pc≦10μmが500個以上、0.
1μm≦Pc≦1μmが2500個以上、0.01μm
≦Pc≦0.1μmが12500個以上としておくと有
機樹脂絶縁層2と配線導体層3との接合及び上下に位置
する有機樹脂絶縁層2同士の接合がより強固となる。従
って、前記有機樹脂絶縁層2はその表面の2.5mmの
長さにおける凹凸の高さ(Pc)のカウント値を、1μ
m≦Pc≦10μmが500個以上、0.1μm≦Pc
≦1μmが2500個以上、0.01μm≦Pc≦0.
1μmが12500個以上としておくことが好ましい。
The count value of the height (Pc) of the unevenness of the surface of the organic resin insulating layer 2 at a length of 2.5 mm is 500 or more for 1 μm ≦ Pc ≦ 10 μm.
2500 μm of 1 μm ≦ Pc ≦ 1 μm, 0.01 μm
If ≦ Pc ≦ 0.1 μm is set to 12500 or more, the bonding between the organic resin insulating layer 2 and the wiring conductor layer 3 and the bonding between the organic resin insulating layers 2 located above and below become stronger. Therefore, the count value of the height (Pc) of the unevenness at a length of 2.5 mm on the surface of the organic resin insulating layer 2 is 1 μm.
500 or more m ≦ Pc ≦ 10 μm, 0.1 μm ≦ Pc
2500 ≦ 1 μm, 0.01 μm ≦ Pc ≦ 0.
Preferably, 1 μm is 12,500 or more.

【0033】前記有機樹脂絶縁層2上面の中心線平均粗
さ(Ra)及び2.5mmの長さにおける凹凸の高さ
(Pc)のカウント値は、有機樹脂絶縁層2の表面を原
子間力顕微鏡(Digital Instruments Inc.製のDimensio
n 3000-Nano Scope III )で50μm角の対角(70μ
m)に走査させてその表面状態を検査測定し、その測定
結果より各々の数値を出した。
The center line average roughness (Ra) of the upper surface of the organic resin insulating layer 2 and the count value of the unevenness height (Pc) at a length of 2.5 mm are obtained by measuring the surface of the organic resin insulating layer 2 with an atomic force. Microscope (Dimensio manufactured by Digital Instruments Inc.
n 3000-Nano Scope III) 50μm diagonal (70μm)
m), the surface condition was inspected and measured, and each numerical value was obtained from the measurement result.

【0034】また前記中心線平均粗さ(Ra)が0.0
5μm≦Ra≦5μm、2.5mmの長さにおける凹凸
の高さ(Pc)のカウント値が、1μm≦Pc≦10μ
mが500個以上、0.1μm≦Pc≦1μmが250
0個以上、0.01μm≦Pc≦0.1μmが1250
0個以上の有機樹脂絶縁層2は、該有機樹脂絶縁層2の
上面にCHF3 、CF4 、Ar等のガスを吹きつけたり
アクティブイオンエッチング処理をすることによって表
面が所定の粗さに粗される。
The center line average roughness (Ra) is 0.0
5 μm ≦ Ra ≦ 5 μm, the count value of the height of unevenness (Pc) at a length of 2.5 mm is 1 μm ≦ Pc ≦ 10 μm
m is 500 or more, and 0.1 μm ≦ Pc ≦ 1 μm is 250
0 or more, 0.01 μm ≦ Pc ≦ 0.1 μm is 1250
The surface of the zero or more organic resin insulating layers 2 is roughened to a predetermined roughness by spraying a gas such as CHF 3 , CF 4 , Ar or the like on the upper surface of the organic resin insulating layers 2 or performing active ion etching. You.

【0035】更に前記有機樹脂絶縁層2はその各々の厚
みが100μmを超えると有機樹脂絶縁層2にフォトリ
ソグラフィー技術を採用することによってスルーホール
8を形成する際、エッチング加工時間が長くなってスル
ーホール8を所望する鮮明な形状に形成するのが困難と
なり、また5μm未満となると有機樹脂絶縁層2の上面
に上下に位置する有機樹脂絶縁層2の接合強度を上げる
ための粗面加工を施す際、有機樹脂絶縁層2に不要な穴
が形成され上下に位置する配線導体層3に不要な電気的
短絡を招来してしまう危険性がある。従って、前記有機
樹脂絶縁層2はその各々の厚みを5μm乃至100μm
の範囲としておくことが好ましい。
Further, when the thickness of each of the organic resin insulating layers 2 exceeds 100 μm, when the through holes 8 are formed by employing photolithography technology in the organic resin insulating layers 2, the etching process time becomes longer, and It is difficult to form the hole 8 into a desired clear shape, and if it is less than 5 μm, rough surface processing is performed on the upper surface of the organic resin insulating layer 2 to increase the bonding strength of the upper and lower organic resin insulating layers 2. In this case, there is a risk that unnecessary holes may be formed in the organic resin insulating layer 2 and unnecessary electrical short circuits may be caused in the wiring conductor layers 3 located above and below. Therefore, the organic resin insulating layer 2 has a thickness of 5 μm to 100 μm.
Is preferably set in the range.

