JPH1079337A - 投影露光装置 - Google Patents
投影露光装置Info
- Publication number
- JPH1079337A JPH1079337A JP8234158A JP23415896A JPH1079337A JP H1079337 A JPH1079337 A JP H1079337A JP 8234158 A JP8234158 A JP 8234158A JP 23415896 A JP23415896 A JP 23415896A JP H1079337 A JPH1079337 A JP H1079337A
- Authority
- JP
- Japan
- Prior art keywords
- light
- illumination
- optical system
- polarizing plate
- projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8234158A JPH1079337A (ja) | 1996-09-04 | 1996-09-04 | 投影露光装置 |
| EP19970113696 EP0823662A2 (en) | 1996-08-07 | 1997-08-07 | Projection exposure apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8234158A JPH1079337A (ja) | 1996-09-04 | 1996-09-04 | 投影露光装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1079337A true JPH1079337A (ja) | 1998-03-24 |
| JPH1079337A5 JPH1079337A5 (enExample) | 2004-11-11 |
Family
ID=16966571
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8234158A Withdrawn JPH1079337A (ja) | 1996-08-07 | 1996-09-04 | 投影露光装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1079337A (enExample) |
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003532281A (ja) * | 2000-04-25 | 2003-10-28 | エーエスエムエル ユーエス,インコーポレイテッド | 照明偏光の制御を備えた光学縮小システム |
| JP2006332197A (ja) * | 2005-05-24 | 2006-12-07 | Nikon Corp | 鏡筒、露光装置及び光学素子の検出方法並びにデバイスの製造方法 |
| JP2008135742A (ja) * | 2006-11-27 | 2008-06-12 | Asml Netherlands Bv | リソグラフィ装置、デバイス製造方法およびコンピュータプログラム製品 |
| JP2009010346A (ja) * | 2007-05-17 | 2009-01-15 | Asml Netherlands Bv | リソグラフィ装置およびデバイス製造方法 |
| JP2009033191A (ja) * | 2004-05-25 | 2009-02-12 | Asml Holding Nv | 偏光のパタンを供給するための方法 |
| JP2009088358A (ja) * | 2007-10-01 | 2009-04-23 | Canon Inc | 照明光学系、露光装置およびデバイス製造方法 |
| JP2010010701A (ja) * | 2002-12-03 | 2010-01-14 | Nikon Corp | 照明光学装置、露光装置および露光方法 |
| JP2010091839A (ja) * | 2008-10-09 | 2010-04-22 | V Technology Co Ltd | 近接露光装置 |
| US7903234B2 (en) | 2006-11-27 | 2011-03-08 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and computer program product |
| US20130271945A1 (en) | 2004-02-06 | 2013-10-17 | Nikon Corporation | Polarization-modulating element, illumination optical apparatus, exposure apparatus, and exposure method |
| US8861084B2 (en) | 2004-01-16 | 2014-10-14 | Carl Zeiss Smt Ag | Polarization-modulating optical element |
| JP2015065441A (ja) * | 2003-10-28 | 2015-04-09 | 株式会社ニコン | 照明光学装置及び投影露光装置 |
| KR20150060992A (ko) * | 2005-01-21 | 2015-06-03 | 가부시키가이샤 니콘 | 조명 광학계 및 노광 장치 |
| US9341954B2 (en) | 2007-10-24 | 2016-05-17 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9581911B2 (en) | 2004-01-16 | 2017-02-28 | Carl Zeiss Smt Gmbh | Polarization-modulating optical element |
| US9678332B2 (en) | 2007-11-06 | 2017-06-13 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
| US9678437B2 (en) | 2003-04-09 | 2017-06-13 | Nikon Corporation | Illumination optical apparatus having distribution changing member to change light amount and polarization member to set polarization in circumference direction |
| US9885872B2 (en) | 2003-11-20 | 2018-02-06 | Nikon Corporation | Illumination optical apparatus, exposure apparatus, and exposure method with optical integrator and polarization member that changes polarization state of light |
| US9891539B2 (en) | 2005-05-12 | 2018-02-13 | Nikon Corporation | Projection optical system, exposure apparatus, and exposure method |
| US10101666B2 (en) | 2007-10-12 | 2018-10-16 | Nikon Corporation | Illumination optical apparatus, exposure apparatus, and device manufacturing method |
-
1996
- 1996-09-04 JP JP8234158A patent/JPH1079337A/ja not_active Withdrawn
Cited By (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003532281A (ja) * | 2000-04-25 | 2003-10-28 | エーエスエムエル ユーエス,インコーポレイテッド | 照明偏光の制御を備えた光学縮小システム |
| JP2010010701A (ja) * | 2002-12-03 | 2010-01-14 | Nikon Corp | 照明光学装置、露光装置および露光方法 |
