JPH11135914A - 印刷回路組立体試験用相互接続アダプタ - Google Patents

印刷回路組立体試験用相互接続アダプタ

Info

Publication number
JPH11135914A
JPH11135914A JP10222617A JP22261798A JPH11135914A JP H11135914 A JPH11135914 A JP H11135914A JP 10222617 A JP10222617 A JP 10222617A JP 22261798 A JP22261798 A JP 22261798A JP H11135914 A JPH11135914 A JP H11135914A
Authority
JP
Japan
Prior art keywords
assembly
printed circuit
main base
pca
circuit assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10222617A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11135914A5 (enExample
Inventor
Mark L Gilbert
マーク・エル・ギルバート
Robert J Wharton
ロバート・ジェイ・ワートン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH11135914A publication Critical patent/JPH11135914A/ja
Publication of JPH11135914A5 publication Critical patent/JPH11135914A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Combinations Of Printed Boards (AREA)
JP10222617A 1997-08-19 1998-08-06 印刷回路組立体試験用相互接続アダプタ Pending JPH11135914A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US914,829 1997-08-19
US08/914,829 US6002264A (en) 1997-08-19 1997-08-19 Interconnect adapter to printed circuit assembly for testing in an operational environment

Publications (2)

Publication Number Publication Date
JPH11135914A true JPH11135914A (ja) 1999-05-21
JPH11135914A5 JPH11135914A5 (enExample) 2005-11-04

Family

ID=25434826

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10222617A Pending JPH11135914A (ja) 1997-08-19 1998-08-06 印刷回路組立体試験用相互接続アダプタ

Country Status (4)

Country Link
US (1) US6002264A (enExample)
EP (1) EP0898172B1 (enExample)
JP (1) JPH11135914A (enExample)
DE (1) DE69822571T2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11175210A (ja) * 1997-12-17 1999-07-02 Alps Electric Co Ltd 記録再生装置
US7706545B2 (en) * 2003-03-21 2010-04-27 D2Audio Corporation Systems and methods for protection of audio amplifier circuits
US6879178B1 (en) 2003-12-22 2005-04-12 Hewlett-Packard Development Company, L.P. Measuring current on a die
US7102357B2 (en) * 2004-03-22 2006-09-05 Hewlett-Packard Development Company, L.P. Determination of worst case voltage in a power supply loop
US9442151B2 (en) * 2014-06-09 2016-09-13 Sandisk Technologies Llc Methods, systems, and computer readable media for detecting electrical disconnection between integrated circuit chip electrical connections and corresponding electrical contacts on a printed circuit board or chip socket during testing of the chip under environmental conditions
DE102019215126A1 (de) 2019-10-01 2021-04-01 Neuroloop GmbH Anordnung zur Funktionsüberprüfung eines Meßobjektes

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
US4724383A (en) * 1985-05-03 1988-02-09 Testsystems, Inc. PC board test fixture
US4771234A (en) * 1986-11-20 1988-09-13 Hewlett-Packard Company Vacuum actuated test fixture
US5055779A (en) * 1989-06-19 1991-10-08 Hewlett-Packard Company Integrated board testing system
US5633597A (en) * 1992-03-10 1997-05-27 Virginia Panel Corporation Micro interface technology system utilizing slide engagement mechanism
US5200694A (en) * 1992-05-18 1993-04-06 Tti Testron, Inc. Head assembly for printed circuit board test fixture
US5550481A (en) * 1995-02-08 1996-08-27 Semco Machine Corporation Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making
US5603619A (en) * 1995-07-20 1997-02-18 Intel Corporation Scalable test interface port

Also Published As

Publication number Publication date
US6002264A (en) 1999-12-14
DE69822571D1 (de) 2004-04-29
DE69822571T2 (de) 2005-02-03
EP0898172A1 (en) 1999-02-24
EP0898172B1 (en) 2004-03-24

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