JPH10270837A - Cream solder printing method - Google Patents
Cream solder printing methodInfo
- Publication number
- JPH10270837A JPH10270837A JP9072976A JP7297697A JPH10270837A JP H10270837 A JPH10270837 A JP H10270837A JP 9072976 A JP9072976 A JP 9072976A JP 7297697 A JP7297697 A JP 7297697A JP H10270837 A JPH10270837 A JP H10270837A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- cream solder
- mask
- substrate
- cream
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1216—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by screen printing or stencil printing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3452—Solder masks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3485—Applying solder paste, slurry or powder
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明はクリーム半田印刷方
法に関する。[0001] The present invention relates to a cream solder printing method.
【0002】[0002]
【従来の技術】プリント回路基板(以下、単に基板とい
う)に部品を実装する場合、半田マスクを用いて、予め
クリーム半田を基板に印刷(あるいは塗装)しておくこ
とが行われる。2. Description of the Related Art When components are mounted on a printed circuit board (hereinafter, simply referred to as a board), cream solder is printed (or painted) on the board in advance using a solder mask.
【0003】(第1の従来技術)クリーム半田印刷方法
の第1の従来技術を、図7(A)(B)を参照して説明
する。(First Prior Art) A first prior art of the cream solder printing method will be described with reference to FIGS. 7A and 7B.
【0004】図7(A)に例示する基板100では、半
田付けが必要なランド導体箔(通常は銅箔なので、以下
ランド銅箔という)2、3を除き、絶縁板4上にレジス
ト7が塗布されている。この基板100に対応する半田
マスク200では、各ランド銅箔2、3に対応して開口
する貫通孔22、23が形成されている。これらの貫通
孔2、3の位置、形状、大きさは各ランド銅箔2、3の
それに対応する。In a substrate 100 illustrated in FIG. 7A, a resist 7 is formed on an insulating plate 4 except for land conductor foils 2 and 3 which need to be soldered (generally, copper foils, hereinafter referred to as land copper foils). It has been applied. In the solder mask 200 corresponding to the substrate 100, through holes 22 and 23 that open corresponding to the land copper foils 2 and 3 are formed. The positions, shapes and sizes of these through holes 2 and 3 correspond to those of the land copper foils 2 and 3.
【0005】このような半田マスク200を基板100
に重ね、半田マスク200上にクリーム半田40を乗せ
て、スキージ41をクリーム半田40に押し付けながら
矢印方向42に移動する。その後、図7(B)に示すよ
うに半田マスク200を外すと、ランド銅箔2、3上に
クリーム半田40が印刷される。印刷されたクリーム半
田40の量(半田量)は、概ね、貫通孔22、23の開
口面積とマスク厚tとの積で与えられる。[0005] Such a solder mask 200 is applied to the substrate 100.
Then, the cream solder 40 is placed on the solder mask 200, and the squeegee 41 moves in the arrow direction 42 while pressing the squeegee 41 against the cream solder 40. Thereafter, when the solder mask 200 is removed as shown in FIG. 7B, the cream solder 40 is printed on the land copper foils 2 and 3. The amount of the printed cream solder 40 (solder amount) is generally given by the product of the opening areas of the through holes 22 and 23 and the mask thickness t.
【0006】この場合、マスク厚tが厚いと、図7
(B)に示すように、クリーム半田40の一部が貫通孔
22、23の内周面に付着して残る。クリーム半田40
の付着量は小さい貫通孔23の方が大きい貫通孔22よ
りも多い。これは、マスク厚tが厚い程、また、ランド
銅箔の面積が小さい程、ランド銅箔の面積に対する貫通
孔の内周面積の比が大きくなるため、クリーム半田40
の全付着力のうち、貫通孔内周面への付着力の割合が大
きくなるからである。従って、小さいランド銅箔3上の
半田量制御が難しい。In this case, if the mask thickness t is large, FIG.
As shown in (B), a part of the cream solder 40 remains on the inner peripheral surfaces of the through holes 22 and 23. Cream solder 40
Is smaller in the through hole 23 than in the large through hole 22. This is because the ratio of the inner peripheral area of the through hole to the area of the land copper foil increases as the mask thickness t increases and the area of the land copper foil decreases.
This is because the ratio of the adhesive force to the inner peripheral surface of the through hole becomes larger in the total adhesive force of the above. Therefore, it is difficult to control the amount of solder on the small land copper foil 3.
【0007】そこで、今後の部品の超小型化や高密度実
装化に伴うランド銅箔及び貫通孔の小型化を考えると、
半田マスク200を薄くしたいところである。Therefore, considering the miniaturization of the land copper foil and the through hole due to the future miniaturization and high-density mounting of components,
We want to make the solder mask 200 thinner.
【0008】しかし、半田の必要量は部品によって異な
るため、半田マスク200を薄くすると、大型部品等で
は半田量が不足するという問題がある。However, since the required amount of solder varies depending on the component, there is a problem that if the thickness of the solder mask 200 is reduced, the amount of solder is insufficient for a large component or the like.
【0009】(第2の従来技術)クリーム半田印刷方法
の第2の従来技術を、図13(A)(B)を参照して説
明する。(Second Prior Art) A second prior art of the cream solder printing method will be described with reference to FIGS.
【0010】図13(A)に例示する基板110には大
きいランド銅箔2と小さいランド銅箔3が形成され、こ
れらランド銅箔2、3を除き、絶縁板4上にレジスト7
が塗布され、更に、レジスト7にシルク印刷による文字
や記号等(以下、シルク印刷部という)15が形成され
ている。半田マスク210には、大きなランド銅箔2に
対応する大きな貫通孔22と小さなランド銅箔3に対応
する小さな貫通孔23が形成されている。ただし、小さ
な貫通孔23については、小さなランド銅箔3に必要な
半田量が少なくて良いため、ハーフエッチング処理によ
りマスク表面側でのみ、貫通孔23の開口部全周に深さ
dの凹部31が形成されている。大きな貫通孔22につ
いては第1の従来技術と同様である。A large land copper foil 2 and a small land copper foil 3 are formed on a substrate 110 illustrated in FIG. 13A. A resist 7 is formed on the insulating plate 4 except for the land copper foils 2 and 3.
Is applied, and characters or symbols (hereinafter, referred to as silk-printed portions) 15 are formed on the resist 7 by silk-screen printing. A large through hole 22 corresponding to the large land copper foil 2 and a small through hole 23 corresponding to the small land copper foil 3 are formed in the solder mask 210. However, as for the small through-hole 23, the amount of solder required for the small land copper foil 3 may be small, so that the recess 31 having a depth d is formed on the entire surface of the opening of the through-hole 23 only on the mask surface side by the half etching process. Are formed. The large through-hole 22 is the same as in the first prior art.