| US9678437B2 (en) | 2003-04-09 | 2017-06-13 | Nikon Corporation | Illumination optical apparatus having distribution changing member to change light amount and polarization member to set polarization in circumference direction |
| US9885959B2 (en) | 2003-04-09 | 2018-02-06 | Nikon Corporation | Illumination optical apparatus having deflecting member, lens, polarization member to set polarization in circumference direction, and optical integrator |
| US9423698B2 (en) | 2003-10-28 | 2016-08-23 | Nikon Corporation | Illumination optical apparatus and projection exposure apparatus |
| JP2015065441A (ja) * | 2003-10-28 | 2015-04-09 | 株式会社ニコン | 照明光学装置及び投影露光装置 |
| US9760014B2 (en) | 2003-10-28 | 2017-09-12 | Nikon Corporation | Illumination optical apparatus and projection exposure apparatus |
| US10281632B2 (en) | 2003-11-20 | 2019-05-07 | Nikon Corporation | Illumination optical apparatus, exposure apparatus, and exposure method with optical member with optical rotatory power to rotate linear polarization direction |
| US9885872B2 (en) | 2003-11-20 | 2018-02-06 | Nikon Corporation | Illumination optical apparatus, exposure apparatus, and exposure method with optical integrator and polarization member that changes polarization state of light |
| US9581911B2 (en) | 2004-01-16 | 2017-02-28 | Carl Zeiss Smt Gmbh | Polarization-modulating optical element |
| US9316772B2 (en) | 2004-01-16 | 2016-04-19 | Carl Zeiss Smt Gmbh | Producing polarization-modulating optical element for microlithography system |
| US8861084B2 (en) | 2004-01-16 | 2014-10-14 | Carl Zeiss Smt Ag | Polarization-modulating optical element |
| US20130271945A1 (en) | 2004-02-06 | 2013-10-17 | Nikon Corporation | Polarization-modulating element, illumination optical apparatus, exposure apparatus, and exposure method |
| US10007194B2 (en) | 2004-02-06 | 2018-06-26 | Nikon Corporation | Polarization-modulating element, illumination optical apparatus, exposure apparatus, and exposure method |
| US10234770B2 (en) | 2004-02-06 | 2019-03-19 | Nikon Corporation | Polarization-modulating element, illumination optical apparatus, exposure apparatus, and exposure method |
| US10241417B2 (en) | 2004-02-06 | 2019-03-26 | Nikon Corporation | Polarization-modulating element, illumination optical apparatus, exposure apparatus, and exposure method |
| JP2009033191A (ja) * | 2004-05-25 | 2009-02-12 | Asml Holding Nv | 偏光のパタンを供給するための方法 |
| KR20150060992A (ko) * | 2005-01-21 | 2015-06-03 | 가부시키가이샤 니콘 | 조명 광학계 및 노광 장치 |
| US9891539B2 (en) | 2005-05-12 | 2018-02-13 | Nikon Corporation | Projection optical system, exposure apparatus, and exposure method |
| JP2006332197A (ja) * | 2005-05-24 | 2006-12-07 | Nikon Corp | 鏡筒、露光装置及び光学素子の検出方法並びにデバイスの製造方法 |
| US7903234B2 (en) | 2006-11-27 | 2011-03-08 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and computer program product |
| JP2008135742A (ja) * | 2006-11-27 | 2008-06-12 | Asml Netherlands Bv | リソグラフィ装置、デバイス製造方法およびコンピュータプログラム製品 |
| JP2009010346A (ja) * | 2007-05-17 | 2009-01-15 | Asml Netherlands Bv | リソグラフィ装置およびデバイス製造方法 |
| JP2009088358A (ja) * | 2007-10-01 | 2009-04-23 | Canon Inc | 照明光学系、露光装置およびデバイス製造方法 |
| US10101666B2 (en) | 2007-10-12 | 2018-10-16 | Nikon Corporation | Illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9341954B2 (en) | 2007-10-24 | 2016-05-17 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9857599B2 (en) | 2007-10-24 | 2018-01-02 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9678332B2 (en) | 2007-11-06 | 2017-06-13 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
| JP2010091839A (ja) * | 2008-10-09 | 2010-04-22 | V Technology Co Ltd | 近接露光装置 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20050323 |
|
| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20060921 |