【0036】また更に前記多層配線部4の各配線導体層
3はその厚みが1μm未満であると各配線導体層3の電
気抵抗値が大きなものとなって各配線導体層3に所定の
電気信号を伝達させることが困難となり、また40μm
を超えると配線導体層3を有機樹脂絶縁層2に被着させ
る際に配線導体層3の内部に大きな応力が内在し、該大
きな内在応力によって配線導体層3が有機樹脂絶縁層2
より剥離し易いものとなる。従って、前記多層配線部4
の各薄膜配線導体層3の厚みは1μm乃至40μmの範
囲としておくことが好ましい。
Further, if the thickness of each wiring conductor layer 3 of the multilayer wiring portion 4 is less than 1 μm, the electric resistance value of each wiring conductor layer 3 becomes large, and a predetermined electric signal is applied to each wiring conductor layer 3. Is difficult to transmit, and 40 μm
When the wiring conductor layer 3 is applied to the organic resin insulating layer 2, a large stress is present inside the wiring conductor layer 3 when the wiring conductor layer 3 is adhered to the organic resin insulating layer 2.
It is easier to peel off. Therefore, the multilayer wiring section 4
The thickness of each thin-film wiring conductor layer 3 is preferably in the range of 1 μm to 40 μm.

【0037】前記多層配線部4の配線導体層3はまたそ
の少なくとも一部に磁性粉末が含有されて磁性領域を形
成しており、該磁性粉末によって外部電気回路より配線
導体層3に入り込んだノイズ及び配線導体層3を伝搬す
る電気信号が配線導体層3の屈曲部において反射するこ
と等により発生したノイズは半導体素子や容量素子等の
電子部品Aに入り込む前に熱エネルギーに変換されて吸
収され、その結果、半導体素子等の電子部品Aにノイズ
が入り込むことはなく、半導体素子等の電子部品Aを常
に正常に作動させることが可能となる。
The wiring conductor layer 3 of the multilayer wiring part 4 has a magnetic region formed by containing at least a part of magnetic powder, and the magnetic powder enters the wiring conductor layer 3 from an external electric circuit. The noise generated by the reflection of the electric signal propagating through the wiring conductor layer 3 at the bent portion of the wiring conductor layer 3 is converted into thermal energy and absorbed before entering the electronic component A such as a semiconductor element or a capacitance element. As a result, noise does not enter the electronic component A such as a semiconductor element, and the electronic component A such as a semiconductor element can always be normally operated.

【0038】前記配線導体層3の少なくとも一部に含有
される磁性粉末としてはZnFe24 、MnFe2
4 、FeFe2 4 、CoFe2 4 、NiFe
2 4 、CuFe2 4 等のフェライトが好適に使用さ
れる。
The magnetic powder contained in at least a part of the wiring conductor layer 3 is ZnFe 2 O 4 , MnFe 2 O
4 , FeFe 2 O 4 , CoFe 2 O 4 , NiFe
Ferrites such as 2 O 4 and CuFe 2 O 4 are preferably used.

【0039】また前記ZnFe2 4 、MnFe2 4
等のフェライトは中性または還元雰囲気中にて1200
℃の温度で磁性を失うが、有機樹脂絶縁層2の熱硬化温
度は80〜200℃と極めて低いことから有機樹脂絶縁
層2を熱硬化処理によって形成する際、配線導体層3に
含有させた磁性粉末が磁性を失うことはなく、これによ
って配線導体層3に入り込んだノイズ及び配線導体層3
を伝搬する電気信号が配線導体層3の屈曲部において反
射すること等により発生したノイズを確実に熱エネルギ
ーに変換して吸収することができる。
The above ZnFe 2 O 4 , MnFe 2 O 4
Ferrite such as 1200 in a neutral or reducing atmosphere
Although the magnetism is lost at a temperature of ° C., the thermosetting temperature of the organic resin insulating layer 2 is extremely low at 80 to 200 ° C., so that the organic resin insulating layer 2 was contained in the wiring conductor layer 3 when the organic resin insulating layer 2 was formed by thermosetting. The magnetic powder does not lose magnetism, so that noise entering the wiring conductor layer 3 and the wiring conductor layer 3
The noise generated due to the reflection of the electric signal propagating through the bent portion of the wiring conductor layer 3 or the like can be surely converted into thermal energy and absorbed.

