JPH08316640A - Manufacture of multilayer printed wiring board - Google Patents

Manufacture of multilayer printed wiring board

Info

Publication number
JPH08316640A
JPH08316640A JP11948295A JP11948295A JPH08316640A JP H08316640 A JPH08316640 A JP H08316640A JP 11948295 A JP11948295 A JP 11948295A JP 11948295 A JP11948295 A JP 11948295A JP H08316640 A JPH08316640 A JP H08316640A
Authority
JP
Japan
Prior art keywords
thermosetting resin
resin layer
wiring board
multilayer printed
printed wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP11948295A
Other languages
Japanese (ja)
Inventor
Shingo Yoshioka
慎悟 吉岡
Katsuhiko Ito
克彦 伊藤
Masayuki Ishihara
政行 石原
Shuji Maeda
修二 前田
Shinichi Iketani
晋一 池谷
Hiroaki Fujiwara
弘明 藤原
Hajime Sugiyama
肇 杉山
Koji Sawada
康志 澤田
Takahiro Inoue
孝啓 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP11948295A priority Critical patent/JPH08316640A/en
Publication of JPH08316640A publication Critical patent/JPH08316640A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4652Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PURPOSE: To provide a via-hole forming method wherein to the surface of an inner-layer board of its wiring pattern formation being completed, a metallic foil is bonded via a thermosetting resin layer, then, the pieces of the metalic foil which are present at the places for via holes to be formed are removed there from, and next, the via holes can be formed in a lump, and thereby, the via holes can be formed in a short time in the thermosetting resin layer. CONSTITUTION: On the surface of an inner-layer board, a metallic foil is disposed via a thermosetting resin layer, and then, to this intermediate. a primary heating is applied within the temperature range whose upper limit is lower by 20 deg.C or more in comparison with the maximum glass-transition temperature of the thermosetting resin layer reaching when it is enough hardened, and is applied until the stage of the metallic foil and inner-layer board being bonded to each other by the thermosetting resin layer, and subsequently, the pieces of the metallic foil which are present in the places for via holes to be formed are removed therefrom, and next, the via holes are formed in a lump in the thermosetting resin layer, and thereafter, the hardening of the thermosetting resin layer is advanced by its secondary heating.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、多層プリント配線板の
製造方法、詳しくは層間接続のための経由穴を形成する
方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a multilayer printed wiring board, and more particularly to a method for forming via holes for connecting layers.

【0002】[0002]

【従来の技術】従来の多層プリント配線板の製造方法で
は、ドリル加工によりスルーホールを形成し、このスル
ーホールにめっきを施して層間の電気的接続をとる方法
が一般的であったが、高密度化を達成するために、スル
ーホールではなくビアホールと呼ばれる非貫通の経由穴
を層間に形成し、この経由穴に導電性物質を付与して層
間の電気的接続をとる方法が近年広く利用されつつあ
る。この非貫通の経由穴を形成する加工方法としては、
ドリル加工、レーザ加工、エッチング加工等の方法があ
るが、ドリル加工やレーザ加工では一括して穴明けする
ことが困難なため生産性が低いという問題等があり、エ
ッチング加工のような一括して穴明けできる方法が注目
されている。この一括穴明けを行う方法の一つとして、
例えば、特開平5−218651号に開示されているよ
うな、配線パターン形成済みの内層用基板表面に、熱硬
化性樹脂層を介して金属箔を接着し、次いで経由穴を形
成する位置の金属箔を除去し、次いで、熱硬化性樹脂層
に経由穴を一括してあける方法が知られている。なお、
この場合の熱硬化性樹脂層は、エッチング等による除去
が可能なように無機質繊維強化材を含まない樹脂層であ
ることが一般的であり、特開平5−218651号の場
合にはアルカリ水溶液に可溶な樹脂を使用して形成して
いる。
2. Description of the Related Art In the conventional method for manufacturing a multilayer printed wiring board, a method is generally used in which a through hole is formed by drilling and the through hole is plated to make an electrical connection between layers. In order to achieve higher density, a method of forming a non-penetrating via hole called a via hole instead of a through hole between layers and applying a conductive substance to the via holes to electrically connect the layers has been widely used in recent years. It's starting. As a processing method for forming this non-penetrating via hole,
There are methods such as drilling, laser processing, etching, etc., but there is a problem that productivity is low because it is difficult to drill holes in a batch with drilling or laser processing. The method of making a hole is drawing attention. As one of the methods to do this batch drilling,
For example, as disclosed in Japanese Unexamined Patent Publication No. 5-218651, a metal foil is adhered to a surface of an inner layer substrate on which a wiring pattern is formed via a thermosetting resin layer, and then a metal at a position where a via hole is formed. A method is known in which the foil is removed and then the through holes are collectively formed in the thermosetting resin layer. In addition,
The thermosetting resin layer in this case is generally a resin layer that does not contain an inorganic fiber reinforcing material so that it can be removed by etching or the like. In the case of JP-A-5-218651, an aqueous alkaline solution is used. It is formed using a soluble resin.

