JPH10242573A - 窒化物半導体の反射鏡端面の形成方法 - Google Patents
窒化物半導体の反射鏡端面の形成方法Info
- Publication number
- JPH10242573A JPH10242573A JP4023197A JP4023197A JPH10242573A JP H10242573 A JPH10242573 A JP H10242573A JP 4023197 A JP4023197 A JP 4023197A JP 4023197 A JP4023197 A JP 4023197A JP H10242573 A JPH10242573 A JP H10242573A
- Authority
- JP
- Japan
- Prior art keywords
- face
- ion beam
- gan
- etching
- nitride semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Lasers (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4023197A JPH10242573A (ja) | 1997-02-25 | 1997-02-25 | 窒化物半導体の反射鏡端面の形成方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4023197A JPH10242573A (ja) | 1997-02-25 | 1997-02-25 | 窒化物半導体の反射鏡端面の形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10242573A true JPH10242573A (ja) | 1998-09-11 |
| JPH10242573A5 JPH10242573A5 (cg-RX-API-DMAC7.html) | 2005-01-27 |
Family
ID=12574967
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4023197A Pending JPH10242573A (ja) | 1997-02-25 | 1997-02-25 | 窒化物半導体の反射鏡端面の形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH10242573A (cg-RX-API-DMAC7.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111129955A (zh) * | 2019-12-04 | 2020-05-08 | 中国电子科技集团公司第十三研究所 | 一种低温等离子体干法刻蚀方法及其应用 |
-
1997
- 1997-02-25 JP JP4023197A patent/JPH10242573A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111129955A (zh) * | 2019-12-04 | 2020-05-08 | 中国电子科技集团公司第十三研究所 | 一种低温等离子体干法刻蚀方法及其应用 |
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