【0011】凹部31の存在により、半田マスク210
のマスク厚tが厚くても、貫通孔23における実効的な
マスク厚t1はt−dと薄くなる。従って、小さな貫通
孔23に残るクリーム半田が減り、小さなランド銅箔3
上に少ない量のクリーム半田40を印刷することができ
る。The presence of the recess 31 causes the solder mask 210
Even if the mask thickness t is large, the effective mask thickness t1 in the through hole 23 becomes thin as t−d. Therefore, the amount of cream solder remaining in the small through hole 23 is reduced, and the small land copper foil 3
A small amount of cream solder 40 can be printed thereon.
【0012】しかし、基板110の表面は、レジスト7
やその上のシルク印刷部15の厚みにより段差が生じ、
完全な平面とはいえない。However, the surface of the substrate 110 is
And the thickness of the silk printing part 15 on it causes a step,
Not a perfect plane.
【0013】そのため、基板110に半田マスク210
を重ねてスキージを移動すると、半田マスク210が上
記段差による凹凸に応じて変形する、従って、図13
(B)に示すようにクリーム半田40が印刷され、安定
した均一な印刷を行うことができない。これは、今後の
部品の超小型化、高密度実装化の妨げとなる。Therefore, the solder mask 210 is formed on the substrate 110.
When the squeegee is moved by superposing the squeegee, the solder mask 210 is deformed according to the unevenness due to the step.
As shown in (B), the cream solder 40 is printed, and stable and uniform printing cannot be performed. This will hinder future miniaturization and high-density mounting of components.
【0014】[0014]
【発明が解決しようとする課題】従って、本発明は半田
マスクが薄くても大型部品に必要なクリーム半田の量を
確保することができる方法を提供することを第1の課題
とする。SUMMARY OF THE INVENTION Accordingly, it is a first object of the present invention to provide a method capable of securing the amount of cream solder required for a large component even when the solder mask is thin.
【0015】また、本発明は基板表面の段差(凸凹)に
影響されずに安定して均一にクリーム半田を印刷するこ
とができる方法を提供することを第2に課題とする。Another object of the present invention is to provide a method capable of printing cream solder stably and uniformly without being affected by steps (unevenness) on the substrate surface.
【0016】[0016]
【課題を解決するための手段】請求項1の発明に係るク
リーム半田印刷方法は第1の課題を解決するものであ
り、クリーム半田の増量が必要なランド導体箔周囲の基
板上に半田量制御用突起部を設け、この突起部の上から
半田マスクを基板に重ね、クリーム半田を印刷すること
を特徴とし、更に、請求項2の発明では、前記半田量制
御用突起部をシルク印刷により設け、この突起部以外、
前記基板上にシルク印刷を行わないことを特徴とする。According to the first aspect of the present invention, there is provided a cream solder printing method which solves the first problem by controlling a solder amount on a substrate around a land conductor foil which requires an increase in the amount of cream solder. Wherein a solder mask is overlaid on the substrate and cream solder is printed thereon. Further, in the invention according to claim 2, the solder amount control projection is provided by silk printing. , Except for this projection,
The method is characterized in that silk printing is not performed on the substrate.
【0017】請求項3の発明に係るクリーム半田印刷方
法も第1の課題を解決するものであるが、半田マスクの
うち、クリーム半田の増量が必要なランド導体箔に対応
する部分の周囲に半田量制御用突起部を設け、この突起
部を基板に向けて半田マスクを重ねて、クリーム半田を
印刷することを特徴とし、更に、請求項4の発明では、
前記基板上にはシルク印刷を行わないことを特徴とす
る。The cream solder printing method according to the third aspect of the present invention also solves the first problem. However, a solder mask is provided around a portion of a solder mask corresponding to a land conductor foil requiring an increased amount of cream solder. An amount control projection is provided, the solder mask is overlapped with the projection facing the substrate, and cream solder is printed. Further, in the invention according to claim 4,
Silk printing is not performed on the substrate.
【0018】更に、請求項5の発明に係るクリーム半田
印刷方法では前記各半田量制御用突起部を、クリーム半
田の増量が必要なランド導体箔の周囲に間欠的に位置す
るように複数個設けることを特徴とし、請求項6の発明
に係るクリーム半田印刷方法では前記各半田量制御用突
起部を、ランド導体箔に連なる接続用パターンを除き、
クリーム半田の増量が必要なランド導体箔の全周をほぼ
囲む連続した形状に設けることを特徴とし、請求項7の
発明に係るクリーム半田印刷方法では前記各半田量制御
用突起部を、クリーム半田の増量が必要なランド導体箔
の全周を完全に囲む連続した形状に設けることを特徴と
する。Further, in the cream solder printing method according to the present invention, a plurality of the solder amount control projections are provided so as to be intermittently located around a land conductor foil requiring an increase in the amount of cream solder. It is characterized in that, in the cream solder printing method according to the invention of claim 6, each of the solder amount control projections, except for the connection pattern connected to the land conductor foil,
8. The cream solder printing method according to claim 7, wherein each of the protrusions for controlling the amount of cream solder is provided in a continuous shape substantially surrounding the entire circumference of the land conductor foil requiring an increase in the amount of cream solder. The land conductor foil is provided in a continuous shape completely surrounding the entire circumference of the land conductor foil which needs to be increased.
【0019】次に、請求項8の発明に係るクリーム半田
印刷方法は第2の課題を解決するものであり、基板側の
凸部を受け入れる凹部をマスク裏面側にて、貫通孔の開
口部周囲に形成し、且つ、半田量制御用凹部をマスク表
面側にて、前記凸部受入用凹部が形成された貫通孔のう
ちクリーム半田の減量が必要なランド導体箔に対応する
貫通孔の開口部周囲に形成した半田マスクを用いて、基
板上のランド導体箔にクリーム半田を印刷することを特
徴とする。Next, a cream solder printing method according to an eighth aspect of the present invention solves the second problem, in which a concave portion for receiving a convex portion on the substrate side is provided on the back side of the mask around the opening of the through hole. And a solder amount control concave portion is formed on the mask surface side, and among the through holes in which the convex portion receiving concave portions are formed, the opening portions of the through holes corresponding to the land conductor foils that require a reduction in cream solder. It is characterized in that cream solder is printed on the land conductor foil on the substrate by using a solder mask formed around.
【0020】[0020]
【発明の実施の形態】上記構成であるから、請求項1及
び3に係る発明では、半田マスク自体が薄くても、半田
量制御用突起部が存在する部分の貫通孔にとっては、同
突起部の高さ分だけマスク厚が厚くなったのと等価であ
る。このように実効的にマスク厚が厚くなるため、クリ
ーム半田量も増加する。According to the above construction, even if the solder mask itself is thin, the through-hole at the portion where the solder amount control projection exists is provided with the same projection even if the solder mask itself is thin. Is equivalent to an increase in the mask thickness by the height of. Since the mask thickness is effectively increased in this manner, the amount of cream solder also increases.
