DE69822571T2 - Überprüfung von Leiterplattenbaugruppen - Google Patents

Überprüfung von Leiterplattenbaugruppen Download PDF

Info

Publication number
DE69822571T2
DE69822571T2 DE69822571T DE69822571T DE69822571T2 DE 69822571 T2 DE69822571 T2 DE 69822571T2 DE 69822571 T DE69822571 T DE 69822571T DE 69822571 T DE69822571 T DE 69822571T DE 69822571 T2 DE69822571 T2 DE 69822571T2
Authority
DE
Germany
Prior art keywords
main base
probe plate
assembly
printed circuit
plate assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69822571T
Other languages
German (de)
English (en)
Other versions
DE69822571D1 (de
Inventor
Mark L. Auburn Gilbert
Robert J. Rocklin Wharton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE69822571D1 publication Critical patent/DE69822571D1/de
Publication of DE69822571T2 publication Critical patent/DE69822571T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Combinations Of Printed Boards (AREA)
DE69822571T 1997-08-19 1998-07-08 Überprüfung von Leiterplattenbaugruppen Expired - Fee Related DE69822571T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US914829 1997-08-19
US08/914,829 US6002264A (en) 1997-08-19 1997-08-19 Interconnect adapter to printed circuit assembly for testing in an operational environment

Publications (2)

Publication Number Publication Date
DE69822571D1 DE69822571D1 (de) 2004-04-29
DE69822571T2 true DE69822571T2 (de) 2005-02-03

Family

ID=25434826

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69822571T Expired - Fee Related DE69822571T2 (de) 1997-08-19 1998-07-08 Überprüfung von Leiterplattenbaugruppen

Country Status (4)

Country Link
US (1) US6002264A (enExample)
EP (1) EP0898172B1 (enExample)
JP (1) JPH11135914A (enExample)
DE (1) DE69822571T2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11175210A (ja) * 1997-12-17 1999-07-02 Alps Electric Co Ltd 記録再生装置
US7706545B2 (en) * 2003-03-21 2010-04-27 D2Audio Corporation Systems and methods for protection of audio amplifier circuits
US6879178B1 (en) 2003-12-22 2005-04-12 Hewlett-Packard Development Company, L.P. Measuring current on a die
US7102357B2 (en) * 2004-03-22 2006-09-05 Hewlett-Packard Development Company, L.P. Determination of worst case voltage in a power supply loop
US9442151B2 (en) * 2014-06-09 2016-09-13 Sandisk Technologies Llc Methods, systems, and computer readable media for detecting electrical disconnection between integrated circuit chip electrical connections and corresponding electrical contacts on a printed circuit board or chip socket during testing of the chip under environmental conditions
DE102019215126A1 (de) 2019-10-01 2021-04-01 Neuroloop GmbH Anordnung zur Funktionsüberprüfung eines Meßobjektes

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
US4724383A (en) * 1985-05-03 1988-02-09 Testsystems, Inc. PC board test fixture
US4771234A (en) * 1986-11-20 1988-09-13 Hewlett-Packard Company Vacuum actuated test fixture
US5055779A (en) * 1989-06-19 1991-10-08 Hewlett-Packard Company Integrated board testing system
US5633597A (en) * 1992-03-10 1997-05-27 Virginia Panel Corporation Micro interface technology system utilizing slide engagement mechanism
US5200694A (en) * 1992-05-18 1993-04-06 Tti Testron, Inc. Head assembly for printed circuit board test fixture
US5550481A (en) * 1995-02-08 1996-08-27 Semco Machine Corporation Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making
US5603619A (en) * 1995-07-20 1997-02-18 Intel Corporation Scalable test interface port

Also Published As

Publication number Publication date
DE69822571D1 (de) 2004-04-29
EP0898172A1 (en) 1999-02-24
US6002264A (en) 1999-12-14
JPH11135914A (ja) 1999-05-21
EP0898172B1 (en) 2004-03-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee