JPH1079337A5 - - Google Patents
Info
- Publication number
- JPH1079337A5 JPH1079337A5 JP1996234158A JP23415896A JPH1079337A5 JP H1079337 A5 JPH1079337 A5 JP H1079337A5 JP 1996234158 A JP1996234158 A JP 1996234158A JP 23415896 A JP23415896 A JP 23415896A JP H1079337 A5 JPH1079337 A5 JP H1079337A5
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- projection
- light
- light beam
- projection optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8234158A JPH1079337A (ja) | 1996-09-04 | 1996-09-04 | 投影露光装置 |
| EP19970113696 EP0823662A2 (en) | 1996-08-07 | 1997-08-07 | Projection exposure apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8234158A JPH1079337A (ja) | 1996-09-04 | 1996-09-04 | 投影露光装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1079337A JPH1079337A (ja) | 1998-03-24 |
| JPH1079337A5 true JPH1079337A5 (enExample) | 2004-11-11 |
Family
ID=16966571
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8234158A Withdrawn JPH1079337A (ja) | 1996-08-07 | 1996-09-04 | 投影露光装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1079337A (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001081977A2 (en) * | 2000-04-25 | 2001-11-01 | Silicon Valley Group, Inc. | Optical reduction system with control of illumination polarization |
| TW200412617A (en) * | 2002-12-03 | 2004-07-16 | Nikon Corp | Optical illumination device, method for adjusting optical illumination device, exposure device and exposure method |
| KR101503992B1 (ko) | 2003-04-09 | 2015-03-18 | 가부시키가이샤 니콘 | 노광 방법 및 장치, 그리고 디바이스 제조 방법 |
| TWI609409B (zh) | 2003-10-28 | 2017-12-21 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造方法 |
| TW201809801A (zh) | 2003-11-20 | 2018-03-16 | 日商尼康股份有限公司 | 光學照明裝置、曝光裝置、曝光方法、以及元件製造方法 |
| US20070019179A1 (en) | 2004-01-16 | 2007-01-25 | Damian Fiolka | Polarization-modulating optical element |
| KR101295438B1 (ko) | 2004-01-16 | 2013-08-09 | 칼 짜이스 에스엠티 게엠베하 | 편광변조 광학소자 |
| TWI511182B (zh) | 2004-02-06 | 2015-12-01 | 尼康股份有限公司 | 光學照明裝置、曝光裝置、曝光方法以及元件製造方法 |
| US7324280B2 (en) * | 2004-05-25 | 2008-01-29 | Asml Holding N.V. | Apparatus for providing a pattern of polarization |
| TW200923418A (en) * | 2005-01-21 | 2009-06-01 | Nikon Corp | Exposure device, exposure method, fabricating method of device, exposure system, information collecting device, and measuring device |
| KR101455551B1 (ko) | 2005-05-12 | 2014-10-27 | 가부시키가이샤 니콘 | 투영 광학계, 노광 장치 및 노광 방법 |
| JP2006332197A (ja) * | 2005-05-24 | 2006-12-07 | Nikon Corp | 鏡筒、露光装置及び光学素子の検出方法並びにデバイスの製造方法 |
| US7903234B2 (en) | 2006-11-27 | 2011-03-08 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and computer program product |
| SG143178A1 (en) * | 2006-11-27 | 2008-06-27 | Asml Netherlands Bv | Lithographic apparatus, device manufacturing method and computer program product |
| US20080285000A1 (en) * | 2007-05-17 | 2008-11-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4971932B2 (ja) * | 2007-10-01 | 2012-07-11 | キヤノン株式会社 | 照明光学系、露光装置、デバイス製造方法および偏光制御ユニット |
| JP5267029B2 (ja) | 2007-10-12 | 2013-08-21 | 株式会社ニコン | 照明光学装置、露光装置及びデバイスの製造方法 |
| US8379187B2 (en) | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
| JP5164007B2 (ja) * | 2008-10-09 | 2013-03-13 | 株式会社ブイ・テクノロジー | 近接露光装置 |
-
1996
- 1996-09-04 JP JP8234158A patent/JPH1079337A/ja not_active Withdrawn
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH1079337A5 (enExample) | ||
| US6774984B2 (en) | Optical imaging system with polarizer and a crystalline-quartz plate for use therewith | |
| JP3005203B2 (ja) | 照明装置、露光装置及びデバイス製造方法 | |
| JP3246615B2 (ja) | 照明光学装置、露光装置、及び露光方法 | |
| CN101685267B (zh) | 光束变换元件、光学照明装置、曝光装置以及曝光方法 | |
| KR970049048A (ko) | 반도체소자 제조를 위한 노광 방법 및 그를 이용한 노광장치 | |
| JPH0478002B2 (enExample) | ||
| KR950033690A (ko) | 투영노광장치 | |
| KR960042225A (ko) | 투영노출방법 및 노출장치 | |
| JP3099933B2 (ja) | 露光方法及び露光装置 | |
| TW490597B (en) | Multi-mirror-system for an illumination system, and the illumination system, EUV-projection exposure unit for microlithography, and process for producing microelectronic devices comprising and using the same | |
| EP2645406A3 (en) | Illumination optical apparatus and projection exposure apparatus | |
| JP2000003852A5 (ja) | 投影露光装置、投影露光装置の調整方法、及び投影露光方法 | |
| KR900008299A (ko) | 조명방법 및 그 장치와 투영식 노출방법 및 그 장치 | |
| JPH1064790A5 (enExample) | ||
| KR20000076783A (ko) | 투사노출시스템 및 마이크로리소그라피에서의 노출방법 | |
| EP1024522A4 (en) | ALIGNMENT DEVICE AND EXPOSURE METHOD | |
| US5663785A (en) | Diffraction pupil filler modified illuminator for annular pupil fills | |
| JPH1050585A5 (enExample) | ||
| TW201435515A (zh) | 微影投影曝光設備的光學系統 | |
| JPS5817446A (ja) | 投影露光方法および装置 | |
| JPH0666246B2 (ja) | 照明光学系 | |
| JP3128396B2 (ja) | 露光方法及び露光装置 | |
| JP2503696B2 (ja) | 投影露光装置 | |
| KR20240121877A (ko) | 주기적 패턴의 노광의 균일성을 개선하기 위한 방법 및 장치 |