【0021】請求項2に係る発明では、シルク印刷を用
いると、半田量制御用突起部を簡単且つ容易に設けるこ
とができる。また、半田量制御用突起部以外は基板上に
シルク印刷を行わないようにすると、基板表面に余計な
段差が生じず、半田マスクの高さが均一化する。従っ
て、半田量の精確な制御を簡単且つ容易に行うことがで
きる。According to the second aspect of the present invention, the use of silk printing makes it possible to easily and easily provide the solder amount control projection. Also, if silk printing is not performed on the substrate except for the solder amount control projections, no extra step is formed on the substrate surface, and the height of the solder mask becomes uniform. Therefore, accurate control of the amount of solder can be easily and easily performed.
【0022】請求項4に係る発明でも、基板上にシルク
印刷を行わないことにより、基板表面に余計な段差が生
じず、半田マスクの高さが均一化し、半田量の精確な制
御を簡単且つ容易に行うことができる。According to the fourth aspect of the present invention, since no silk-screen printing is performed on the substrate, no extra step is formed on the substrate surface, the height of the solder mask is made uniform, and accurate control of the amount of solder can be performed easily and easily. It can be done easily.
【0023】請求項5に係る発明では、半田量制御用突
起部間に隙間が生じるが、クリーム半田中の半田粒子を
小さくし過ぎない限り、この隙間からクリーム半田が流
出する心配はない。According to the fifth aspect of the present invention, a gap is formed between the solder amount control protrusions. However, there is no fear that the cream solder flows out of the gap unless the solder particles in the cream solder are made too small.
【0024】請求項6または7に係る発明では、半田量
制御用突起部が連続してランド導体箔の全周を略または
完全に囲むので、半田粒子の大きさを制限する必要がな
い。請求項6に係る発明では、基板表面に接続用パター
ンが存在しても、その部分で半田量制御用突起部が途切
れるので、高さの不均一が生じない。請求項7に係る発
明は、基板表面に接続用パターンが存在しない場合を想
定しており、その場合は、半田量制御用突起部が完全に
連続していても何ら差し支えない。In the invention according to claim 6 or 7, since the solder amount control projections continuously or almost completely surround the entire circumference of the land conductor foil, there is no need to limit the size of the solder particles. In the invention according to claim 6, even when the connection pattern exists on the substrate surface, the solder amount control projection is interrupted at that portion, so that the height does not become uneven. The invention according to claim 7 is based on the assumption that there is no connection pattern on the substrate surface. In this case, the solder amount control projections may be completely continuous.
【0025】請求項8に係る発明では、マスク裏面側の
凹部が基板上のレジストやシルク印刷といった凸部を受
け入れ、基板上の段差を吸収する。従って、半田マスク
の変形が少なくなり、段差に影響されず、安定した均一
なクリーム半田印刷を行うことができる。また、マスク
自体が厚くても、マスク表面側の凹部により実効的にマ
スク厚が小さくなる。従って、小さなランド銅箔の半田
量を精確に制御することができる。In the invention according to claim 8, the concave portion on the back surface side of the mask receives the convex portion such as resist or silk print on the substrate and absorbs the step on the substrate. Accordingly, deformation of the solder mask is reduced, and stable and uniform cream solder printing can be performed without being affected by steps. Further, even if the mask itself is thick, the concave portion on the mask surface side effectively reduces the mask thickness. Therefore, the amount of solder of the small land copper foil can be accurately controlled.
【0026】以下、図面を参照して本発明の実施の形態
を説明する。Hereinafter, embodiments of the present invention will be described with reference to the drawings.
【0027】(第1実施例)図1〜図3により、本発明
に係るクリーム半田印刷方法の第1実施例として、基板
側に半田量制御用突起部を設けた場合を説明する。(First Embodiment) A first embodiment of a cream solder printing method according to the present invention will be described with reference to FIGS. 1 to 3, in which a solder amount control projection is provided on the substrate side.
【0028】図1(A)(B)(C)は本実施例におけ
るクリーム半田印刷対象基板の数例の外観を示すが、簡
単のため、大小2種類のランド銅箔2、3が絶縁板4上
に形成されており、そのうち、大きなランド銅箔2が半
田量の増量を必要とし、小さなランド銅箔3は増量不要
であるとする。各ランド銅箔2、3には接続用パターン
5、6が連なっているが、ランド銅箔2、3を除き、基
板の略全面にレジスト7を塗布してある。なお、レジス
ト7はランド銅箔2、3の一部にかかることもあり、全
くかからないこともある。大きなランド銅箔2の接続用
パターン5は図1(A)(B)では基板表面に形成され
ているが、図1(C)では基板裏面に形成されているも
のとする。FIGS. 1 (A), 1 (B) and 1 (C) show the appearance of several examples of the substrate to be printed with cream solder in this embodiment. For simplicity, two types of large and small land copper foils 2 and 3 are made of insulating plates. 4, the large land copper foil 2 requires an increased amount of solder, and the small land copper foil 3 does not need to be increased. Each of the land copper foils 2, 3 is connected with connection patterns 5, 6, but a resist 7 is applied to substantially the entire surface of the substrate except for the land copper foils 2, 3. Note that the resist 7 may cover a part of the land copper foils 2 and 3 or may not cover at all. The connection pattern 5 of the large land copper foil 2 is formed on the front surface of the substrate in FIGS. 1A and 1B, but is formed on the back surface of the substrate in FIG. 1C.
【0029】半田量増量のため、図1(A)に示す基板
1Aでは、大きなランド銅箔2の周囲四隅で、レジスト
7上に半田量制御用突起部8を設けてある。つまり、4
個の突起部8を間欠的に設けている。In order to increase the amount of solder, the substrate 1A shown in FIG. 1A has solder amount control projections 8 on the resist 7 at the four corners around the large land copper foil 2. That is, 4
The individual projections 8 are provided intermittently.
【0030】図1(B)に示す基板1Bでは半田量増量
のため、接続用パターン5の部分を除きレジスト7上
に、大きなランド銅箔2の全周をほぼ囲む連続した形状
で半田量制御用突起部9を設けてある。接続用パターン
5の部分を除いて突起部9を設けたのは、同パターン5
が基板表面にあるので、これによってマスク高さが不均
一になるのを避けるためである。In the substrate 1B shown in FIG. 1B, in order to increase the amount of solder, the amount of solder is controlled on the resist 7 in a continuous shape substantially surrounding the entire periphery of the large land copper foil 2 except for the connection pattern 5. A projection 9 is provided. The reason why the projection 9 is provided except for the connection pattern 5 is that
This is to prevent the mask height from becoming non-uniform due to the presence of the mask on the substrate surface.
