JPH1072678A - Electroless plating device and plating method - Google Patents
Electroless plating device and plating methodInfo
- Publication number
- JPH1072678A JPH1072678A JP22912796A JP22912796A JPH1072678A JP H1072678 A JPH1072678 A JP H1072678A JP 22912796 A JP22912796 A JP 22912796A JP 22912796 A JP22912796 A JP 22912796A JP H1072678 A JPH1072678 A JP H1072678A
- Authority
- JP
- Japan
- Prior art keywords
- plating
- source
- bubbles
- diameter
- fine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Chemically Coating (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、無電解めっき装置
及びめっき方法に関する。[0001] The present invention relates to an electroless plating apparatus and a plating method.
【0002】[0002]
【従来の技術】プリント配線板に導体パターンを形成す
る場合、硫酸銅やホルムアルデヒド等を用いる無電解め
っきが主に用いられている。無電解めっきにおいては、
その微視的なメッキ反応が被めっき体の表面全体で均一
に起きるようにする必要がある。又、めっき時において
は、めっき反応で発生する水素ガスのめっき皮膜への吸
蔵や、異常析出の原因となる1価の銅の発生防止が必要
となる。更にめっき浴中の不均化反応による微細な銅粒
子の発生によって、浴の安定性が著しく低下する。これ
らめっき皮膜の物性低下や、浴の安定性を向上させる方
法として、被めっき体の表面を含むめっき浴全体を空気
攪拌する方法が主に用いられている。2. Description of the Related Art When forming a conductor pattern on a printed wiring board, electroless plating using copper sulfate, formaldehyde, or the like is mainly used. In electroless plating,
It is necessary to make the microscopic plating reaction occur uniformly on the entire surface of the object to be plated. Further, at the time of plating, it is necessary to occlude hydrogen gas generated by the plating reaction into the plating film and to prevent the generation of monovalent copper which causes abnormal deposition. Further, the generation of fine copper particles due to the disproportionation reaction in the plating bath significantly lowers the stability of the bath. As a method of reducing the physical properties of these plating films and improving the stability of the bath, a method of agitating the entire plating bath including the surface of the body to be plated with air is mainly used.
【0003】めっき浴を攪拌するめっき装置としては、
例えば、特開平3−145793号公報に示されている
ものがある。この装置は、図3に示されているように、
プリント配線板7と電極14とを配置してなるめっき装
置のめっき槽1Aの底部にガスを噴出する気泡発生装置
11と、この気泡発生装置11とプリント配線板7の下
端との間に水平に保持された気泡調整板13を設け、気
泡発生装置の上端との距離を10〜15cmに設定し、
気泡発生装置の気泡噴出口の直径を3mmとし、ガスポ
ンプ12からエアを送り気泡を発生させるようにしたも
のである。気泡調整板13の孔を通過した気泡は、その
孔を通過する過程においてぶつかり合って合成され、通
過した気泡の大きさは均一化され、直径がほぼ8〜20
mmに制御される。[0003] As a plating apparatus for stirring a plating bath,
For example, there is one disclosed in JP-A-3-145793. This device, as shown in FIG.
A bubble generator 11 for blowing gas to the bottom of a plating tank 1A of a plating apparatus in which the printed wiring board 7 and the electrodes 14 are arranged, and a horizontal space between the bubble generator 11 and the lower end of the printed wiring board 7 Provide the held bubble adjustment plate 13, set the distance to the upper end of the bubble generator to 10 to 15 cm,
The diameter of the bubble ejection port of the bubble generator is 3 mm, and air is sent from the gas pump 12 to generate bubbles. The bubbles passing through the holes of the bubble adjusting plate 13 collide and combine in the process of passing through the holes.
mm.
【0004】[0004]
【発明が解決しようとする課題】この従来の気泡調整板
を用いるめっき装置では、大きな気泡のみを用いている
ため、気泡の分散性が悪くなり、空気攪拌が不十分なめ
っき槽の底部では十分にめっき液を安定化させる事が出
来ず、銅の槽内析出を発生させるという欠点がある。
又、被めっき体間で十分な空気攪拌が行なわれない場合
等では、例えばU.S.Pat,4,152,467
(1979)に記載されているように、めっき液中の溶
存酸素濃度が2ppm以下の低い領域では被めっき面に
コブ状の異常析出が発生する。逆に空気が過剰に供給さ
れ溶存酸素濃度が4ppm以上の高い領域では、無電解
めっきの表面が不導態化し、めっき皮膜の物性低下を発
生させるという欠点がある。In the conventional plating apparatus using the bubble adjusting plate, only large bubbles are used, so that the dispersibility of the bubbles is deteriorated and the bottom of the plating tank with insufficient air agitation is insufficient. However, there is a disadvantage that the plating solution cannot be stabilized and copper is deposited in the tank.
Further, when sufficient air agitation is not performed between the objects to be plated, for example, U.S. Pat. S. Pat, 4,152,467
As described in (1979), in the region where the dissolved oxygen concentration in the plating solution is as low as 2 ppm or less, abnormal bump-like precipitation occurs on the surface to be plated. On the other hand, in a region where the air is excessively supplied and the dissolved oxygen concentration is as high as 4 ppm or more, the surface of the electroless plating is rendered inconducting, and the physical properties of the plating film are deteriorated.
【0005】本発明の目的は、上記欠点を除去し、めっ
き液を安定化させると共に、コブやむらの無い品質の良
いめっきを施することの出来る無電解めっき装置及びめ
っき方法を提供することにある。An object of the present invention is to provide an electroless plating apparatus and a plating method capable of removing the above-mentioned drawbacks, stabilizing a plating solution, and performing high-quality plating without bumps and unevenness. is there.
【0006】[0006]
【課題を解決するための手段】第1の発明の無電解めっ
き装置は、めっき槽の底部全体に設けられ直径5〜10
0μmの微細気泡を発生させる微細気泡発生源と、この
微細気泡発生源の上部に所定の距離を隔てて設けられ直
径1〜3cmの大気泡を発生させる大気泡発生源とを含
むことを特徴とするものである。The electroless plating apparatus according to the first invention is provided on the entire bottom of the plating tank and has a diameter of 5 to 10 mm.
A microbubble source that generates microbubbles of 0 μm, and a large bubble generator that is provided at a predetermined distance above the microbubble sources and that generates large bubbles having a diameter of 1 to 3 cm. Is what you do.
【0007】第2の発明のめっき方法は、めっき槽の底
部全体に直径5〜100μmの微細気泡を発生させる微
細気泡発生源と、この微細気泡発生源の上部に所定の距
離を隔てて直径1〜3cmの大気泡を発生させる大気泡
発生源とを設け、めっき液を攪拌しながら無電解めっき
を行うめっき方法において、前記微細気泡の通気量をめ
っき液1lに対し1〜2l/minとする事を特徴とす
るものである。According to a second aspect of the present invention, there is provided a plating method for generating a fine bubble having a diameter of 5 to 100 μm on the entire bottom of a plating tank, and a fine bubble having a diameter of 1 mm above the fine bubble generating source at a predetermined distance. In a plating method in which a large bubble generating source for generating large bubbles of about 3 cm is provided, and the plating solution is subjected to electroless plating while stirring, the air flow rate of the fine bubbles is set at 1 to 2 l / min per liter of the plating solution. It is characterized by things.
【0008】めっき反応は微視的に行われる為、空気攪
拌も微細気泡で行う必要があり、気泡の大きさは100
μm以下が適当である。100μm以上では銅の析出に
悪影響がありめっきにむらを生じる。5μm未満におい
ては、5μm以下の気泡を発生させる為の微細気泡発生
源を製作するのが困難である。しかし、微細気泡のみで
は浴中での気泡の分散性が不十分であり、大きな気泡で
強制攪拌する必要がある。大気泡のサイズは1〜3cm
が適当であり、1cm以下では攪拌が不十分となる。一
方3cm以上では微細気泡が吸収されると共に、攪拌が
強くなりすぎる場合がある。[0008] Since the plating reaction is performed microscopically, it is necessary to stir the air with fine bubbles, and the size of the bubbles is 100
μm or less is appropriate. If it is 100 μm or more, the deposition of copper is adversely affected and plating becomes uneven. If it is less than 5 μm, it is difficult to produce a fine bubble generation source for generating bubbles of 5 μm or less. However, the dispersibility of the bubbles in the bath is insufficient with only the fine bubbles, and it is necessary to perform forced stirring with large bubbles. Large bubble size is 1-3cm
Is appropriate, and when it is 1 cm or less, stirring becomes insufficient. On the other hand, if it is 3 cm or more, fine bubbles may be absorbed and stirring may be too strong.
【0009】微細気泡の通気量に対する溶存酸素濃度と
の関係を検討した結果を図2に示す。図2より、溶存酸
素濃度を2〜4ppmにする為の通気量は、めっき液1
lに対して0.7〜2.5l/minとなるが、好まし
くは1〜2l/minが適当である。FIG. 2 shows the results of an examination of the relationship between the dissolved oxygen concentration and the amount of air flow of the fine bubbles. From FIG. 2, it is found that the flow rate for adjusting the dissolved oxygen concentration to 2 to 4 ppm is the plating solution 1
It is 0.7 to 2.5 l / min with respect to l, but preferably 1 to 2 l / min.
