JPH088659A - Microwave semiconductor package - Google Patents

Microwave semiconductor package

Info

Publication number
JPH088659A
JPH088659A JP6139831A JP13983194A JPH088659A JP H088659 A JPH088659 A JP H088659A JP 6139831 A JP6139831 A JP 6139831A JP 13983194 A JP13983194 A JP 13983194A JP H088659 A JPH088659 A JP H088659A
Authority
JP
Japan
Prior art keywords
feedback circuit
cap
dielectric
semiconductor package
pedestal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6139831A
Other languages
Japanese (ja)
Inventor
Muneo Iida
宗夫 飯田
Akihiko Uchino
晃彦 内野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP6139831A priority Critical patent/JPH088659A/en
Publication of JPH088659A publication Critical patent/JPH088659A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/0601Structure
    • H01L2224/0603Bonding areas having different sizes, e.g. different heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item

Landscapes

  • Microwave Amplifiers (AREA)

Abstract

PURPOSE:To miniaturize the device in spite of adding a feedback circuit by forming metalized patterns from input and output parts on the lower face of a sealing-up cap and adding the feedback circuit in a package so as to realize the capacitive coupling. CONSTITUTION:The signal inputted to a gate electrode lead 3 rises along a metalized part 16 of the side face of a base seat 1 and reaches a gate electrode 18 of an FET from a metalized part 17 of the upper face of the base seat 1. The amplified signal outputted from a drain electrode 19 of the FET falls along a metalized part 21 of the side face of the pedestal from a metalized part 20 of the upper face of the base seat 1 and is outputted from a drain electrode lead 4. The metalized part 17 of the upper face of the base seat 1 on the input side is connected to an inside metalization pattern 23 of an annular dielectric, and capacitive coupling is brought above between this pattern 23 and a metalization pattern 24 on the lower face of the cap branched from the output side in the same manner. Metalization patterns 23 and 24 for soldering don't come into contact with each other. Thus, the feedback circuit can be incorporated in the package.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体パッケージに関
するものであり、特にマイクロ波帯で使用される半導体
パッケージに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor package, and more particularly to a semiconductor package used in the microwave band.

【0002】[0002]

【従来の技術】図5は、従来のマイクロ波半導体パッケ
ージの誘電体キャップを取り外した状態を示す平面図、
図6は、図5のA−A線断面図である。図において、1
はアルミナ等の誘電体材料から成る台座であり、2はア
ルミナ等の誘電体材料から成るリング状の側壁である。
3、4、5、6は金属板に金メッキ等を施した電極リー
ドである。3はゲート電極リード、4はドレイン電極リ
ード、5、6はソース電極リードである。また、7は誘
電体製の封止用キャップをロー付けするためのメタライ
ズである。図7は従来の誘電体製キャップの下面を示す
図である。8は誘電体キャップ側のロー付け用メタライ
ズである。
2. Description of the Related Art FIG. 5 is a plan view showing a conventional microwave semiconductor package with a dielectric cap removed.
FIG. 6 is a sectional view taken along the line AA of FIG. In the figure, 1
Is a pedestal made of a dielectric material such as alumina, and 2 is a ring-shaped side wall made of a dielectric material such as alumina.
Reference numerals 3, 4, 5, and 6 are electrode leads obtained by plating a metal plate with gold or the like. Reference numeral 3 is a gate electrode lead, 4 is a drain electrode lead, and 5 and 6 are source electrode leads. Further, 7 is a metallization for brazing a sealing cap made of a dielectric material. FIG. 7 is a view showing the lower surface of a conventional dielectric cap. 8 is a brazing metallization on the side of the dielectric cap.