【0031】図1(C)に示す基板1Cでは、大きなラ
ンド銅箔2に連なる接続用パターン5が基板裏面にあっ
て邪魔にならないので、大きなランド銅箔2の全周を完
全に囲む連続した形状で、レジスト7上に半田量制御用
突起部10を設けてある。In the substrate 1C shown in FIG. 1 (C), the connection pattern 5 connected to the large land copper foil 2 is on the back surface of the substrate and does not hinder the connection, so that the continuous pattern completely surrounds the entire circumference of the large land copper foil 2. A solder amount control projection 10 is provided on the resist 7 in a shape.
【0032】上記各基板1A、1B、1Cいずれにおい
ても、本例では、半田量制御用突起部8、9、10をシ
ルク印刷で形成してある。また、小さなランド銅箔3の
周囲には、何も突起部を設けていない。更に、突起部
8、9、10を除き、レジスト7上には文字や記号のシ
ルク印刷を一切行っていない。各突起部8、9、10の
高さhについては、後で述べる。In each of the substrates 1A, 1B, and 1C, in this embodiment, the solder amount control projections 8, 9, and 10 are formed by silk printing. No projection is provided around the small land copper foil 3. Furthermore, except for the projections 8, 9 and 10, no silk printing of characters or symbols is performed on the resist 7. The height h of each of the projections 8, 9, 10 will be described later.
【0033】図2は、上記図1各基板1A〜1Cに共通
に対応した半田マスクを示す。この半田マスク21Aに
は、位置、形状、大きさが大きなランド銅箔2に対応し
た大きな貫通孔22と、小さなランド銅箔3に対応した
小さな貫通孔23とを形成してある。半田マスク21A
は一例としてステンレス製とし、その厚さは、小さなラ
ンド銅箔3に必要な半田量を確保するに足りるだけの薄
さt1にしてある。FIG. 2 shows a solder mask commonly corresponding to each of the substrates 1A to 1C shown in FIG. A large through hole 22 corresponding to the land copper foil 2 having a large position, shape and size and a small through hole 23 corresponding to the small land copper foil 3 are formed in the solder mask 21A. Solder mask 21A
Is made of stainless steel as an example, and has a thickness t1 that is sufficient to secure a necessary amount of solder for the small land copper foil 3.
【0034】従って、このままでは、大きなランド銅箔
2にとっては半田マスク21Aが薄す過ぎるため、半田
量が不足する。Therefore, in this state, the solder mask 21A is too thin for the large land copper foil 2, so that the amount of solder is insufficient.
【0035】そこで、各基板1A、1B、1Cに設ける
半田量制御用突起部8、9、10の高さhを、大きなラ
ンド銅箔2に必要な量だけクリーム半田を増量できる高
さとしてある。Therefore, the height h of the protrusions 8, 9, 10 for controlling the amount of solder provided on each of the substrates 1A, 1B, 1C is set to a height that allows the amount of cream solder to be increased by an amount required for the large land copper foil 2. .
【0036】このような基板1Aまたは1Bまたは1C
と、半田マスク21Aとを図3(A)のように重ねる
と、大きな貫通孔22では実質的なマスク厚t2がt1
+hに増加する。この状態でクリーム半田印刷を行う
と、図3(B)に示すように、貫通孔22、23に付着
するクリーム半田40の量が少なくなり、大きなランド
銅箔2にも、小さなランド銅箔3にも各々に必要十分な
量でクリーム半田40が印刷される。Such a substrate 1A or 1B or 1C
When the solder mask 21A is overlapped with the solder mask 21A as shown in FIG.
+ H. When cream solder printing is performed in this state, as shown in FIG. 3B, the amount of the cream solder 40 attached to the through holes 22 and 23 decreases, and the large land copper foil 2 and the small land copper foil 3 Also, the cream solder 40 is printed in a necessary and sufficient amount for each.
【0037】本実施例では半田量制御用突起部8、9、
10以外、文字や記号のシルク印刷を一切行っていない
が、これは高さの不均一を簡単且つ容易に避けることが
できるからである。従って、仮に文字や記号のシルク印
刷を行っても、これらシルク印刷部を避けて突起部8〜
10を設けることができ、且つ、突起部8〜10の高さ
hの方がシルク印刷部よりも高い場合は、何の問題も生
じない。In this embodiment, the solder amount controlling projections 8, 9,
Other than 10, no silk printing of characters or symbols is performed, because unevenness in height can be easily and easily avoided. Therefore, even if the characters or symbols are silk-printed, the projections 8 to 8 are avoided by avoiding these silk-printed portions.
10 can be provided, and when the height h of the projections 8 to 10 is higher than the silk-printed portion, no problem occurs.
【0038】また、突起部8〜10はシルク印刷以外の
方法で設けてもよく、また、その材料は絶縁性物質であ
れば何でも良い。The projections 8 to 10 may be provided by a method other than silk printing, and any material may be used as long as the material is an insulating substance.
【0039】(第2実施例)次に、図4〜図6により、
本発明に係るクリーム半田印刷方法の第2実施例とし
て、半田マスク側に半田量制御用突起部を設けた場合を
説明する。(Second Embodiment) Next, referring to FIGS.
As a second embodiment of the cream solder printing method according to the present invention, a case where a solder amount control projection is provided on the solder mask side will be described.
【0040】まず、図5(A)(B)を参照して本実施
例におけるクリーム半田印刷対象基板の例を説明する。
図5(A)(B)では、簡単のため、大小2種類のラン
ド銅箔2、3が絶縁板4上に形成されている。半田量の
増量が必要なものはそのうち大きなランド銅箔2であ
り、小さなランド銅箔3では半田増量が不要であるとす
る。各ランド銅箔2、3には接続用パターン5、6が連
なっているが、ランド銅箔2、3を除き、基板の略全面
にレジスト7を塗布してある。レジスト7上には文字や
記号のシルク印刷を一切行っていない。また、レジスト
7はランド銅箔2、3の一部にかかることもあり、全く
かからないこともある。First, with reference to FIGS. 5A and 5B, an example of a substrate to be printed with cream solder in this embodiment will be described.
5A and 5B, large and small types of land copper foils 2 and 3 are formed on the insulating plate 4 for simplicity. It is assumed that the large amount of solder needs to be increased in the large land copper foil 2, and the small land copper foil 3 does not need to increase the amount of solder. Each of the land copper foils 2, 3 is connected with connection patterns 5, 6, but a resist 7 is applied to substantially the entire surface of the substrate except for the land copper foils 2, 3. Silk printing of characters and symbols is not performed on the resist 7 at all. In addition, the resist 7 may cover a part of the land copper foils 2 and 3, or may not cover at all.
【0041】大きなランド銅箔2の接続用パターン5に
ついては、図5(A)に示す基板1Dでは基板表面に形
成されているが、図5(B)に示す基板1Eでは基板裏
面に形成されている。The connection pattern 5 for the large land copper foil 2 is formed on the front surface of the substrate 1D shown in FIG. 5A, but is formed on the back surface of the substrate 1E shown in FIG. 5B. ing.
【0042】次に、図4(A)(B)(C)を参照し
て、上記各基板に対応する半田マスクを説明する。図4
(A)(B)は図5(A)の基板1Dに対応した2種類
の半田マスクを表面から見て示し、図4(C)は図5
(B)の基板1Eに対応した半田マスクを表面から見て
示す。基本的には、位置、形状、大きさが大きなランド
銅箔2に対応した大きな貫通孔22と、小さなランド銅
箔3に対応した小さな貫通孔23とを形成してある。Next, with reference to FIGS. 4A, 4B, and 4C, a description will be given of the solder mask corresponding to each of the above substrates. FIG.
5A and 5B show two types of solder masks corresponding to the substrate 1D of FIG. 5A viewed from the surface, and FIG.
The solder mask corresponding to the substrate 1E shown in FIG. Basically, a large through hole 22 corresponding to the land copper foil 2 having a large position, shape and size and a small through hole 23 corresponding to the small land copper foil 3 are formed.
【0043】更に、半田量増量のため、図4(A)の半
田マスク21Bには、マスク裏面にて、大きなランド銅
箔2に対応する貫通孔22の周囲四隅に、半田量制御用
突起部28を設けてある。小さなランド銅箔3に対応す
る貫通孔23の周囲と、各接続用パターン5、6に対応
する部分には、何も突起部を設けていない。Further, in order to increase the amount of solder, the solder mask 21B shown in FIG. 4A has solder amount control protrusions at four corners around the through hole 22 corresponding to the large land copper foil 2 on the back surface of the mask. 28 are provided. No projection is provided around the through hole 23 corresponding to the small land copper foil 3 and at the portions corresponding to the connection patterns 5 and 6.
【0044】また、図4(B)の半田マスク21Cに
は、半田量増量のためマスク裏面にて、接続用パターン
5に対応する部分25を除き、大きなランド銅箔2に対
応する貫通孔22の全周をほぼ囲む連続した形状で半田
量制御用突起部29を設けてある。小さなランド銅箔3
に対応する貫通孔23の周囲と、このランド銅箔3に連
なる接続用パターン6に対応する部分には、何も突起部
を設けていない。In the solder mask 21C shown in FIG. 4B, a through hole 22 corresponding to the large land copper foil 2 is formed on the back surface of the mask except for a portion 25 corresponding to the connection pattern 5 in order to increase the amount of solder. Is provided in a continuous shape that substantially surrounds the entire circumference of. Small land copper foil 3
No protrusions are provided around the through hole 23 corresponding to the above and at the portion corresponding to the connection pattern 6 connected to the land copper foil 3.
【0045】図4(C)の半田マスク21Dには、半田
量増量のためマスク裏面にて、大きなランド銅箔2に対
応する貫通孔22の全周を完全に囲む連続した形状で半
田量制御用突起部30を設けてある。小さなランド銅箔
3に対応する貫通孔23の周囲と、それに連なる用接続
パターン6に対応する部分には、何も突起部を設けてい
ない。In order to increase the amount of solder, the solder mask 21D shown in FIG. 4C has a continuous shape that completely surrounds the entire periphery of the through hole 22 corresponding to the large land copper foil 2 on the back surface of the mask. The projection 30 is provided. No protrusions are provided around the through hole 23 corresponding to the small land copper foil 3 and the portion corresponding to the connecting pattern 6 connected thereto.
【0046】上記半田マスク21B、21C、21Dい
ずれの場合も、例えばステンレス製とし、マスク厚自体
は小さなランド銅箔3に必要な半田量の確保に足りるだ
けの薄さt1とし、これとは別体の高さhの突起部2
8、29、30を作り、接着剤等で接合してある。この
突起部高さhは、大きなランド銅箔2に必要な量だけク
リーム半田を増量できる高さである。In each of the above solder masks 21B, 21C and 21D, for example, it is made of stainless steel, and the thickness of the mask itself is thin enough to secure the amount of solder necessary for the small land copper foil 3, and is different from this. Projection 2 at body height h
8, 29 and 30 are made and joined with an adhesive or the like. The protrusion height h is a height at which cream solder can be increased by an amount required for the large land copper foil 2.
【0047】このような基板1Dと半田マスク21B
(または21C)とを、または、基板1Eと半田マスク
21Dとを重ねると、図6(A)のように、大きな貫通
孔22では実効的なマスク厚t2がt1+hに増加す
る。この状態でクリーム半田印刷を行うと、図6(B)
に示すように、貫通孔22、23に付着するクリーム半
田40の量が少なくなり、大きなランド銅箔2にも、小
さなランド銅箔3にも各々必要十分な量でクリーム半田
40が印刷される。Such a substrate 1D and the solder mask 21B
(Or 21C), or when the substrate 1E and the solder mask 21D are overlapped, as shown in FIG. 6A, the effective mask thickness t2 increases to t1 + h in the large through hole 22. When cream solder printing is performed in this state, FIG.
As shown in the figure, the amount of the cream solder 40 attached to the through holes 22 and 23 is reduced, and the cream solder 40 is printed in a necessary and sufficient amount on both the large land copper foil 2 and the small land copper foil 3. .
【0048】本実施例でも基板1D、1Eには文字や記
号のシルク印刷を一切行っていないが、これは高さの不
均一を簡単且つ容易に避けることができるからである。
従って、文字や記号のシルク印刷を行っても、これらシ
ルク印刷部を避け得る部位に半田量制御用突起部28〜
30を設けることができ、且つ、突起部28〜30の高
さhの方がシルク印刷部よりも高い場合は、何の問題も
ない。Also in this embodiment, silk printing of characters and symbols is not performed on the substrates 1D and 1E at all, because unevenness in height can be easily and easily avoided.
Therefore, even if silk printing of characters and symbols is performed, the solder amount control projections 28 to
30 can be provided, and when the height h of the projections 28 to 30 is higher than the silk-printed portion, there is no problem.