【0010】[0010]
【発明の実施の形態】次に、本発明について図面を参照
して説明する。図1は本発明の実施の形態を説明する為
の無電解めっき装置の断面図である。Next, the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional view of an electroless plating apparatus for explaining an embodiment of the present invention.
【0011】図1を参照すると、本実施形態の無電解め
っき装置は、めっき槽1の底部全体に設けられ、直径5
〜100μmの微細気泡を発生させる為のフッ素樹脂製
多孔質ボードからなる微細気泡発生源2と、この微細気
泡発生源2の上部に約10cmの距離を隔てて設けられ
長径1〜3cmの大気泡を発生させる気孔3A(直径
0.5mm)を配管の下部に有する大気泡発生源3と、
この大気泡発生源3と微細気泡発生源2との間に設けら
れめっき液5を加熱する為の蒸気配管4とから主に構成
される。尚図1に於いて、6はオーバーフローしためっ
き液の循環用配管、7はプリント配線板、8A,8Bは
気泡発生用配管である。Referring to FIG. 1, the electroless plating apparatus of this embodiment is provided on the entire bottom of a plating tank 1 and has a diameter of 5 mm.
A microbubble source 2 made of a porous board made of a fluororesin for generating microbubbles of about 100 μm, and a large bubble having a long diameter of 1 to 3 cm provided at a distance of about 10 cm above the microbubble source 2 A large bubble generation source 3 having pores 3A (0.5 mm in diameter) at the bottom of the pipe,
It mainly comprises a steam pipe 4 for heating the plating solution 5 provided between the large bubble generation source 3 and the fine bubble generation source 2. In FIG. 1, 6 is a pipe for circulating the plating solution which has overflowed, 7 is a printed wiring board, and 8A and 8B are pipes for generating bubbles.
【0012】次に図1を参照して、プリント配線板への
無電解めっき方法について説明する。浴容量180lの
めっき槽1に、硫酸銅,NaOH,ホルムアルデヒドを
主成分とするPH:12〜12.5の無電解めっき液5
を満し、浴温:60〜70℃でプリント配線板7に銅め
っきを施した。この時めっき槽1の底部の微細気泡発生
源2から100μm以下の微細気泡を、又大気泡発生源
3から直径1〜3cmの大気泡をそれぞれ発生させ、め
っき液5を強制攪拌すると共に、気泡の分散性及び均一
性を向上させ溶存酸素濃度を2〜4ppmに維持するよ
うにした。総通気量を270l/minとし、微細気泡
の通気量を180l/min,大気泡の通気量を90l
/minとした。溶存酸素量を2〜4ppmに保っ為の
微細気泡の通気量をめっき液1lに対し1〜2l/mi
nとした場合、微細気泡と大気泡との好ましい割合は約
2:1であった。Next, a method of electroless plating a printed wiring board will be described with reference to FIG. An electroless plating solution 5 containing PH: 12 to 12.5 containing copper sulfate, NaOH, and formaldehyde as main components is placed in a plating tank 1 having a bath capacity of 180 l.
The printed wiring board 7 was plated with copper at a bath temperature of 60 to 70 ° C. At this time, fine bubbles of 100 μm or less are generated from the fine bubble generating source 2 at the bottom of the plating tank 1 and large bubbles having a diameter of 1 to 3 cm are generated from the large bubble generating source 3, respectively. Was improved so that the dissolved oxygen concentration was maintained at 2 to 4 ppm. The total air flow is 270 l / min, the air flow of fine bubbles is 180 l / min, and the air flow of large bubbles is 90 l.
/ Min. In order to maintain the dissolved oxygen amount at 2 to 4 ppm, the air flow rate of fine bubbles is 1 to 2 l / mi with respect to 1 l of plating solution.
When n was set, the preferable ratio of fine bubbles to large bubbles was about 2: 1.
【0013】[0013]
【発明の効果】以上説明したように本発明は、めっき槽
の底部に直径5〜100μmの微細気泡を発生させる微
細気泡発生源と、長径1〜3cmの大気泡を発生させる
大気泡発生源とを設け、微細気泡の通気量を無電解めっ
き液1lに対し1〜2l/minとし、大気泡と共にめ
っき液を攪拌しながらめっきすることにより、コブやむ
らのない品質の向上しためっきを施すことが可能となっ
た。As described above, the present invention provides a fine bubble generating source for generating fine bubbles having a diameter of 5 to 100 μm at the bottom of a plating tank and a large bubble generating source for generating large bubbles having a long diameter of 1 to 3 cm. The plating rate is set to 1 to 2 l / min with respect to 1 liter of the electroless plating solution, and plating is performed while stirring the plating solution together with the large bubbles, thereby performing plating with improved quality without bumps and unevenness. Became possible.
