JPH09148545A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH09148545A
JPH09148545A JP30315395A JP30315395A JPH09148545A JP H09148545 A JPH09148545 A JP H09148545A JP 30315395 A JP30315395 A JP 30315395A JP 30315395 A JP30315395 A JP 30315395A JP H09148545 A JPH09148545 A JP H09148545A
Authority
JP
Japan
Prior art keywords
cell
aluminum
wiring
pad
wirings
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP30315395A
Other languages
Japanese (ja)
Inventor
Masayuki Oshima
正幸 大嶋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP30315395A priority Critical patent/JPH09148545A/en
Publication of JPH09148545A publication Critical patent/JPH09148545A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To reduce the I/O region area in a multipin gate array(G/A) of a semiconductor integrated circuit. SOLUTION: This device comprises the following in an I/O cell 102 region of a gate array; pads 101, an I/O cell 102, aluminum wirings 103 for connecting the pads 101 with the I/O cell 102, and power supply wirings 104-107 wired on the I/O cell 102. An aluminum layer constituting the aluminum wirings 103 is different from an aluminum layer constituting the power supply wirings 104-107. The aluminum wirings 103 intersect the power supply wirings 104-107 and connect the pads 101 with the I/O cell 102. Thereby the spaces of the pads 101 and the I/O cell 102 can be minimized, so that the area of the I/O cell 102 region can be reduced. Further the chip size is made small and the chip cost can be reduced.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は半導体集積回路の多
ピンゲートアレイに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multi-pin gate array for a semiconductor integrated circuit.

【0002】[0002]

【従来の技術】従来の多ピンゲートアレイ(G/A)は
図2のI/O領域の構成図に示されるように、IC外部
との接続を行う為に設けられたパッド201と、IC外
部からの信号を受け取る入力セルやIC外部へ信号を伝
播する出力セル等を構成するI/Oセル202とを分離
し、I/O接続用アルミ配線203によりパッド201
とI/Oセル202を接続することによりI/O領域を
構成していた。
2. Description of the Related Art A conventional multi-pin gate array (G / A) has a pad 201 provided for connection with the outside of the IC and an outside of the IC as shown in the block diagram of the I / O region of FIG. The input cell that receives a signal from the IC and the I / O cell 202 that constitutes an output cell that propagates the signal to the outside of the IC are separated, and the pad 201 is connected by the aluminum wiring 203 for I / O connection.
And the I / O cell 202 is connected to form an I / O area.

【0003】この時、I/Oセル202に電源を供給す
る為に設けられた電源配線204、205、206、2
07とI/O接続用アルミ配線203は同一のアルミ配
線層で形成されていた。
At this time, power supply wirings 204, 205, 206, 2 provided to supply power to the I / O cell 202.
07 and the I / O connecting aluminum wiring 203 were formed of the same aluminum wiring layer.

【0004】[0004]

【発明が解決しようとする課題】しかし前述の従来技術
では、電源配線とI/O接続用アルミ配線が同一のアル
ミ配線層で形成されている為、I/OセルとI/O接続
用アルミ配線の接続部はI/Oセルのチップ外周側に限
定されてしまい、I/O接続用アルミ配線領域面積の増
加、つまりチップ面積の増加しいてはチップコストの増
加につながるという問題点を有する。
However, in the above-mentioned prior art, since the power supply wiring and the I / O connecting aluminum wiring are formed in the same aluminum wiring layer, the I / O cell and the I / O connecting aluminum wiring are formed. The connection portion of the wiring is limited to the outer peripheral side of the chip of the I / O cell, and there is a problem that the area of the aluminum wiring region for I / O connection increases, that is, the increase of the chip area leads to an increase of the chip cost. .

【0005】そこで本発明はこのような問題点を解決す
るもので、その目的とするところは、I/O領域面積の
小さな多ピンG/Aを提供する事にある。
Therefore, the present invention solves such a problem, and an object of the present invention is to provide a multi-pin G / A having a small I / O area.

【0006】[0006]

【課題を解決するための手段】本発明の半導体装置は、
ゲートアレイのI/Oセル領域において、パッドと、I
/Oセルと、前記パッドと前記I/Oセルを接続するア
ルミ配線と、前記I/Oセル上に配線された電源配線と
からなり、前記アルミ配線を構成するアルミ層と、前記
電源配線を構成するアルミ層が異なることを特徴とす
る。
According to the present invention, there is provided a semiconductor device comprising:
In the I / O cell area of the gate array, the pad and the I
/ O cell, an aluminum wiring connecting the pad and the I / O cell, and a power wiring wired on the I / O cell. The aluminum layer forming the aluminum wiring and the power wiring are connected to each other. It is characterized by different aluminum layers.