【0003】しかし、上記のような従来の一括穴明けを
行う方法では、エッチング等によって熱硬化性樹脂層を
除去するのに長時間を要するという問題があり、短時間
で経由穴を形成することができる方法が求められてい
る。
However, in the above-described conventional method of performing the collective punching, there is a problem that it takes a long time to remove the thermosetting resin layer by etching or the like, and the through hole is formed in a short time. There is a need for a method that can.

【0004】[0004]

【発明が解決しようとする課題】本発明は、上記のよう
な事情に鑑みてなされたものであって、配線パターン形
成済みの内層用基板表面に、熱硬化性樹脂層を介して金
属箔を接着し、次いで経由穴を形成する位置の金属箔を
除去し、次いで、熱硬化性樹脂層に経由穴を一括して形
成する方法であって、短時間で熱硬化性樹脂層に経由穴
を形成することが可能な方法を提供することを目的とし
ている。
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and a metal foil is provided on the surface of an inner layer substrate on which a wiring pattern is formed, with a thermosetting resin layer interposed therebetween. This is a method of bonding, then removing the metal foil at the position where the via hole is to be formed, and then forming the via hole in the thermosetting resin layer at once. It is intended to provide a method that can be formed.

【0005】[0005]

【課題を解決するための手段】請求項1に係る発明の多
層プリント配線板の製造方法は、配線パターン形成済み
の内層用基板表面に、熱硬化性樹脂層を介して金属箔を
接着し、次いで経由穴を形成する位置の金属箔を除去
し、次いで、熱硬化性樹脂層に経由穴を一括して形成
し、この経由穴に導電性物質を付与して内層用基板に備
わる配線パターンと金属箔を電気的に接続する多層プリ
ント配線板の製造方法において、内層用基板表面に未硬
化の熱硬化性樹脂層を介して金属箔を配設し、次いで、
熱硬化性樹脂層のガラス転移温度が、十分に硬化させた
場合に到達する最大ガラス転移温度よりも20℃以上低
い範囲内に留まっていて、かつ、金属箔と内層用基板が
熱硬化性樹脂層で接着される段階まで一次加熱を施し、
次いで、経由穴を形成する位置の金属箔を除去し、次い
で、熱硬化性樹脂層に経由穴を一括して形成し、その後
に、二次加熱を行い熱硬化性樹脂層の硬化を進めること
を特徴とする。
According to a first aspect of the present invention, there is provided a method for manufacturing a multilayer printed wiring board, wherein a metal foil is bonded to a surface of an inner layer substrate on which a wiring pattern has been formed, via a thermosetting resin layer, Next, the metal foil at the position where the via hole is formed is removed, then the via hole is collectively formed in the thermosetting resin layer, and a conductive material is applied to the via hole to form the wiring pattern provided on the inner layer substrate. In the method for manufacturing a multilayer printed wiring board that electrically connects metal foils, the metal foil is disposed on the inner layer substrate surface via an uncured thermosetting resin layer, and then,
The glass transition temperature of the thermosetting resin layer remains within a range of 20 ° C. or more lower than the maximum glass transition temperature reached when the thermosetting resin layer is sufficiently cured, and the metal foil and the inner layer substrate are thermosetting resins. Apply primary heating until the layer is bonded,
Next, the metal foil at the position where the via hole is formed is removed, then the via hole is collectively formed in the thermosetting resin layer, and then secondary heating is performed to promote curing of the thermosetting resin layer. Is characterized by.

【0006】請求項2に係る発明の多層プリント配線板
の製造方法は、請求項1記載の製造方法において、経由
穴を形成する方法が過マンガン酸液により熱硬化性樹脂
層を溶解除去する方法であることを特徴とする。
A method for manufacturing a multilayer printed wiring board according to a second aspect of the present invention is the method for manufacturing a multilayer printed wiring board according to the first aspect, wherein the method of forming the via holes is a method of dissolving and removing the thermosetting resin layer with a permanganate solution. Is characterized in that.

