JPH09171104A5 - - Google Patents
Info
- Publication number
- JPH09171104A5 JPH09171104A5 JP1996294161A JP29416196A JPH09171104A5 JP H09171104 A5 JPH09171104 A5 JP H09171104A5 JP 1996294161 A JP1996294161 A JP 1996294161A JP 29416196 A JP29416196 A JP 29416196A JP H09171104 A5 JPH09171104 A5 JP H09171104A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- phase grating
- refractive index
- reflective phase
- grating according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE95117778:1 | 1995-11-11 | ||
| EP95117778A EP0773458B1 (de) | 1995-11-11 | 1995-11-11 | Auflicht-Phasengitter |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH09171104A JPH09171104A (ja) | 1997-06-30 |
| JPH09171104A5 true JPH09171104A5 (enExample) | 2004-11-04 |
| JP4073509B2 JP4073509B2 (ja) | 2008-04-09 |
Family
ID=8219805
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29416196A Expired - Fee Related JP4073509B2 (ja) | 1995-11-11 | 1996-11-06 | 反射型位相格子 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0773458B1 (enExample) |
| JP (1) | JP4073509B2 (enExample) |
| AT (1) | ATE190408T1 (enExample) |
| DE (1) | DE59507969D1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10011872A1 (de) * | 2000-03-10 | 2001-09-27 | Heidenhain Gmbh Dr Johannes | Reflexions-Messteilung und Verfahren zur Herstellung derselben |
| DE10150099A1 (de) | 2001-10-11 | 2003-04-17 | Heidenhain Gmbh Dr Johannes | Verfahren zur Herstellung eines Maßstabes, sowie derart hergestellter Maßstab und eine Positionsmesseinrichtung |
| DE102006027047A1 (de) * | 2006-06-10 | 2007-12-13 | Dr. Johannes Heidenhain Gmbh | Maßstab mit einem reflektierenden Phasengitter |
| FR2933782B1 (fr) * | 2008-07-11 | 2010-08-13 | Thales Sa | Dispositif de correction des defauts optiques d'un miroir de telescope |
| DE102016201068A1 (de) * | 2016-01-26 | 2017-07-27 | Dr. Johannes Heidenhain Gmbh | Maßverkörperung und Positionsmesseinrichtung mit dieser Maßverkörperung |
| JP7060370B2 (ja) | 2017-12-18 | 2022-04-26 | 株式会社ミツトヨ | スケールおよびその製造方法 |
| DE102019206937A1 (de) * | 2019-05-14 | 2020-11-19 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3412980A1 (de) * | 1984-04-06 | 1985-10-17 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Auflichtphasengitter und verfahren zur herstellung eines auflichtphasengitters |
| DE3905730C2 (de) * | 1989-02-24 | 1995-06-14 | Heidenhain Gmbh Dr Johannes | Positionsmeßeinrichtung |
-
1995
- 1995-11-11 AT AT95117778T patent/ATE190408T1/de not_active IP Right Cessation
- 1995-11-11 EP EP95117778A patent/EP0773458B1/de not_active Expired - Lifetime
- 1995-11-11 DE DE59507969T patent/DE59507969D1/de not_active Expired - Lifetime
-
1996
- 1996-11-06 JP JP29416196A patent/JP4073509B2/ja not_active Expired - Fee Related
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