JPH1056657A5 - - Google Patents

Info

Publication number
JPH1056657A5
JPH1056657A5 JP1997101748A JP10174897A JPH1056657A5 JP H1056657 A5 JPH1056657 A5 JP H1056657A5 JP 1997101748 A JP1997101748 A JP 1997101748A JP 10174897 A JP10174897 A JP 10174897A JP H1056657 A5 JPH1056657 A5 JP H1056657A5
Authority
JP
Japan
Prior art keywords
circuit
measuring
signal
signal processing
processing circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1997101748A
Other languages
English (en)
Japanese (ja)
Other versions
JPH1056657A (ja
Filing date
Publication date
Priority claimed from DE19615745A external-priority patent/DE19615745A1/de
Application filed filed Critical
Publication of JPH1056657A publication Critical patent/JPH1056657A/ja
Publication of JPH1056657A5 publication Critical patent/JPH1056657A5/ja
Pending legal-status Critical Current

Links

JP9101748A 1996-04-20 1997-04-18 測定回路 Pending JPH1056657A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19615745:5 1996-04-20
DE19615745A DE19615745A1 (de) 1996-04-20 1996-04-20 Meßschaltung

Publications (2)

Publication Number Publication Date
JPH1056657A JPH1056657A (ja) 1998-02-24
JPH1056657A5 true JPH1056657A5 (cg-RX-API-DMAC10.html) 2005-03-17

Family

ID=7791914

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9101748A Pending JPH1056657A (ja) 1996-04-20 1997-04-18 測定回路

Country Status (4)

Country Link
US (1) US6133949A (cg-RX-API-DMAC10.html)
EP (1) EP0802422A3 (cg-RX-API-DMAC10.html)
JP (1) JPH1056657A (cg-RX-API-DMAC10.html)
DE (1) DE19615745A1 (cg-RX-API-DMAC10.html)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4802626A (en) * 1986-12-22 1989-02-07 Hunter's Specialties, Inc. Molded scent impregnated devices
US6870375B2 (en) * 2002-07-01 2005-03-22 Texas Instruments Incorporated System and method for measuring a capacitance associated with an integrated circuit
DE10258299B4 (de) 2002-12-13 2019-08-08 Volkswagen Ag Karosseriefronthaube für ein Kraftfahrzeug
CN102207522B (zh) * 2011-04-01 2013-01-02 广州润芯信息技术有限公司 一种基于频率测量的rc常数测量方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1312239A (en) * 1969-07-25 1973-04-04 Mullard Ltd Electrical circuit arrangements for converting a variable rate of pulse transmission into a related electrical output quantity
US3614634A (en) * 1969-09-02 1971-10-19 Texas Instruments Inc Frequency conversion system
US3652872A (en) * 1970-04-02 1972-03-28 Us Air Force Video bandwidth analyzer
US3697781A (en) * 1970-11-12 1972-10-10 Johnson Service Co Frequency to voltage converter
US3839673A (en) * 1971-06-07 1974-10-01 Honeywell Inf Systems Precise frequency measuring analog circuit
US3859512A (en) * 1973-04-26 1975-01-07 Karl R Ritzinger Rate meter
US3813599A (en) * 1973-06-04 1974-05-28 Us Navy Bandwidth measurement system
US4128808A (en) * 1976-11-04 1978-12-05 Sencore, Inc. Channel frequency analyser
US4090133A (en) * 1977-01-06 1978-05-16 Bell Telephone Laboratories, Incorporated Digital time interval sensor using a free running counter and a cycle counter with only the latter being reset at each event
GB1604678A (en) * 1978-05-30 1981-12-16 Indep Broadcasting Authority Television systems
US4217524A (en) * 1978-05-11 1980-08-12 Bell Telephone Laboratories, Incorporated Method and structure for generating representations of repetitive electrical waveforms
US4531193A (en) * 1981-07-30 1985-07-23 Fuji Electric Company, Ltd. Measurement apparatus
JPS61130881A (ja) * 1984-11-30 1986-06-18 Nec Corp 時間差測定回路
US4720670A (en) * 1986-12-23 1988-01-19 International Business Machines Corporation On chip performance predictor circuit
US4786861A (en) * 1987-09-01 1988-11-22 Sundstrand Data Control, Inc. Frequency counting apparatus and method
WO1991019318A1 (fr) * 1990-06-05 1991-12-12 Seiko Epson Corporation Dispositif semiconducteur muni d'un circuit logique pour mesurer le retard
US5181191A (en) * 1991-11-27 1993-01-19 Hughes Aircraft Company Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations
TW255052B (cg-RX-API-DMAC10.html) * 1992-11-03 1995-08-21 Thomson Consumer Electronics
US5574499A (en) * 1993-05-10 1996-11-12 Nec Corporation Integrated circuit for testing a plurality of 1H memories
GB2281421B (en) * 1993-08-23 1998-04-01 Advanced Risc Mach Ltd Integrated circuit

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