【0003】[0003]

【発明が解決しようとする課題】以下、FET(電界効
果型トランジスタ)用パッケージについて説明する。図
8は、低雑音増幅器を示す図である。FETを使用し
て、マイクロ波帯の低雑音増幅器を設計する場合、パッ
ケージに搭載されたFET9を実装するマイクロストリ
ップライン基板10の入力側、出力側にそれぞれスタブ
等を利用した整合回路11、12を接続し、所望のNF
(雑音指数)特性、利得特性、安定性を実現している。
13はDCバイアス供給回路、14は接地用グランドパ
ターンである。また、前記の整合回路11、12に加え
てマイクロストリップライン上に帰還回路を付加してさ
らに設計の自由度を向上させる方法も特開平2−113
610号公報により開示されている。図9は、マイクロ
ストリップラインにて構成される帰還回路15を付加し
た低雑音増幅器を示す図である。しかし、帰還回路15
を付加する場合、マイクロストリップラインにて構成す
ると、基板10上に帰還回路15のメタライズパターン
が大きな面積を占めるため小型化に不利であるという問
題点があった。
The FET (field effect transistor) package will be described below. FIG. 8 is a diagram showing a low noise amplifier. In the case of designing a microwave band low noise amplifier using FETs, matching circuits 11 and 12 using stubs or the like on the input side and the output side of a microstrip line substrate 10 on which the FET 9 mounted in the package is mounted, respectively. Connect the desired NF
(Noise figure) characteristics, gain characteristics, and stability are realized.
Reference numeral 13 is a DC bias supply circuit, and 14 is a grounding ground pattern. In addition to the matching circuits 11 and 12, a method of adding a feedback circuit on the microstrip line to further improve the degree of freedom of design is also disclosed in Japanese Patent Laid-Open No. 2-113.
No. 610 publication. FIG. 9 is a diagram showing a low noise amplifier to which a feedback circuit 15 composed of a microstrip line is added. However, the feedback circuit 15
In the case of adding, the metallization pattern of the feedback circuit 15 occupies a large area on the substrate 10 if it is constituted by a microstrip line, which is disadvantageous in miniaturization.

【0004】本発明の目的は、かかる問題点を解決し、
帰還回路を付加した小型のマイクロ波半導体パッケージ
を提供することにある。
The object of the present invention is to solve these problems,
It is to provide a small microwave semiconductor package to which a feedback circuit is added.

【0005】[0005]

【課題を解決するための手段】本発明のマイクロ波半導
体パッケ−ジは、アルミナ等の誘電体材料からなる封止
用のキャップの下面に、入力部からのメタライズパター
ンと出力部からのメタライズパターンを形成し、容量性
結合させるようにパッケージ内部に帰還回路を付加する
ようにしてマイクロ波半導体パッケージを構成した。
A microwave semiconductor package according to the present invention comprises a metallized pattern from an input portion and a metallized pattern from an output portion on the lower surface of a sealing cap made of a dielectric material such as alumina. Then, a microwave semiconductor package was constructed by adding a feedback circuit inside the package so as to form a capacitive coupling.

【0006】[0006]

【作用】本発明は、上記のように構成したので、パッケ
ージ内部に帰還回路の機能を組み込むことができるの
で、帰還回路を付加した低雑音増幅器の小型化が可能と
なる。
Since the present invention is configured as described above, the function of the feedback circuit can be incorporated inside the package, and therefore the low noise amplifier to which the feedback circuit is added can be miniaturized.

【0007】[0007]

【実施例】以下図面を用いて本発明の実施例を説明す
る。図1は、本発明のマイクロ波半導体パッケージの第
1実施例であり、誘電体製キャップを取り外し、FET
を実装した状態の上面図、図2はB−B線断面図であ
る。図3は、誘電体製キャップの下面を示す底面図であ
る。ゲート電極リード3から入力した信号は台座の側面
メタライズ16をあがって台座1の上面メタライズ17
からFETのゲート電極18に到達する。また、FET
のドレイン電極19から出力された増幅信号は、台座1
の上面メタライズ20から台座の側面メタライズ21を
下がってドレイン電極リード4から出力される。また、
入力側の台座1の上面メタライズ17は、リング状の誘
電体の内側のメタライズパターン23につながってお
り、同様に出力側から分岐してキャップ下面のメタライ
ズパターン24との間で容量性の結合を生じている。2
6は気密封止を行う際にキャップをロー付けするための
リング状のメタライズであり、27はキャップ側のロー
付けするためのリング状のメタライズである。ロー付け
用メタライズ27は、前記のメタライズパターン23、
24とは接触しないものとする。これにより帰還回路を
パッケージ内部に組み込むことが可能となる。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows a microwave semiconductor package according to a first embodiment of the present invention.
Is a top view of the mounted state, and FIG. 2 is a sectional view taken along line BB. FIG. 3 is a bottom view showing the lower surface of the dielectric cap. A signal input from the gate electrode lead 3 is raised on the side surface metallization 16 of the pedestal and then on the upper surface of the pedestal 1
Reaches the gate electrode 18 of the FET. In addition, FET
The amplified signal output from the drain electrode 19 of the
It is output from the drain electrode lead 4 from the upper surface metallization 20 to the side surface metallization 21 of the pedestal. Also,
The upper surface metallization 17 of the pedestal 1 on the input side is connected to the inner metallization pattern 23 of the ring-shaped dielectric, and similarly branches off from the output side to form a capacitive coupling with the metallization pattern 24 on the lower surface of the cap. Has occurred. Two
Reference numeral 6 is a ring-shaped metallization for brazing the cap when performing airtight sealing, and 27 is a ring-shaped metallization for brazing the cap side. The brazing metallization 27 is the metallization pattern 23,
No contact with 24. This makes it possible to incorporate the feedback circuit inside the package.