【0007】請求項3に係る発明の多層プリント配線板
の製造方法は、請求項1記載の製造方法において、経由
穴を形成する方法がサンドブラスターを用いて熱硬化性
樹脂層を除去する方法であることを特徴とする。
According to a third aspect of the present invention, in the method for producing a multilayer printed wiring board according to the first aspect, the method of forming the via holes is a method of removing the thermosetting resin layer using a sand blaster. It is characterized by being.

【0008】請求項4に係る発明の多層プリント配線板
の製造方法は、請求項1記載の製造方法において、経由
穴を形成する方法が反応性ガスを用いたプラズマエッチ
ングにより熱硬化性樹脂層を除去する方法であることを
特徴とする。
A method for manufacturing a multilayer printed wiring board according to a fourth aspect of the present invention is the method for manufacturing a multilayer printed wiring board according to the first aspect, wherein the method of forming the via hole is to form a thermosetting resin layer by plasma etching using a reactive gas. It is a method of removing.

【0009】請求項5に係る発明の多層プリント配線板
の製造方法は、請求項4記載の製造方法において、反応
性ガスが酸素ガスを含むガスであることを特徴とする。
According to a fifth aspect of the present invention, there is provided a method for producing a multilayer printed wiring board according to the fourth aspect, wherein the reactive gas is a gas containing oxygen gas.

【0010】請求項6に係る発明の多層プリント配線板
の製造方法は、請求項4記載の製造方法において、反応
性ガスがフッ素系ガス及び酸素ガスを含むガスであるこ
とを特徴とする。
According to a sixth aspect of the present invention, there is provided a method for producing a multilayer printed wiring board according to the fourth aspect, wherein the reactive gas is a gas containing a fluorine-based gas and an oxygen gas.

【0011】以下、本発明を詳細に説明する。本発明に
おける、配線パターン形成済みの内層用基板は、例えば
ガラス布基材エポキシ樹脂銅張積層板に回路を形成した
もの等が例示でき、配線パターンには、黒化処理等の表
面処理が施されていることが好ましい。
The present invention will be described in detail below. Examples of the inner layer substrate on which a wiring pattern has been formed in the present invention include those in which a circuit is formed on a glass cloth base material epoxy resin copper clad laminate, and the wiring pattern is subjected to surface treatment such as blackening treatment. Is preferably provided.

【0012】また、本発明における熱硬化性樹脂層は、
エポキシ樹脂、ポリイミド樹脂等の熱硬化性樹脂で形成
するが、金属層を配設する段階では未硬化の状態であ
る。この未硬化とはいわゆるBステージの状態を指して
いて、加熱により流動状態を経由して硬化(ゲル化を含
む)に到ることのできる状態を指している。この熱硬化
性樹脂層には、必要に応じて、無機粉末充填材等を含有
させてもよい。但し、特に限定するものではないが、経
由穴の形成を阻害しやすいガラス繊維等の無機質繊維強
化材は含有していないことが好ましい。また、この熱硬
化性樹脂層は内層用基板の表面、又は金属箔の表面のい
ずれかの表面に形成すればよく、どちらの表面に形成す
るかは適宜選択すればよい。なお、溶剤を含む樹脂組成
物を用いてコーティング等により熱硬化性樹脂層を形成
する場合には、一次加熱前に、溶剤除去のための加熱を
行い溶剤を除去しておくことが好ましい。また、本発明
における金属箔としては、銅箔、アルミ箔、ニッケル箔
等が例示できるが、性能及び入手の容易さの点で銅箔を
使用することが好ましい。
The thermosetting resin layer in the present invention is
Although it is formed of a thermosetting resin such as an epoxy resin or a polyimide resin, it is in an uncured state at the stage of disposing the metal layer. This uncured refers to a so-called B-stage state, and refers to a state in which heating (including gelation) can be achieved via a fluid state by heating. This thermosetting resin layer may contain an inorganic powder filler or the like, if necessary. However, although not particularly limited, it is preferable not to include an inorganic fiber reinforcing material such as glass fiber which easily inhibits formation of through holes. The thermosetting resin layer may be formed on either the surface of the inner layer substrate or the surface of the metal foil, and which surface is formed may be appropriately selected. When the thermosetting resin layer is formed by coating with a resin composition containing a solvent, it is preferable to remove the solvent by heating for removing the solvent before the primary heating. Further, as the metal foil in the present invention, a copper foil, an aluminum foil, a nickel foil and the like can be exemplified, but it is preferable to use a copper foil in terms of performance and availability.

【0013】また、熱硬化性樹脂層に経由穴を形成する
位置は、当然内層用基板の配線パターンが存在する部分
に設定される。そして、経由穴を形成する位置の金属箔
を除去する方法については、特に限定はなく、例えばエ
ッチング等の方法で行えばよい。
Further, the position where the through hole is formed in the thermosetting resin layer is naturally set to the portion where the wiring pattern of the inner layer substrate exists. The method for removing the metal foil at the position where the via hole is formed is not particularly limited, and may be performed by, for example, a method such as etching.

【0014】本発明では、熱硬化性樹脂層のガラス転移
温度が、十分に硬化させた場合に到達する最大ガラス転
移温度よりも20℃以上低い範囲内に留まっていて、か
つ、金属箔と内層用基板が熱硬化性樹脂層で接着される
段階まで一次加熱を施す。すなわち、本発明では一次加
熱によって硬化反応をある程度進めて、金属箔と内層用
基板を熱硬化性樹脂層で接着するけれども、熱硬化性樹
脂層のガラス転移温度は十分に硬化させた場合より低い
レベルに抑えるようにしている。なお、この場合のガラ
ス転移温度は、昇温速度:10℃/分、サンプル量:2
00mgの条件でDSC法により測定して得られるガラ
ス転移温度を指している。また、十分に硬化させた場合
に到達する最大ガラス転移温度とは、選択した熱硬化性
樹脂について硬化条件を変動させて、ガラス転移温度を
調査した結果によって得られる最大ガラス転移温度を指
していて、±5℃程度の測定誤差が見込まれるが、選択
した熱硬化性樹脂毎に特定可能な温度である。
In the present invention, the glass transition temperature of the thermosetting resin layer is kept within the range of 20 ° C. or more lower than the maximum glass transition temperature reached when fully cured, and the metal foil and the inner layer are Primary heating is performed until the substrate for bonding is bonded with the thermosetting resin layer. That is, in the present invention, the curing reaction is advanced to some extent by primary heating to bond the metal foil and the inner layer substrate with the thermosetting resin layer, but the glass transition temperature of the thermosetting resin layer is lower than that when fully cured. I try to keep it to a level. The glass transition temperature in this case was as follows: temperature rising rate: 10 ° C./min, sample amount: 2
It indicates the glass transition temperature obtained by the DSC method under the condition of 00 mg. In addition, the maximum glass transition temperature reached when fully cured refers to the maximum glass transition temperature obtained by investigating the glass transition temperature by varying the curing conditions for the selected thermosetting resin. , A measurement error of about ± 5 ° C. is expected, but the temperature can be specified for each selected thermosetting resin.

【0015】本発明における、経由穴を一括して形成す
る方法としては、過マンガン酸液やプラズマガスを用い
た各種のエッチング法やサンドブラスター等による物理
的な除去法等が例示できる。この中のプラズマガスを用
いた方法の場合には、反応性ガスとして酸素ガスを使用
することが熱硬化性樹脂と反応できるので望ましい。さ
らにフッ素系ガスを酸素ガスに添加すると、横方向のエ
ッチングを抑え、縦方向のエッチングを有効に進行さ
せ、きわめて孔形状の優れた経由穴を形成できるので、
より好ましい。フッ素系ガスとしてはCF4 、SF6
NF3 等が挙げられ、フッ素系ガスと酸素ガスの混合比
はフッ素系ガスの容積%が50%以下であることが好ま
しい。50%を越えるとエッチング速度(穴明け速度)
を低下させる傾向が生じる。また、放電を安定化させる
ためアルゴン、ヘリウム、窒素などのガスを適宜添加す
ることもできる。
Examples of the method of collectively forming the via holes in the present invention include various etching methods using a permanganate solution and plasma gas, and a physical removal method using a sand blaster or the like. In the case of the method using the plasma gas, it is desirable to use oxygen gas as the reactive gas because it can react with the thermosetting resin. Furthermore, when a fluorine-based gas is added to oxygen gas, lateral etching is suppressed, vertical etching is effectively progressed, and a via hole having an extremely excellent hole shape can be formed.
More preferable. Fluorine-based gas is CF 4 , SF 6 ,
NF 3 and the like can be mentioned. The mixing ratio of the fluorine-based gas and the oxygen gas is preferably such that the volume% of the fluorine-based gas is 50% or less. When it exceeds 50%, etching rate (drilling rate)
Tends to decrease. Further, in order to stabilize the discharge, a gas such as argon, helium, or nitrogen can be added as appropriate.