【0049】また、半田量制御用突起部28〜30の材
料は何でも良く、導電性物質でも絶縁性物質でもかまわ
ず、半田マスク21B〜21Dと同材料でも良い。例え
ば、厚さt1+hのステンレス板に貫通孔22、23を
明け、更に、その裏面に深さhのハーフエッチング処理
を施して突起部28〜30のみを残すことにより半田マ
スク21B〜21Dを作製する。The material for the solder amount control projections 28 to 30 may be any material, and may be a conductive material or an insulating material, and may be the same material as the solder masks 21B to 21D. For example, through holes 22 and 23 are formed in a stainless steel plate having a thickness of t1 + h, and a half-etching process is performed on the back surface of the stainless steel plate to a depth h to leave only the protruding portions 28 to 30, thereby producing solder masks 21B to 21D. .
【0050】(第3実施例)次に、図8〜図12によ
り、本発明に係るクリーム半田印刷方法の第3実施例と
して、基板上の段差(凹凸)の影響をなくす場合を説明
する。Third Embodiment A third embodiment of the cream solder printing method according to the present invention will be described with reference to FIGS. 8 to 12, in which the influence of steps (unevenness) on a substrate is eliminated.
【0051】まず、図10及び図11を参照して、本実
施例におけるクリーム半田印刷対象基板を説明する。図
10は基板1Fの平面図、図11はそのXI−XI矢視
断面図である。この基板1Fには大型部品用の大きなラ
ンド銅箔2と、IC(集積回路)用の左右2列の小さな
ランド銅箔3があり、これらランド銅箔2、3を除いて
レジスト7が塗布されている。更に、レジスト7上に
て、大きなランド銅箔2の付近の部品番号(YYY)1
1と、ランド銅箔3の列間のIC設置部位を示す枠12
と、その付近のIC番号(ICXX)を示す文字13
と、ICの1番ピンを示すマーク14がシルク印刷によ
り描かれている。なお、4は絶縁板、5はランド銅箔2
接続用パターン、6はランド銅箔3接続用パターンを示
す。First, the substrate to be printed with cream solder in this embodiment will be described with reference to FIGS. FIG. 10 is a plan view of the substrate 1F, and FIG. 11 is a cross-sectional view taken along the line XI-XI. The substrate 1F has a large land copper foil 2 for large components and a small land copper foil 3 in two rows on the left and right for ICs (integrated circuits). A resist 7 is applied except for the land copper foils 2 and 3. ing. Further, on the resist 7, the part number (YYY) 1 near the large land copper foil 2
1 and a frame 12 indicating an IC installation site between rows of land copper foils 3
And the character 13 indicating the IC number (ICXX) in the vicinity
And a mark 14 indicating the 1st pin of the IC is drawn by silk printing. 4 is an insulating plate, 5 is a land copper foil 2
The connection pattern 6 indicates a land copper foil 3 connection pattern.
【0052】次に、図8及び図9を参照して、上記基板
1Fに対応する半田マスクの例を説明する。図8は半田
マスク21Eの平面図、図9はそのIX−IX矢視断面
図である。この半田マスク21Eには、大きなランド銅
箔2に対応する貫通孔22と、小さなランド銅箔3に対
応する貫通孔23が形成されている。この半田マスク2
1Eには、表面側にて、小さな貫通孔23の開口部全周
に半田量制御用凹部31を形成してある。Next, an example of a solder mask corresponding to the substrate 1F will be described with reference to FIGS. FIG. 8 is a plan view of the solder mask 21E, and FIG. 9 is a cross-sectional view taken along the line IX-IX. In the solder mask 21E, a through hole 22 corresponding to the large land copper foil 2 and a through hole 23 corresponding to the small land copper foil 3 are formed. This solder mask 2
1E, on the front side, a recess 31 for controlling the amount of solder is formed all around the opening of the small through hole 23.
【0053】半田マスク21E自体の厚さは大きなラン
ド銅箔2に対して必要十分な半田量を確保する厚さtと
してある。そのため、小さなランド銅箔3に対する半田
量を必要十分な少量に減少する必要がある。そこで、小
さな貫通孔23での実効的なマスク厚がこの少量のクリ
ーム半田を確保するに足りる薄さとなるように、半田量
制御用凹部31の深さdを設定してある。The thickness of the solder mask 21E itself is a thickness t for securing a necessary and sufficient amount of solder for the large land copper foil 2. Therefore, it is necessary to reduce the amount of solder for the small land copper foil 3 to a necessary and sufficient small amount. Therefore, the depth d of the solder amount control concave portion 31 is set so that the effective mask thickness in the small through hole 23 is small enough to secure this small amount of cream solder.
【0054】更に、この半田マスク21Eには、裏面側
にて、基板1F上の凸部を受け入れるための凹部を形成
してある。凸部受入用凹部のうち、32はレジスト受入
用凹部、33は部品番号受入用凹部、34はIC設置枠
受入用凹部、35はIC番号受入用凹部、36は1番ピ
ンマーク受入用凹部である。これら部品番号11、IC
設置枠12、IC番号13及び1番ピンマーク14はシ
ルク印刷部である。従って、凹部33〜36はレジスト
受入用凹部32内に形成されている。Further, a concave portion for receiving a convex portion on the substrate 1F is formed on the back surface side of the solder mask 21E. Among the convex receiving recesses, 32 is a resist receiving concave, 33 is a part number receiving concave, 34 is an IC installation frame receiving concave, 35 is an IC number receiving concave, and 36 is a 1st pin mark receiving concave. is there. These part number 11, IC
The installation frame 12, the IC number 13, and the first pin mark 14 are silk-printed portions. Therefore, the concave portions 33 to 36 are formed in the concave portion 32 for receiving the resist.
【0055】各凸部受入用凹部32〜36の深さはレジ
スト7、部品番号11、IC設置枠12、IC番号13
及び1番ピンマーク14が丁度入る寸法に設定してあ
る。The depth of each of the convex receiving recesses 32 to 36 is the resist 7, the part number 11, the IC installation frame 12, and the IC number 13.
And the size of the first pin mark 14 is just set.
【0056】本実施例では、半田マスク21Eをステン
レス製とし、半田量制御用凹部31、レジスト受入用凹
部32、部品番号受入用凹部33、IC設置枠受入用凹
部34、IC番号受入用凹部35及び1番ピンマーク受
入用凹部36を全てハーフエッチング処理で形成してあ
る。In this embodiment, the solder mask 21E is made of stainless steel, and the solder amount control recess 31, the resist receiving recess 32, the component number receiving recess 33, the IC installation frame receiving recess 34, and the IC number receiving recess 35. All of the first pin mark receiving concave portions 36 are formed by half etching.
【0057】このような基板1Fと半田マスク21Eと
を図12(A)のように重ねると、基板1F上の凸部7
及び11〜14が全て凹部32〜36に収まる。従っ
て、基板上段差の影響を受けることなく、図12(B)
に示すようにクリーム半田40を安定且つ均一に印刷す
ることができる。また、小さな貫通孔23では半田量制
御用凹部31によりマスク厚が実効的に薄くなるから、
小さなランド銅箔3に適切な量だけクリーム半田40が
印刷される。When such a substrate 1F and the solder mask 21E are overlapped as shown in FIG.
And 11 to 14 all fit in the recesses 32 to 36. Therefore, without being affected by the step on the substrate, FIG.
The cream solder 40 can be printed stably and uniformly as shown in FIG. Also, in the small through hole 23, the mask thickness is effectively reduced by the solder amount control concave portion 31, so that
An appropriate amount of the cream solder 40 is printed on the small land copper foil 3.
【0058】上記第1、第2、第3各実施例ではプリン
ト回路基板にクリーム半田を印刷する場合について説明
したが、これに限らず、接着剤の塗布など、任意の粘性
流体をマスクを用いて任意の物体に塗布或いは印刷する
方法として、本発明を適用することができる。In each of the first, second and third embodiments, the case where cream solder is printed on the printed circuit board has been described. However, the present invention is not limited to this. The present invention can be applied as a method of applying or printing on an arbitrary object.
【0059】[0059]
【発明の効果】請求項1及び3に係る発明によれば、半
田マスク自体が薄くても、基板側または半田マスク側の
半田量制御用突起部により実効的にマスク厚が厚くな
り、所望のランド銅箔の半田量を増加することができ
る。According to the first and third aspects of the present invention, even when the solder mask itself is thin, the mask thickness is effectively increased by the solder amount control projections on the substrate side or the solder mask side, and the desired thickness can be obtained. The amount of solder on the land copper foil can be increased.
【0060】請求項2に係る発明によれば、基板上に半
田量制御用突起部を簡単且つ容易に設けることができ
る。また、半田量制御用突起部以外は、シルク印刷部が
ないので、半田量の精確な制御を簡単且つ容易に行うこ
とができる。According to the second aspect of the present invention, the solder amount control projection can be easily and easily provided on the substrate. In addition, since there is no silk-printed portion except for the solder amount control projection, accurate control of the solder amount can be performed easily and easily.
【0061】請求項4に係る発明でも、基板上にシルク
印刷部がないので、半田量の精確な制御を簡単且つ容易
に行うことができる。Also in the invention according to claim 4, since there is no silk-printed portion on the substrate, accurate control of the amount of solder can be performed easily and easily.
【0062】請求項5に係る発明によれば、クリーム半
田中の半田粒子を小さくし過ぎない限り、クリーム半田
は半田量制御用突起部間の隙間から流出しない。According to the fifth aspect of the present invention, the cream solder does not flow out of the gap between the solder amount control protrusions unless the solder particles in the cream solder are made too small.
【0063】請求項6または7に係る発明によれば、半
田量制御用突起部が連続してランド導体箔の全周を略ま
たは完全に囲むので、半田粒子の寸法に制限がない。According to the sixth or seventh aspect of the present invention, since the solder amount control projections continuously or substantially completely surround the entire circumference of the land conductor foil, there is no limitation on the size of the solder particles.
【0064】請求項8に係る発明によれば、マスク裏面
側の凹部が基板上の凸部を受け入れて段差を吸収するの
で、安定した均一なクリーム半田印刷を行うことができ
る。また、マスク自体が厚くても、マスク表面側の凹部
により実効的にマスク厚が小さくなり、小さなランド銅
箔の半田量を精確に制御することができる。According to the invention of claim 8, since the concave portion on the back side of the mask receives the convex portion on the substrate and absorbs the step, stable and uniform cream solder printing can be performed. Further, even if the mask itself is thick, the mask thickness is effectively reduced by the concave portion on the mask surface side, and the amount of solder of the small land copper foil can be accurately controlled.
【図1】第1実施例として、半田量制御用突起部を設け
た基板の例の斜視図。FIG. 1 is a perspective view of an example of a substrate provided with a solder amount control projection as a first embodiment.
【図2】図1の各基板に対応する半田マスクの平面図。FIG. 2 is a plan view of a solder mask corresponding to each substrate of FIG. 1;
【図3】第1実施例におけるクリーム半田印刷の様子を
示す断面図。FIG. 3 is a sectional view showing a state of cream solder printing in the first embodiment.
【図4】第2実施例として、半田量制御用突起部を設け
た半田マスクの例の平面図。FIG. 4 is a plan view of an example of a solder mask provided with a solder amount control projection as a second embodiment.
【図5】図4の各半田マスクに対応する基板の例の平面
図。FIG. 5 is a plan view of an example of a substrate corresponding to each solder mask of FIG. 4;
【図6】第2実施例におけるクリーム半田印刷の様子を
示す断面図。FIG. 6 is a sectional view showing a state of cream solder printing in the second embodiment.
【図7】第1の従来技術を示す断面図。FIG. 7 is a sectional view showing a first conventional technique.
【図8】第3実施例として、半田量制御用凹部及び凸部
受入用凹部を設けた半田マスクの平面図。FIG. 8 is a plan view of a solder mask provided with a concave portion for controlling the amount of solder and a concave portion for receiving a convex portion as a third embodiment.
【図9】図8中のIX−IX矢視断面図。FIG. 9 is a sectional view taken along the line IX-IX in FIG. 8;
【図10】図8、図9の半田マスクに対応する基板の例
の平面図。FIG. 10 is a plan view of an example of a substrate corresponding to the solder masks of FIGS. 8 and 9;
【図11】図10中のXI−XI矢視断面図。11 is a sectional view taken along the line XI-XI in FIG.
【図12】第3実施例におけるクリーム半田印刷の様子
を示す断面図。FIG. 12 is a sectional view showing a state of cream solder printing in the third embodiment.
【図13】第2の従来技術を示す断面図。FIG. 13 is a sectional view showing a second conventional technique.
1A、1B、1C 半田量制御用突起部を設けた基板 1D、1E 基板 1F 段差(凸部)を有する基板 2 大きなランド銅箔 3 小さなランド銅箔 4 絶縁板 5、6 接続用パターン 7 レジスト 8、9、10 基板側の半田量制御用突起部 11 部品番号 12 IC設置枠 13 IC番号 14 1番ピンマーク 21A 半田マスク 21B、21C、21D 半田量制御用突起部を設けた
半田マスク 21E 半田量制御用凹部及び凸部受入用凹部を設けた
半田マスク 22 大きな貫通孔 23 小さな貫通孔 25、26 接続用パターンに対応する部分 28、29、30 半田マスク側の半田量制御用突起部 31 半田量制御用凹部 32 レジスト受入用凹部 33 部品番号受入用凹部 34 IC設置枠受入用凹部 35 IC番号受入用凹部 36 1番ピンマーク受入用凹部 40 クリーム半田 41 スキージReference Signs List 1A, 1B, 1C Substrate provided with solder amount control projection 1D, 1E substrate 1F Substrate having step (convex portion) 2 Large land copper foil 3 Small land copper foil 4 Insulating plate 5, 6 Connection pattern 7 Resist 8 , 9, 10 Projection for controlling solder amount on substrate side 11 Part number 12 IC mounting frame 13 IC number 14 1st pin mark 21A Solder mask 21B, 21C, 21D Solder mask provided with projection for controlling solder amount 21E Solder amount Solder mask provided with control concave portion and convex portion receiving concave portion 22 Large through hole 23 Small through hole 25, 26 Portion corresponding to connection pattern 28, 29, 30 Projecting portion for controlling solder amount on solder mask side 31 Solder amount Control recess 32 Resist receiving recess 33 Part number receiving recess 34 IC installation frame receiving recess 35 IC number receiving recess 36 First pinmer Receiving recess 40 cream solder 41 squeegee
Claims (8)
箔の周囲の基板上に半田量制御用突起部を設け、この突
起部の上から半田マスクを基板に重ね、クリーム半田を
印刷することを特徴とするクリーム半田印刷方法。1. A method for providing solder amount control projections on a substrate around a land conductor foil requiring an increase in cream solder, overlaying a solder mask on the substrate from above the projections, and printing cream solder. Characteristic cream solder printing method.
より設け、この突起部以外、前記基板上にシルク印刷を
行わないことを特徴とする請求項1に記載のクリーム半
田印刷方法。2. The cream solder printing method according to claim 1, wherein the solder amount control projections are provided by silk printing, and silk printing is not performed on the substrate except for the projections.
が必要なランド導体箔に対応する部分の周囲に半田量制
御用突起部を設け、この突起部を基板に向けて半田マス
クを重ねて、クリーム半田を印刷することを特徴とする
クリーム半田印刷方法。3. A solder amount control projection is provided around a portion of the solder mask corresponding to the land conductor foil requiring an increase in cream solder, and the projection is directed toward the substrate, and the solder mask is overlaid. A cream solder printing method characterized by printing cream solder.
とを特徴とする請求項3に記載のクリーム半田印刷方
法。4. The cream solder printing method according to claim 3, wherein silk printing is not performed on the substrate.
田の増量が必要なランド導体箔の周囲に間欠的に位置す
るように複数個設けることを特徴とする請求項1から4
いずれかに記載のクリーム半田印刷方法。5. A method according to claim 1, wherein a plurality of said solder amount control projections are provided so as to be intermittently located around a land conductor foil requiring an increase in cream solder.
The cream solder printing method according to any one of the above.
箔に連なる接続用パターンを除き、クリーム半田の増量
が必要なランド導体箔の全周をほぼ囲む連続した形状に
設けることを特徴とする請求項1から4いずれかに記載
のクリーム半田印刷方法。6. The solder amount control projection is provided in a continuous shape substantially surrounding the entire periphery of the land conductor foil requiring an increase in cream solder, except for a connection pattern connected to the land conductor foil. The cream solder printing method according to any one of claims 1 to 4.
田の増量が必要なランド導体箔の全周を完全に囲む連続
した形状に設けることを特徴とする請求項1から4いず
れかに記載のクリーム半田印刷方法。7. The solder amount control projection according to claim 1, wherein the solder amount control projection is provided in a continuous shape completely surrounding the entire circumference of the land conductor foil requiring an increase in cream solder. Cream solder printing method.
裏面側にて、貫通孔の開口部周囲に形成し、且つ、半田
量制御用凹部をマスク表面側にて、前記凸部受入用凹部
が形成された貫通孔のうちクリーム半田の減量が必要な
ランド導体箔に対応する貫通孔の開口部周囲に形成した
半田マスクを用いて、基板上のランド導体箔にクリーム
半田を印刷することを特徴とするクリーム半田印刷方
法。8. A concave portion for receiving the convex portion on the substrate side is formed on the back surface of the mask around the opening of the through hole, and a concave portion for controlling the amount of solder is formed on the front surface side of the mask. Printing cream solder on the land conductor foil on the board using a solder mask formed around the opening of the through hole corresponding to the land conductor foil that requires a reduction in cream solder among the through holes formed. Characteristic cream solder printing method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9072976A JPH10270837A (en) | 1997-03-26 | 1997-03-26 | Cream solder printing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9072976A JPH10270837A (en) | 1997-03-26 | 1997-03-26 | Cream solder printing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH10270837A true JPH10270837A (en) | 1998-10-09 |
Family
ID=13504937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9072976A Withdrawn JPH10270837A (en) | 1997-03-26 | 1997-03-26 | Cream solder printing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH10270837A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006032622A (en) * | 2004-07-15 | 2006-02-02 | Mitsubishi Electric Corp | Mounted structure of leadless package |
JP2006120738A (en) * | 2004-10-19 | 2006-05-11 | Murata Mfg Co Ltd | Multilayered ceramic substrate and its manufacturing method |
JP2012104625A (en) * | 2010-11-10 | 2012-05-31 | Nec Corp | Structure of multilayer wiring body and manufacturing method |
JP2013179351A (en) * | 2013-05-31 | 2013-09-09 | Denso Corp | Method of manufacturing electronic apparatus |
CN114531785A (en) * | 2022-02-21 | 2022-05-24 | 深圳市华星光电半导体显示技术有限公司 | Tin printing steel mesh and method for printing tin paste |
-
1997
- 1997-03-26 JP JP9072976A patent/JPH10270837A/en not_active Withdrawn
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006032622A (en) * | 2004-07-15 | 2006-02-02 | Mitsubishi Electric Corp | Mounted structure of leadless package |
JP2006120738A (en) * | 2004-10-19 | 2006-05-11 | Murata Mfg Co Ltd | Multilayered ceramic substrate and its manufacturing method |
JP2012104625A (en) * | 2010-11-10 | 2012-05-31 | Nec Corp | Structure of multilayer wiring body and manufacturing method |
JP2013179351A (en) * | 2013-05-31 | 2013-09-09 | Denso Corp | Method of manufacturing electronic apparatus |
CN114531785A (en) * | 2022-02-21 | 2022-05-24 | 深圳市华星光电半导体显示技术有限公司 | Tin printing steel mesh and method for printing tin paste |
CN114531785B (en) * | 2022-02-21 | 2024-05-14 | 深圳市华星光电半导体显示技术有限公司 | Tin printing steel screen and method for printing tin paste |
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