【図1】本発明の実施の形態を説明する為の無電解めっ
き装置の断面図。FIG. 1 is a sectional view of an electroless plating apparatus for explaining an embodiment of the present invention.
【図2】エアバブリンク量と溶存酸素濃度との関係を示
す図。FIG. 2 is a diagram showing the relationship between the amount of air bubbling and the concentration of dissolved oxygen.
【図3】従来の気泡発生装置を有するめっき装置の断面
図。FIG. 3 is a sectional view of a plating apparatus having a conventional bubble generator.
1.1A めっき槽 2 微細気泡発生源 3 大気泡発生源 3A 気孔 4 蒸気配管 5,5A めっき液 6 めっき液循環用配管 7 プリント配線板 8A,8B 気泡発生用配管 11 気泡発生装置 12 ガスポンプ 13 気泡調整板 14 電極 1.1A Plating tank 2 Fine air bubble generation source 3 Large air bubble generation source 3A Pores 4 Steam piping 5,5A Plating solution 6 Plating solution circulation piping 7 Printed wiring board 8A, 8B Bubble generation piping 11 Bubble generator 12 Gas pump 13 Bubbles Adjustment plate 14 electrodes
Claims (2)
100μmの微細気泡を発生させる微細気泡発生源と、
この微細気泡発生源の上部に所定の距離を隔てて設けら
れ直径1〜3cmの大気泡を発生させる大気泡発生源と
を含むことを特徴とする無電解めっき装置。Claims: 1. A plating tank having a diameter of 5 to be provided over the entire bottom of a plating tank.
A microbubble source for generating microbubbles of 100 μm;
An electroless plating apparatus comprising: a large bubble generation source provided at a predetermined distance above the fine bubble generation source and configured to generate large bubbles having a diameter of 1 to 3 cm.
mの微細気泡を発生させる微細気泡発生源と、この微細
気泡発生源の上部に所定の距離を隔てて直径1〜3cm
の大気泡を発生させる大気泡発生源とを設け、めっき液
を攪拌しながら無電解めっきを行うめっき方法におい
て、前記微細気泡の通気量をめっき液1lに対し1〜2
l/minとする事を特徴とするめっき方法。2. The entire bottom of the plating tank has a diameter of 5 to 100 μm.
m, and a diameter of 1 to 3 cm at a predetermined distance above the fine bubble source.
A large-bubble generating source for generating large bubbles, and performing electroless plating while stirring the plating solution, wherein the air flow rate of the fine bubbles is 1 to 2 per liter of the plating solution.
1 / min.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8229127A JP2978780B2 (en) | 1996-08-29 | 1996-08-29 | Electroless plating apparatus and plating method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8229127A JP2978780B2 (en) | 1996-08-29 | 1996-08-29 | Electroless plating apparatus and plating method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH1072678A true JPH1072678A (en) | 1998-03-17 |
JP2978780B2 JP2978780B2 (en) | 1999-11-15 |
Family
ID=16887181
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8229127A Expired - Fee Related JP2978780B2 (en) | 1996-08-29 | 1996-08-29 | Electroless plating apparatus and plating method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2978780B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007177257A (en) * | 2005-12-26 | 2007-07-12 | Seiko Epson Corp | Plating method, plating apparatus, and method for manufacturing silicon device |
CN106661734A (en) * | 2014-09-17 | 2017-05-10 | 上村工业株式会社 | Method for manufacturing wiring substrate and wiring substrate manufactured thereby |
-
1996
- 1996-08-29 JP JP8229127A patent/JP2978780B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007177257A (en) * | 2005-12-26 | 2007-07-12 | Seiko Epson Corp | Plating method, plating apparatus, and method for manufacturing silicon device |
CN106661734A (en) * | 2014-09-17 | 2017-05-10 | 上村工业株式会社 | Method for manufacturing wiring substrate and wiring substrate manufactured thereby |
KR20170056535A (en) * | 2014-09-17 | 2017-05-23 | 우에무라 고교 가부시키가이샤 | Method for manufacturing wiring substrate and wiring substrate manufactured thereby |
Also Published As
Publication number | Publication date |
---|---|
JP2978780B2 (en) | 1999-11-15 |
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