DE69822571D1 - Überprüfung von Leiterplattenbaugruppen - Google Patents
Überprüfung von LeiterplattenbaugruppenInfo
- Publication number
- DE69822571D1 DE69822571D1 DE69822571T DE69822571T DE69822571D1 DE 69822571 D1 DE69822571 D1 DE 69822571D1 DE 69822571 T DE69822571 T DE 69822571T DE 69822571 T DE69822571 T DE 69822571T DE 69822571 D1 DE69822571 D1 DE 69822571D1
- Authority
- DE
- Germany
- Prior art keywords
- circuit board
- board assemblies
- checking circuit
- checking
- assemblies
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Combinations Of Printed Boards (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US914829 | 1997-08-19 | ||
US08/914,829 US6002264A (en) | 1997-08-19 | 1997-08-19 | Interconnect adapter to printed circuit assembly for testing in an operational environment |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69822571D1 true DE69822571D1 (de) | 2004-04-29 |
DE69822571T2 DE69822571T2 (de) | 2005-02-03 |
Family
ID=25434826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69822571T Expired - Fee Related DE69822571T2 (de) | 1997-08-19 | 1998-07-08 | Überprüfung von Leiterplattenbaugruppen |
Country Status (4)
Country | Link |
---|---|
US (1) | US6002264A (de) |
EP (1) | EP0898172B1 (de) |
JP (1) | JPH11135914A (de) |
DE (1) | DE69822571T2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11175210A (ja) * | 1997-12-17 | 1999-07-02 | Alps Electric Co Ltd | 記録再生装置 |
US7706545B2 (en) * | 2003-03-21 | 2010-04-27 | D2Audio Corporation | Systems and methods for protection of audio amplifier circuits |
US6879178B1 (en) | 2003-12-22 | 2005-04-12 | Hewlett-Packard Development Company, L.P. | Measuring current on a die |
US7102357B2 (en) * | 2004-03-22 | 2006-09-05 | Hewlett-Packard Development Company, L.P. | Determination of worst case voltage in a power supply loop |
US9442151B2 (en) * | 2014-06-09 | 2016-09-13 | Sandisk Technologies Llc | Methods, systems, and computer readable media for detecting electrical disconnection between integrated circuit chip electrical connections and corresponding electrical contacts on a printed circuit board or chip socket during testing of the chip under environmental conditions |
DE102019215126A1 (de) * | 2019-10-01 | 2021-04-01 | Neuroloop GmbH | Anordnung zur Funktionsüberprüfung eines Meßobjektes |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3970934A (en) * | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
US4724383A (en) * | 1985-05-03 | 1988-02-09 | Testsystems, Inc. | PC board test fixture |
US4771234A (en) * | 1986-11-20 | 1988-09-13 | Hewlett-Packard Company | Vacuum actuated test fixture |
US5055779A (en) * | 1989-06-19 | 1991-10-08 | Hewlett-Packard Company | Integrated board testing system |
US5633597A (en) * | 1992-03-10 | 1997-05-27 | Virginia Panel Corporation | Micro interface technology system utilizing slide engagement mechanism |
US5200694A (en) * | 1992-05-18 | 1993-04-06 | Tti Testron, Inc. | Head assembly for printed circuit board test fixture |
US5550481A (en) * | 1995-02-08 | 1996-08-27 | Semco Machine Corporation | Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making |
US5603619A (en) * | 1995-07-20 | 1997-02-18 | Intel Corporation | Scalable test interface port |
-
1997
- 1997-08-19 US US08/914,829 patent/US6002264A/en not_active Expired - Fee Related
-
1998
- 1998-07-08 DE DE69822571T patent/DE69822571T2/de not_active Expired - Fee Related
- 1998-07-08 EP EP98305429A patent/EP0898172B1/de not_active Expired - Fee Related
- 1998-08-06 JP JP10222617A patent/JPH11135914A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0898172A1 (de) | 1999-02-24 |
EP0898172B1 (de) | 2004-03-24 |
JPH11135914A (ja) | 1999-05-21 |
US6002264A (en) | 1999-12-14 |
DE69822571T2 (de) | 2005-02-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |