|
US6298149B1
(en)
*
|
1996-03-21 |
2001-10-02 |
Cognex Corporation |
Semiconductor device image inspection with contrast enhancement
|
|
US6154561A
(en)
*
|
1997-04-07 |
2000-11-28 |
Photon Dynamics, Inc. |
Method and apparatus for detecting Mura defects
|
|
KR19990053079A
(ko)
*
|
1997-12-23 |
1999-07-15 |
윤종용 |
인식 마크가 형성된 반도체 웨이퍼 및 그 인식 마크를 이용한 웨이퍼 절삭 방법
|
|
US6381374B1
(en)
*
|
1998-10-30 |
2002-04-30 |
General Electric Company |
Histogram analysis method for defective pixel identification
|
|
JP3825935B2
(ja)
*
|
1999-04-08 |
2006-09-27 |
キヤノン株式会社 |
画像処理装置及び画像処理方法及び記録媒体及び画像処理システム
|
|
US6477275B1
(en)
*
|
1999-06-16 |
2002-11-05 |
Coreco Imaging, Inc. |
Systems and methods for locating a pattern in an image
|
|
US6720989B2
(en)
*
|
2000-04-19 |
2004-04-13 |
K-G Devices Corp. |
System and method for automatically inspecting an array of periodic elements
|
|
US6694059B1
(en)
*
|
2000-05-19 |
2004-02-17 |
International Business Machines Corporation |
Robustness enhancement and evaluation of image information extraction
|
|
GB2368635B
(en)
*
|
2000-11-01 |
2004-12-22 |
Nokia Mobile Phones Ltd |
Testing an image display device
|
|
US6748110B1
(en)
*
|
2000-11-09 |
2004-06-08 |
Cognex Technology And Investment |
Object and object feature detector system and method
|
|
US6928192B2
(en)
*
|
2001-04-19 |
2005-08-09 |
Koninklijke Philips Electronics N.V. |
User interface for interactive removal of defects in an image sequence
|
|
US6987875B1
(en)
|
2001-05-22 |
2006-01-17 |
Cognex Technology And Investment Corporation |
Probe mark inspection method and apparatus
|
|
JP2003004657A
(ja)
*
|
2001-06-25 |
2003-01-08 |
Hitachi Ltd |
観察作業支援システム
|
|
JP2004534949A
(ja)
*
|
2001-07-05 |
2004-11-18 |
フォトン・ダイナミクス・インコーポレーテッド |
モアレ抑制方法および装置
|
|
JP3431075B2
(ja)
*
|
2001-08-27 |
2003-07-28 |
科学技術振興事業団 |
液晶ディスプレイパネルムラの分類処理方法、その装置及びプログラム
|
|
JP2003152970A
(ja)
*
|
2001-08-28 |
2003-05-23 |
Fuji Photo Film Co Ltd |
画像読取装置
|
|
JP3879645B2
(ja)
*
|
2002-09-30 |
2007-02-14 |
株式会社日立製作所 |
液晶表示素子の製造方法および液晶表示素子の製造システム
|
|
US7444034B1
(en)
|
2002-11-06 |
2008-10-28 |
Digivision, Inc. |
Systems and methods for image enhancement in multiple dimensions
|
|
CA2505260A1
(en)
*
|
2002-11-06 |
2004-05-27 |
Digivision, Inc. |
Systems and methods for image enhancement in multiple dimensions
|
|
KR100471084B1
(ko)
*
|
2002-12-16 |
2005-03-10 |
삼성전자주식회사 |
영상처리시스템 및 영상처리방법
|
|
US7602962B2
(en)
*
|
2003-02-25 |
2009-10-13 |
Hitachi High-Technologies Corporation |
Method of classifying defects using multiple inspection machines
|
|
US7983446B2
(en)
*
|
2003-07-18 |
2011-07-19 |
Lockheed Martin Corporation |
Method and apparatus for automatic object identification
|
|
US8184923B2
(en)
*
|
2004-04-19 |
2012-05-22 |
Semiconductor Energy Laboratory Co., Ltd. |
Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program
|
|
JP4480002B2
(ja)
*
|
2004-05-28 |
2010-06-16 |
Ｈｏｙａ株式会社 |
ムラ欠陥検査方法及び装置、並びにフォトマスクの製造方法
|
|
JP4480001B2
(ja)
*
|
2004-05-28 |
2010-06-16 |
Ｈｏｙａ株式会社 |
ムラ欠陥検査マスク、ムラ欠陥検査装置及び方法、並びにフォトマスクの製造方法
|
|
KR20060044032A
(ko)
*
|
2004-11-11 |
2006-05-16 |
삼성전자주식회사 |
표시패널용 검사 장치 및 이의 검사 방법
|
|
CN100476444C
(zh)
*
|
2004-11-22 |
2009-04-08 |
台湾薄膜电晶体液晶显示器产业协会 |
利用视觉模型检测平面显示器的方法与装置
|
|
KR101076478B1
(ko)
|
2004-11-25 |
2011-10-25 |
엘아이지에이디피 주식회사 |
스트레칭 기법을 활용한 평판 디스플레이 패널의 화상결함 검사 방법 및 기록매체
|
|
US7911498B2
(en)
*
|
2005-12-12 |
2011-03-22 |
Novatek Microelectronics Corp. |
Compensation device for non-uniform regions in flat panel display and method thereof
|
|
CN100565630C
(zh)
*
|
2006-01-04 |
2009-12-02 |
台湾薄膜电晶体液晶显示器产业协会 |
显示器多角度测量系统与方法
|
|
KR101182324B1
(ko)
*
|
2006-07-28 |
2012-09-20 |
엘지디스플레이 주식회사 |
평판표시장치의 화질제어 방법
|
|
US7800661B2
(en)
*
|
2006-12-22 |
2010-09-21 |
Qualcomm Incorporated |
Programmable pattern matching device
|
|
US8026927B2
(en)
|
2007-03-29 |
2011-09-27 |
Sharp Laboratories Of America, Inc. |
Reduction of mura effects
|
|
KR101702887B1
(ko)
*
|
2007-04-18 |
2017-02-06 |
마이크로닉 마이데이타 에이비 |
무라 검출 및 계측을 위한 방법 및 장치
|
|
TWI366181B
(en)
*
|
2007-06-12 |
2012-06-11 |
Au Optronics Corp |
Method and apparatus for image enlargement and enhancement
|
|
JP2009036582A
(ja)
*
|
2007-07-31 |
2009-02-19 |
Toshiba Corp |
平面表示パネルの検査方法、検査装置及び検査プログラム
|
|
US8049695B2
(en)
*
|
2007-10-15 |
2011-11-01 |
Sharp Laboratories Of America, Inc. |
Correction of visible mura distortions in displays by use of flexible system for memory resources and mura characteristics
|
|
KR20100092014A
(ko)
*
|
2007-11-12 |
2010-08-19 |
마이크로닉 레이저 시스템즈 에이비 |
패턴 에러들을 검출하기 위한 방법들 및 장치들
|
|
JP5250871B2
(ja)
*
|
2008-12-24 |
2013-07-31 |
インターナショナル・ビジネス・マシーンズ・コーポレーション |
ムラ評価装置、ムラ評価方法、ディスプレイ検査装置、およびプログラム
|
|
CN101840078B
(zh)
*
|
2009-03-20 |
2016-02-10 |
北京京东方光电科技有限公司 |
水波纹级别测试方法
|
|
US8582182B2
(en)
*
|
2009-05-20 |
2013-11-12 |
Dacuda Ag |
Automatic sizing of images acquired by a handheld scanner
|
|
US9300834B2
(en)
*
|
2009-05-20 |
2016-03-29 |
Dacuda Ag |
Image processing for handheld scanner
|
|
US20110012908A1
(en)
*
|
2009-07-20 |
2011-01-20 |
Sharp Laboratories Of America, Inc. |
System for compensation of differential aging mura of displays
|
|
US9035673B2
(en)
*
|
2010-01-25 |
2015-05-19 |
Palo Alto Research Center Incorporated |
Method of in-process intralayer yield detection, interlayer shunt detection and correction
|
|
US8891866B2
(en)
|
2011-08-31 |
2014-11-18 |
Sony Corporation |
Image processing apparatus, image processing method, and program
|
|
US8780097B2
(en)
*
|
2011-10-20 |
2014-07-15 |
Sharp Laboratories Of America, Inc. |
Newton ring mura detection system
|
|
US8867817B1
(en)
*
|
2012-10-29 |
2014-10-21 |
Amazon Technologies, Inc. |
Display analysis using scanned images
|
|
CN103018265B
(zh)
*
|
2012-11-28 |
2015-05-20 |
上海华力微电子有限公司 |
半导体缺陷定位的方法
|
|
KR101966075B1
(ko)
*
|
2012-12-06 |
2019-04-05 |
엘지디스플레이 주식회사 |
표시장치의 얼룩 검출 장치 및 방법
|
|
KR101958634B1
(ko)
*
|
2012-12-13 |
2019-03-15 |
엘지디스플레이 주식회사 |
디스플레이 장치의 무라 검출 장치 및 방법
|
|
CN103106859B
(zh)
*
|
2013-02-28 |
2015-11-25 |
北京星河康帝思科技开发股份有限公司 |
显示屏的检测方法和装置
|
|
WO2014140047A2
(en)
|
2013-03-12 |
2014-09-18 |
Micronic Mydata AB |
Method and device for writing photomasks with reduced mura errors
|
|
EP2972589B1
(en)
|
2013-03-12 |
2017-05-03 |
Micronic Mydata AB |
Mechanically produced alignment fiducial method and alignment system
|
|
US9525802B2
(en)
|
2013-07-24 |
2016-12-20 |
Georgetown University |
Enhancing the legibility of images using monochromatic light sources
|
|
US9269126B2
(en)
*
|
2013-07-24 |
2016-02-23 |
Georgetown University |
System and method for enhancing the legibility of images
|
|
WO2015028587A2
(en)
|
2013-08-31 |
2015-03-05 |
Dacuda Ag |
User feedback for real-time checking and improving quality of scanned image
|
|
CN103558229B
(zh)
*
|
2013-11-25 |
2016-03-30 |
苏州富鑫林光电科技有限公司 |
一种tft-lcd制程的mura视觉自动检测方法及装置
|
|
EP3089102B1
(en)
|
2013-12-03 |
2019-02-20 |
ML Netherlands C.V. |
User feedback for real-time checking and improving quality of scanned image
|
|
US10410321B2
(en)
|
2014-01-07 |
2019-09-10 |
MN Netherlands C.V. |
Dynamic updating of a composite image
|
|
US10708491B2
(en)
|
2014-01-07 |
2020-07-07 |
Ml Netherlands C.V. |
Adaptive camera control for reducing motion blur during real-time image capture
|
|
US10484561B2
(en)
|
2014-05-12 |
2019-11-19 |
Ml Netherlands C.V. |
Method and apparatus for scanning and printing a 3D object
|
|
CN104570422B
(zh)
*
|
2014-12-31 |
2017-10-13 |
深圳市华星光电技术有限公司 |
一种液晶显示面板的品质的监控方法
|
|
FR3035251A1
(fr)
*
|
2015-04-17 |
2016-10-21 |
Stmicroelectronics (Grenoble 2) Sas |
Procede et dispositif de generation d'une representation multi-resolutions d'une image et application a la detection d'objet
|
|
CN104765173B
(zh)
*
|
2015-04-29 |
2018-01-16 |
京东方科技集团股份有限公司 |
一种检测装置及其检测方法
|
|
CN104914133B
(zh)
*
|
2015-06-19 |
2017-12-22 |
合肥京东方光电科技有限公司 |
摩擦缺陷检测装置
|
|
CN105549240B
(zh)
*
|
2016-03-11 |
2018-09-21 |
京东方科技集团股份有限公司 |
液晶显示器件的水波纹等级的测量方法和装置
|
|
CN106650770B
(zh)
*
|
2016-09-29 |
2019-12-17 |
南京大学 |
一种基于样本学习和人眼视觉特性的mura缺陷检测方法
|
|
CN110088828A
(zh)
*
|
2016-10-26 |
2019-08-02 |
堺显示器制品株式会社 |
校正系统
|
|
CN107678192B
(zh)
*
|
2017-07-16 |
2020-09-25 |
中科院成都信息技术股份有限公司 |
一种基于机器视觉的Mura缺陷检测方法
|
|
US10955239B2
(en)
*
|
2017-07-17 |
2021-03-23 |
Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
Positioning device and positioning method, color film coating machine
|
|
US10215714B1
(en)
|
2017-08-16 |
2019-02-26 |
Siemens Energy, Inc. |
Method and system for detecting defects on surface of object
|
|
US10192301B1
(en)
|
2017-08-16 |
2019-01-29 |
Siemens Energy, Inc. |
Method and system for detecting line defects on surface of object
|
|
CN107731200B
(zh)
*
|
2017-10-31 |
2019-09-17 |
武汉华星光电技术有限公司 |
改善显示画面中鬼影的方法和系统
|
|
US10643576B2
(en)
|
2017-12-15 |
2020-05-05 |
Samsung Display Co., Ltd. |
System and method for white spot Mura detection with improved preprocessing
|
|
US10681344B2
(en)
|
2017-12-15 |
2020-06-09 |
Samsung Display Co., Ltd. |
System and method for mura detection on a display
|
|
US10755133B2
(en)
*
|
2018-02-22 |
2020-08-25 |
Samsung Display Co., Ltd. |
System and method for line Mura detection with preprocessing
|
|
US10867382B2
(en)
*
|
2018-05-24 |
2020-12-15 |
Keysight Technologies, Inc. |
Detecting mura defects in master panel of flat panel displays during fabrication
|
|
CN108898594A
(zh)
*
|
2018-06-27 |
2018-11-27 |
湖北工业大学 |
一种均质面板缺陷的检测方法
|
|
JP7087792B2
(ja)
*
|
2018-07-31 |
2022-06-21 |
株式会社リコー |
画像データ生成装置、画像データ生成方法およびプログラム
|
|
CN109358438B
(zh)
*
|
2018-10-30 |
2021-03-26 |
京东方科技集团股份有限公司 |
云纹评价方法、装置和系统
|
|
CN110246449B
(zh)
*
|
2019-06-18 |
2020-11-24 |
京东方科技集团股份有限公司 |
显示面板的调节方法及装置
|
|
CN110225336B
(zh)
*
|
2019-06-21 |
2022-08-26 |
京东方科技集团股份有限公司 |
评估图像采集精度的方法及装置、电子设备、可读介质
|
|
CN111340752B
(zh)
*
|
2019-12-04 |
2024-08-06 |
京东方科技集团股份有限公司 |
屏幕的检测方法、装置、电子设备及计算机可读存储介质
|
|
CN110728681B
(zh)
*
|
2019-12-19 |
2020-05-22 |
武汉精立电子技术有限公司 |
一种Mura缺陷检测方法及装置
|
|
WO2021211600A1
(en)
|
2020-04-14 |
2021-10-21 |
General Electric Company |
Green-emitting phosphors and devices thereof
|
|
KR20220165280A
(ko)
|
2020-04-14 |
2022-12-14 |
제네럴 일렉트릭 컴퍼니 |
협대역 발광 형광체 물질을 함유하는 잉크 조성물 및 필름
|
|
US12100181B2
(en)
|
2020-05-11 |
2024-09-24 |
Magic Leap, Inc. |
Computationally efficient method for computing a composite representation of a 3D environment
|
|
CN111652865B
(zh)
*
|
2020-05-29 |
2022-04-08 |
惠州市华星光电技术有限公司 |
Mura检测方法、装置及可读存储介质
|
|
CN111882529B
(zh)
*
|
2020-07-15 |
2024-06-07 |
苏州佳智彩光电科技有限公司 |
显示屏Mura缺陷检测方法及装置
|
|
CN114022403A
(zh)
*
|
2020-07-16 |
2022-02-08 |
京东方科技集团股份有限公司 |
检测显示面板不良的方法及装置
|
|
KR20230059803A
(ko)
|
2020-09-01 |
2023-05-03 |
제네럴 일렉트릭 컴퍼니 |
야간 투시 장비와 호환성인 소자
|
|
WO2022221385A1
(en)
|
2021-04-13 |
2022-10-20 |
General Electric Company |
Uranium-based phosphors and compositions for displays and lighting applications
|
|
KR102825656B1
(ko)
*
|
2021-12-14 |
2025-06-26 |
엘지디스플레이 주식회사 |
표시결함 검출 시스템 및 그 검출 방법
|
|
CN119323745B
(zh)
*
|
2024-12-19 |
2025-04-18 |
杭州源现科技有限公司 |
一种xr眼镜的检测装置及方法
|