【0040】更に前記配線導体層3の内部に含有される
磁性粉末はその量が10重量%未満であると配線導体層
3に入り込んだノイズ等を良好に吸収することができ
ず、また70重量%を超えると配線導体層3の導通抵抗
が高くなり、配線導体層3に電気信号を良好に伝搬させ
ることが困難となる。従って、前記配線導体層3の内部
に含有される磁性粉末はその量を10乃至70重量%の
範囲としておくことが好ましい。
Further, if the amount of the magnetic powder contained in the wiring conductor layer 3 is less than 10% by weight, noise and the like entering the wiring conductor layer 3 cannot be satisfactorily absorbed. %, The conductive resistance of the wiring conductor layer 3 becomes high, and it becomes difficult to transmit an electric signal to the wiring conductor layer 3 satisfactorily. Therefore, it is preferable that the amount of the magnetic powder contained in the wiring conductor layer 3 be in the range of 10 to 70% by weight.

【0041】前記磁性粉末の配線導体層3への含有は、
例えば、配線導体層3をメッキ法によって形成する場
合、予めメッキ浴中に磁性粉末を添加含有させておくこ
とによって行われる。
The content of the magnetic powder in the wiring conductor layer 3 is as follows:
For example, when the wiring conductor layer 3 is formed by a plating method, it is performed by adding a magnetic powder in a plating bath in advance.

【0042】かくして、本発明の配線基板によれば、基
板1の上面に被着させた多層配線部4上に半導体素子や
容量素子、抵抗器等の電子部品Aを搭載実装させ、電子
部品Aの各電極を配線導体層3に電気的に接続させるこ
とによって半導体装置や混成集積回路装置となり、基板
1の下面に被着されている導電層6を外部電気回路に接
続すれば半導体装置や混成集積回路装置は外部電気回路
に電気的に接続されるこことなる。
Thus, according to the wiring board of the present invention, the electronic component A such as a semiconductor element, a capacitor, and a resistor is mounted and mounted on the multilayer wiring section 4 attached to the upper surface of the substrate 1. Are electrically connected to the wiring conductor layer 3 to form a semiconductor device or a hybrid integrated circuit device. If the conductive layer 6 attached to the lower surface of the substrate 1 is connected to an external electric circuit, the semiconductor device or the hybrid integrated circuit device is formed. The integrated circuit device is here electrically connected to an external electric circuit.

【0043】なお、本発明は上述の実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲であれば
種々の変更は可能であり、例えば、上述の実施例におい
ては基板1の上面のみに有機樹脂絶縁層2と配線導体層
3とを交互に積層して形成される多層配線部4を被着さ
せたが、多層配線部4を基板1の下面側のみに設けて
も、上下の両主面に設けてもよい。
It should be noted that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the spirit of the present invention. Although the multilayer wiring portion 4 formed by alternately laminating the organic resin insulating layers 2 and the wiring conductor layers 3 is applied only on the upper surface, the multilayer wiring portion 4 may be provided only on the lower surface side of the substrate 1. It may be provided on both upper and lower main surfaces.

【0044】また上述の実施例では基板1の上面に有機
樹脂絶縁層2と配線導体層3とを交互に多層に形成した
が、基板1を兼ねる一つの有機樹脂絶縁層に一層の配線
導体層3を形成した配線基板であってもよい。
In the above-described embodiment, the organic resin insulating layers 2 and the wiring conductor layers 3 are alternately formed in multiple layers on the upper surface of the substrate 1. However, one organic resin insulating layer serving also as the substrate 1 has one wiring conductor layer. 3 may be used.

【0045】[0045]

【発明の効果】本発明の配線基板によれば、金、銀、
銅、アルミニウム等から成る配線導体層の少なくとも一
部に、フェライト等から成る磁性粉末を含有させ磁性領
域を形成したことから外部電気回路より配線導体層に入
り込んだノイズ及び配線導体層を伝搬する電気信号が配
線導体層の屈曲部において反射すること等により発生し
たノイズは実装される半導体素子等の電子部品に入り込
む前に配線導体層に含有されている磁性粉末で熱エネル
ギーに変換されて吸収され、その結果、半導体素子等の
電子部品にノイズが入り込むこはなく、半導体素子等の
電子部品を常に正常に作動させることが可能となる。
According to the wiring board of the present invention, gold, silver,
At least a part of the wiring conductor layer made of copper, aluminum or the like contains a magnetic powder made of ferrite or the like to form a magnetic region. Therefore, noise that enters the wiring conductor layer from an external electric circuit and electricity that propagates through the wiring conductor layer. Noise generated by reflection of a signal at the bent portion of the wiring conductor layer is converted into thermal energy by the magnetic powder contained in the wiring conductor layer and absorbed by the magnetic powder contained in the wiring conductor layer before entering the electronic component such as a semiconductor element to be mounted. As a result, noise does not enter the electronic components such as the semiconductor elements, and the electronic components such as the semiconductor elements can always be normally operated.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板の一実施例を示す断面図であ
る。
FIG. 1 is a sectional view showing one embodiment of a wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・基板 2・・・有機樹脂絶縁層 3・・・配線導体層 4・・・多層配線部 8・・・スルーホール 9・・・スルーホール導体 A・・・電子部品 DESCRIPTION OF SYMBOLS 1 ... Substrate 2 ... Organic resin insulating layer 3 ... Wiring conductor layer 4 ... Multilayer wiring part 8 ... Through-hole 9 ... Through-hole conductor A ... Electronic components