【0008】図3は、本発明のマイクロ波半導体パッケ
ージの第2実施例の誘電体製キャップの下面を示す図で
ある。28は、メタライズパターン、29は容量製のギ
ャップである。図3のキャップは、高誘電率の誘電体か
らなっているので、ギャップ29による容量を大きくす
ることが出来る。
FIG. 3 is a view showing the lower surface of the dielectric cap of the second embodiment of the microwave semiconductor package of the present invention. 28 is a metallized pattern, and 29 is a gap made of a capacitor. Since the cap shown in FIG. 3 is made of a dielectric material having a high dielectric constant, the capacitance of the gap 29 can be increased.

【0009】ここでは、FET用のマイクロ波半導体パ
ッケージについて説明したが、HEMT等他にトランジ
スタ用のマイクロ波パッケージについても同様に実施で
きることは明らかである。
Although the microwave semiconductor package for the FET has been described here, it is apparent that the same can be applied to the microwave package for the transistor other than the HEMT and the like.

【0010】[0010]

【発明の効果】以上説明したように、本発明のパッケー
ジを使用すれば、パッケージ内部に帰還回路の機能を組
み込むことが可能となるので、帰還回路を付加した低雑
音増幅器の小型化が図れるという効果がある。
As described above, when the package of the present invention is used, the function of the feedback circuit can be incorporated into the package, so that the low noise amplifier including the feedback circuit can be downsized. effective.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例を示すマイクロ波半導体
パッケージの誘電体キャップを外し、FETを実装した
状態の平面図。
FIG. 1 is a plan view showing a microwave semiconductor package according to a first embodiment of the present invention in which a dielectric cap is removed and an FET is mounted.

【図2】本発明の第1の実施例を示すマイクロ波半導体
パッケージの誘電体キャップを外し、FETを実装した
状態の図1B−B線断面図。
FIG. 2 is a sectional view taken along the line BB of FIG. 1 showing a state where the dielectric cap of the microwave semiconductor package according to the first embodiment of the present invention is removed and the FET is mounted.

【図3】本発明の第1実施例であるマイクロ波パッケー
ジの誘電体キャップ底面図
FIG. 3 is a bottom view of the dielectric cap of the microwave package according to the first embodiment of the present invention.

【図4】本発明の第2実施例であるマイクロ波パッケー
ジの誘電体キャップ底面図
FIG. 4 is a bottom view of the dielectric cap of the microwave package according to the second embodiment of the present invention.

【図5】従来のマイクロ波半導体パッケージの誘電体キ
ャップを外した状態の平面図。
FIG. 5 is a plan view of a conventional microwave semiconductor package with a dielectric cap removed.

【図6】図5のマイクロ波半導体パッケージの誘電体キ
ャップを外した状態のA−A線断面図。
6 is a cross-sectional view taken along the line AA of the microwave semiconductor package of FIG. 5 with a dielectric cap removed.

【図7】従来のマイクロ波半導体パッケージの誘電体キ
ャップ底面図。
FIG. 7 is a bottom view of a dielectric cap of a conventional microwave semiconductor package.

【図8】従来の低雑音増幅器の回路構成図。FIG. 8 is a circuit configuration diagram of a conventional low noise amplifier.

【図9】従来の帰還回路を付加した低雑音増幅器の回路
構成図。
FIG. 9 is a circuit configuration diagram of a low noise amplifier to which a conventional feedback circuit is added.

【符号の説明】[Explanation of symbols]

1 誘電体の台座 2 誘電体製のリング 3 ゲート電極リード 4 ドレイン電極リード 5 ソース電極リード 6 ソース電極リード 7 ロー付け用メタライズ 8 ロー付け用メタライズ 9 FETが搭載されたパッケージ 10 マイクロストリップライン基板 11 入力側整合回路 12 出力側整合回路 13 DCバイアス供給回路 14 接地用グランドパターン 15 帰還回路 16 台座の側面メタライズ 17 台座の上面メタライズ 18 FETのゲート電極 19 FETのドレイン電極 20 台座の上面メタライズ 21 台座の側面メタライズ 22 リング状誘電体の内側面メタライズ 23 キャップ裏面のメタライズ 24 キャップ裏面のメタライズ 25 リング状誘電体の内側面メタライズ 26、27 ロー付け用メタライズ 28 キャップ裏面のメタライズ 29 容量性ギャップ 30 半導体チップ 1 pedestal of dielectric 2 dielectric ring 3 gate electrode lead 4 drain electrode lead 5 source electrode lead 6 source electrode lead 7 brazing metallization 8 brazing metallization 9 package with FET 10 microstripline substrate 11 Input side matching circuit 12 Output side matching circuit 13 DC bias supply circuit 14 Ground pattern for ground 15 Feedback circuit 16 Side metallization of pedestal 17 Top side metallization of pedestal 18 Gate electrode of FET 19 FET drain electrode 20 Top side metallization of pedestal 21 Pedestal Side metallization 22 Inner side metallization of ring-shaped dielectric 23 Metallization of backside of cap 24 Metallization of backside of cap 25 Metallization of inner side of ring-shaped dielectric 26, 27 Metallization for brazing 28 Metalization on backside of cap Rise 29 capacitive gap 30 semiconductor chip

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】マイクロ波用半導体デバイスチップを搭載
する誘電体の台座と、台座の上に固定されてデバイスチ
ップを収納するための凹部を形成するリング状の誘電体
と、凹部を封止するためにリング状の誘電体の上に固定
される誘電体キャップと、台座の誘電体より導出した複
数の電極リードを有するマイクロ波半導体パッケージに
おいて、誘電体キャップの下面に入力側からのメタライ
ズパターンと出力側からのメタライズパターンを形成す
るとともにこれらを容量性結合させることにより帰還回
路の機能を付加したことを特徴とするマイクロ波半導体
パッケ−ジ
1. A pedestal of a dielectric material on which a semiconductor device chip for microwaves is mounted, a ring-shaped dielectric material fixed on the pedestal to form a concave portion for housing a device chip, and the concave portion is sealed. In a microwave semiconductor package having a dielectric cap fixed on a ring-shaped dielectric and a plurality of electrode leads derived from the pedestal dielectric, a metallization pattern from the input side is formed on the lower surface of the dielectric cap. A microwave semiconductor package characterized by adding a function of a feedback circuit by forming a metallized pattern from the output side and capacitively coupling these.
JP6139831A 1994-06-22 1994-06-22 Microwave semiconductor package Pending JPH088659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6139831A JPH088659A (en) 1994-06-22 1994-06-22 Microwave semiconductor package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6139831A JPH088659A (en) 1994-06-22 1994-06-22 Microwave semiconductor package

Publications (1)

Publication Number Publication Date
JPH088659A true JPH088659A (en) 1996-01-12

Family

ID=15254512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6139831A Pending JPH088659A (en) 1994-06-22 1994-06-22 Microwave semiconductor package

Country Status (1)

Country Link
JP (1) JPH088659A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007520129A (en) * 2004-01-30 2007-07-19 ノキア コーポレイション Adjustment circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007520129A (en) * 2004-01-30 2007-07-19 ノキア コーポレイション Adjustment circuit

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