JPH0974064A5 - - Google Patents
Info
- Publication number
- JPH0974064A5 JPH0974064A5 JP1996144404A JP14440496A JPH0974064A5 JP H0974064 A5 JPH0974064 A5 JP H0974064A5 JP 1996144404 A JP1996144404 A JP 1996144404A JP 14440496 A JP14440496 A JP 14440496A JP H0974064 A5 JPH0974064 A5 JP H0974064A5
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- particle beam
- mask
- small
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8144404A JPH0974064A (ja) | 1995-06-26 | 1996-06-06 | 荷電粒子線によるパターン転写方法及び転写装置 |
| US08/670,436 US5989753A (en) | 1995-06-26 | 1996-06-26 | Method, apparatus, and mask for pattern projection using a beam of charged particles |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7-159580 | 1995-06-26 | ||
| JP15958095 | 1995-06-26 | ||
| JP8144404A JPH0974064A (ja) | 1995-06-26 | 1996-06-06 | 荷電粒子線によるパターン転写方法及び転写装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0974064A JPH0974064A (ja) | 1997-03-18 |
| JPH0974064A5 true JPH0974064A5 (https=) | 2004-07-08 |
Family
ID=26475822
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8144404A Pending JPH0974064A (ja) | 1995-06-26 | 1996-06-06 | 荷電粒子線によるパターン転写方法及び転写装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US5989753A (https=) |
| JP (1) | JPH0974064A (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11329945A (ja) * | 1998-05-08 | 1999-11-30 | Nikon Corp | 荷電粒子ビーム転写方法及び荷電粒子ビーム転写装置 |
| EP0969326B1 (en) * | 1998-07-01 | 2012-10-17 | ASML Netherlands B.V. | Lithographic apparatus |
| US6376847B1 (en) | 1998-08-24 | 2002-04-23 | Matsushia Electric Industrial Co., Ltd. | Charged particle lithography method and system |
| US6617585B1 (en) | 2000-05-24 | 2003-09-09 | Nikon Corporation | Optimized curvilinear variable axis lens doublet for charged particle beam projection system |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5260151A (en) * | 1991-12-30 | 1993-11-09 | At&T Bell Laboratories | Device manufacture involving step-and-scan delineation |
| US5376505A (en) * | 1992-03-16 | 1994-12-27 | At&T Corp. | Device fabrication entailing submicron imaging |
| US5523580A (en) * | 1993-12-23 | 1996-06-04 | International Business Machines Corporation | Reticle having a number of subfields |
-
1996
- 1996-06-06 JP JP8144404A patent/JPH0974064A/ja active Pending
- 1996-06-26 US US08/670,436 patent/US5989753A/en not_active Expired - Fee Related
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