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】有機樹脂絶縁層に配線導体層を被着形成し
て成る配線基板であって、前記配線導体層の一部に磁性
粉末を含有させた磁性領域を形成したことを特徴とする
配線基板。
1. A wiring board comprising a wiring conductor layer formed on an organic resin insulating layer, wherein a magnetic region containing a magnetic powder is formed in a part of the wiring conductor layer. Wiring board.
【請求項2】前記配線導体層の磁性領域における磁性粉
末の含有量が10乃至70重量%であることを特徴とす
る請求項1に記載の配線基板。
2. The wiring board according to claim 1, wherein the content of the magnetic powder in the magnetic region of the wiring conductor layer is 10 to 70% by weight.
【請求項3】前記配線導体層は金、銀、銅、アルミニウ
ムもしくはこれらの合金を主成分とし、磁性粉末はフェ
ライトを主成分としていることを特徴とする請求項1に
記載の配線基板。
3. The wiring board according to claim 1, wherein the wiring conductor layer is mainly composed of gold, silver, copper, aluminum or an alloy thereof, and the magnetic powder is mainly composed of ferrite.
JP3646098A 1998-02-18 1998-02-18 Wiring board Pending JPH11233909A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3646098A JPH11233909A (en) 1998-02-18 1998-02-18 Wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3646098A JPH11233909A (en) 1998-02-18 1998-02-18 Wiring board

Publications (1)

Publication Number Publication Date
JPH11233909A true JPH11233909A (en) 1999-08-27

Family

ID=12470439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3646098A Pending JPH11233909A (en) 1998-02-18 1998-02-18 Wiring board

Country Status (1)

Country Link
JP (1) JPH11233909A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1143774A2 (en) * 2000-04-04 2001-10-10 Tokin Corporation Wiring board comprising granular magnetic film
JP2002185132A (en) * 2000-12-12 2002-06-28 Taiyo Ink Mfg Ltd Dry film for multilayer printed circuit board, method for manufacturing multilayer printed circuit board using the same, and the multilayer printed circuit board
US8585186B2 (en) 2006-08-15 2013-11-19 Fuji Xerox Co., Ltd. Method of manufacturing substrate and substrate, method of manufacturing liquid drop ejecting head and liquid drop ejecting head, and liquid drop ejecting device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1143774A2 (en) * 2000-04-04 2001-10-10 Tokin Corporation Wiring board comprising granular magnetic film
EP1143774A3 (en) * 2000-04-04 2002-02-27 Tokin Corporation Wiring board comprising granular magnetic film
US6653573B2 (en) 2000-04-04 2003-11-25 Nec Tokin Corporation Wiring board comprising granular magnetic film
US6919772B2 (en) 2000-04-04 2005-07-19 Nec Tokin Corporation Wiring board comprising granular magnetic film
US6953899B1 (en) 2000-04-04 2005-10-11 Nec Tokin Corporation Wiring board comprising granular magnetic film
US6956173B2 (en) 2000-04-04 2005-10-18 Nec Tokin Corporation Wiring board comprising granular magnetic film
JP2002185132A (en) * 2000-12-12 2002-06-28 Taiyo Ink Mfg Ltd Dry film for multilayer printed circuit board, method for manufacturing multilayer printed circuit board using the same, and the multilayer printed circuit board
JP4666754B2 (en) * 2000-12-12 2011-04-06 太陽ホールディングス株式会社 Dry film for multilayer printed wiring board and method for producing multilayer printed wiring board using the same
US8585186B2 (en) 2006-08-15 2013-11-19 Fuji Xerox Co., Ltd. Method of manufacturing substrate and substrate, method of manufacturing liquid drop ejecting head and liquid drop ejecting head, and liquid drop ejecting device

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