【0007】また、前記アルミ配線が前記電源配線と交
差して、前記パッドと前記I/Oセルを接続しているこ
とを特徴とする。
Further, the aluminum wiring intersects the power supply wiring to connect the pad and the I / O cell.

【0008】[0008]

【発明の実施の形態】本発明の第1の実施例として図1
に多ピンG/AのI/O領域の構成図を示す。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a first embodiment of the present invention.
A configuration diagram of the I / O area of the multi-pin G / A is shown in FIG.

【0009】図1において、IC外部との接続を行う為
のパッド101がICの最外周部に設けられている。こ
の時、同一のチップサイズにおいてもより多くのパッド
を設ける為にチップコーナー部のスペースにもパッド1
01を設置している。
In FIG. 1, a pad 101 for connecting to the outside of the IC is provided on the outermost peripheral portion of the IC. At this time, in order to provide a larger number of pads even with the same chip size, the pad 1 is also provided in the chip corner space.
01 is installed.

【0010】また、1層目アルミおよび2層目アルミを
用いてカスタマイズされ、IC外部からの信号をIC内
部へ伝播する入力セルや、IC内部からの信号をIC外
部へ伝播する出力セルや、入力セルと出力セルを兼用す
る双方向セル、および電源セルを構成する事ができるI
/Oセル102がパッド101の内側にアレイ配置され
ている。
An input cell that is customized using the first layer aluminum and the second layer aluminum and propagates a signal from the outside of the IC to the inside of the IC, an output cell that propagates a signal from the inside of the IC to the outside of the IC, A bidirectional cell that also serves as an input cell and an output cell, and a power supply cell
The / O cells 102 are arrayed inside the pad 101.

【0011】また、論理回路を構成する為に基本セルを
アレイ配置した、内部セル領域108がI/Oセル10
2の内側に配置されている。
In addition, the internal cell region 108 in which the basic cells are arranged in an array to form a logic circuit is the I / O cell 10.
It is located inside 2.

【0012】また、I/Oセル102上には、第一の電
位電源(VDD)配線104、106と、接地電位電源
(VSS)配線105、107が2層目アルミを用いて
配線されており、I/Oセル102内のPchトランジ
スタおよびNchトランジスタに電位を供給している。
On the I / O cell 102, first potential power supply (VDD) wirings 104 and 106 and ground potential power supply (VSS) wirings 105 and 107 are laid using the second layer aluminum. , Pch transistors and Nch transistors in the I / O cell 102 are supplied with potentials.

【0013】また、パッド101と、I/Oセル102
を接続する為のI/O接続用アルミ配線103は3層目
アルミで構成されている。
The pad 101 and the I / O cell 102 are also provided.
The aluminum wiring 103 for I / O connection for connecting to is composed of a third layer of aluminum.

【0014】ここで、各パッド101と各I/Oセル1
02の配置関係が各組み合わせごとに異なる為、I/O
接続用アルミ配線103の配線領域は多ピン化をするの
につれて増加するが、VDD配線104、106およ
び、VSS配線105、107のアルミ配線層と、I/
O接続用アルミ配線103のアルミ配線層が異なる為、
I/O接続用アルミ配線103は、VDD配線104、
106およびVSS配線105、107上を交差して配
線することが可能となる。この為、I/Oセル103は
パッド101とのスペースを最小限にして配置すること
が可能であり、また、パッド101とI/Oセル102
の接続は、VDD配線104とVSS配線105の間で
行っている。
Here, each pad 101 and each I / O cell 1
I / O because the arrangement relationship of 02 is different for each combination
Although the wiring area of the connecting aluminum wiring 103 increases as the number of pins increases, the aluminum wiring layers of the VDD wirings 104 and 106 and the VSS wirings 105 and 107 are
Since the aluminum wiring layer of the O wiring aluminum wiring 103 is different,
The I / O connection aluminum wiring 103 is a VDD wiring 104,
106 and the VSS wirings 105 and 107 can be crossed and wired. Therefore, the I / O cell 103 can be arranged with a minimum space between the pad 101 and the pad 101, and the pad 101 and the I / O cell 102 can be arranged.
Is connected between the VDD wiring 104 and the VSS wiring 105.

【0015】このように、多ピン対応のG/Aにおいて
もI/O領域の面積を最小限にすることが可能となる。
As described above, the area of the I / O region can be minimized even in the case of the G / A having a large number of pins.

【0016】また、図1において、3層アルミ配線を用
いたが、これは4層アルミ配線以上のG/Aにおいても
同様に対応する。
Further, although three-layer aluminum wiring is used in FIG. 1, this also applies to G / A having four-layer aluminum wiring or more.

【0017】また、図1において、VDDの1電源を用
いたが、これは2電源以上の電源供給を行うG/Aにお
いても同様に対応する。
In FIG. 1, one VDD power source is used, but this also applies to a G / A that supplies two or more power sources.

【0018】また、図1において、パッド101とI/
Oセル102の接続を、VDD配線104とVSS配線
105の間で行ったが、これは全ての電源配線間での接
続においても同様に対応する。
Further, in FIG. 1, the pad 101 and I /
Although the O cell 102 is connected between the VDD wiring 104 and the VSS wiring 105, this also applies to the connection between all the power supply wirings.

【0019】また、図1において、パッド101とI/
Oセル102の全ての接続を、同一の電源配線間で行っ
たが、これは各パッドごとに接続場所を変えた場合にお
いても同様に対応する。
In FIG. 1, the pad 101 and I /
All the connections of the O cell 102 are made between the same power supply lines, but this also applies to the case where the connection location is changed for each pad.

【0020】[0020]

【発明の効果】以上述べたように本発明によれば、多ピ
ン対応のG/Aにおいて、I/O領域の面積を最小限に
することができるという効果がある。また、これにより
チップサイズを小さくし、チップコストを安くできると
いう効果もある。
As described above, according to the present invention, the area of the I / O region can be minimized in the multi-pin compatible G / A. This also has the effect of reducing the chip size and the chip cost.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施例を示す多ピンG/AのI
/O領域の構成図。
FIG. 1 is a multi-pin G / A I showing a first embodiment of the present invention.
FIG.

【図2】従来例を示す多ピンG/AのI/O領域の構成
図。
FIG. 2 is a configuration diagram of an I / O area of a multi-pin G / A showing a conventional example.

【符号の説明】[Explanation of symbols]

101、201 パッド 102、202 I/Oセル 103、203 I/O接続用アルミ配線 104、105、106、107、204、205、2
06、207 電源配線 108 内部セル領域
101, 201 Pads 102, 202 I / O cells 103, 203 I / O connection aluminum wirings 104, 105, 106, 107, 204, 205, 2
06, 207 Power wiring 108 Internal cell area

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】ゲートアレイのI/Oセル領域において、
パッドと、I/Oセルと、前記パッドと前記I/Oセル
を接続するアルミ配線と、前記I/Oセル上に配線され
た電源配線とからなり、前記アルミ配線を構成するアル
ミ層と、前記電源配線を構成するアルミ層が異なること
を特徴とした半導体装置。
1. An I / O cell region of a gate array,
An aluminum layer, which comprises a pad, an I / O cell, an aluminum wire connecting the pad and the I / O cell, and a power wire wired on the I / O cell, and which constitutes the aluminum wire; A semiconductor device, wherein the aluminum layers forming the power supply wiring are different.
【請求項2】前記アルミ配線が前記電源配線と交差し
て、前記パッドと前記I/Oセルを接続していることを
特徴とした、請求項1記載の半導体装置。
2. The semiconductor device according to claim 1, wherein the aluminum wiring intersects with the power supply wiring to connect the pad and the I / O cell.
JP30315395A 1995-11-21 1995-11-21 Semiconductor device Withdrawn JPH09148545A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30315395A JPH09148545A (en) 1995-11-21 1995-11-21 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30315395A JPH09148545A (en) 1995-11-21 1995-11-21 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH09148545A true JPH09148545A (en) 1997-06-06

Family

ID=17917524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30315395A Withdrawn JPH09148545A (en) 1995-11-21 1995-11-21 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH09148545A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005116861A (en) * 2003-10-09 2005-04-28 Renesas Technology Corp Semiconductor device and its laying-out method
US8344392B2 (en) 2011-05-12 2013-01-01 Epistar Corporation Light-emitting element and the manufacturing method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005116861A (en) * 2003-10-09 2005-04-28 Renesas Technology Corp Semiconductor device and its laying-out method
JP4624660B2 (en) * 2003-10-09 2011-02-02 ルネサスエレクトロニクス株式会社 Semiconductor device
US8344392B2 (en) 2011-05-12 2013-01-01 Epistar Corporation Light-emitting element and the manufacturing method thereof
US8754439B2 (en) 2011-05-12 2014-06-17 Epistar Corporation Light-emitting element and the manufacturing method thereof

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