【0016】本発明では、熱硬化性樹脂層に経由穴を一
括して形成した後で、二次加熱を行い熱硬化性樹脂層の
硬化を進めるが、この二次加熱は、一次加熱での硬化レ
ベルより硬化状態が進めばよく、どの程度の二次加熱条
件を設定するかは、熱硬化性樹脂の種類や多層プリント
配線板に求められる性能等に基づいて決定すればよく、
必ずしも完全硬化をさせる必要はない。
In the present invention, after the through holes are collectively formed in the thermosetting resin layer, the secondary heating is performed to advance the curing of the thermosetting resin layer. The secondary heating is the primary heating. The curing state may be advanced from the curing level, and what degree of secondary heating conditions should be set may be determined based on the type of thermosetting resin and the performance required for the multilayer printed wiring board,
It is not always necessary to completely cure.

【0017】[0017]

【作用】本発明において、熱硬化性樹脂層のガラス転移
温度が、十分に硬化させた場合に到達する最大ガラス転
移温度よりも20℃以上低い範囲内に留まっていて、か
つ、金属箔と内層用基板が熱硬化性樹脂層で接着される
段階まで一次加熱を施し、次いで、経由穴を形成する位
置の金属箔を除去し、次いで、熱硬化性樹脂層に経由穴
を一括して形成することは、熱硬化性樹脂層を十分に硬
化させた後で経由穴を一括して形成する場合に比べて、
短時間で熱硬化性樹脂層に経由穴を形成することを可能
にする作用がある。
In the present invention, the glass transition temperature of the thermosetting resin layer remains within the range of 20 ° C. or more lower than the maximum glass transition temperature reached when fully cured, and the metal foil and the inner layer are Primary heating is performed until the substrate for bonding is bonded with the thermosetting resin layer, then the metal foil at the position where the via hole is formed is removed, and then the via holes are collectively formed in the thermosetting resin layer. That is, compared with the case where the through holes are collectively formed after the thermosetting resin layer is sufficiently cured,
It has an effect of making it possible to form via holes in the thermosetting resin layer in a short time.

【0018】[0018]

【実施例】以下、本発明を実施例及び比較例に基づいて
説明するが、これら実施例は本発明を限定するものでは
ない。
EXAMPLES The present invention will be described below based on Examples and Comparative Examples, but these Examples do not limit the present invention.

【0019】(実施例及び比較例)FR−4タイプの両
面銅張積層板(積層板の厚み1.0mm、銅箔の厚み1
8μm)の一方の面には配線パターンを形成し、他方の
面は銅箔を全面にわたってエッチングにより除去して、
配線パターン形成済みの内層用基板を作製した。次い
で、形成した配線パターンに黒化処理と呼ばれる表面処
理を施した。次いで、ビスフェノールA型エポキシ樹脂
とジシアンジアミドを主成分とする、FR−4タイプの
積層板の製造に一般的に使用されるエポキシ樹脂ワニス
を、カーテンコーターを用いて、上記のように準備した
内層用基板の配線パターンを形成している表面に塗布
し、エポキシ樹脂ワニス層を形成した。
(Examples and Comparative Examples) FR-4 type double-sided copper-clad laminate (laminate thickness 1.0 mm, copper foil thickness 1)
8 μm), a wiring pattern is formed on one surface, and the other surface is removed by etching the copper foil over the entire surface.
An inner layer substrate on which a wiring pattern was formed was produced. Then, the formed wiring pattern was subjected to a surface treatment called blackening treatment. Then, an epoxy resin varnish containing bisphenol A type epoxy resin and dicyandiamide as main components and generally used for producing FR-4 type laminates is prepared for the inner layer by using a curtain coater as described above. The epoxy resin varnish layer was formed by coating on the surface of the substrate on which the wiring pattern is formed.

【0020】次いで、エポキシ樹脂ワニス層を形成した
内層用基板を、箱型乾燥機に入れ、130℃で30分間
加熱乾燥することによりエポキシ樹脂ワニス層の揮発成
分を除去して厚さが約100μmの未硬化の熱硬化性樹
脂層を得た。次いでこの熱硬化性樹脂層の表面に、厚さ
18μmの電解銅箔をそのマット面が熱硬化性樹脂層と
接触するように重ね、次いで加熱、加圧して成形して、
内層用基板表面に、熱硬化性樹脂層を介して銅箔を接着
した。この場合の加熱温度は各実施例では150℃と
し、各比較例では175℃とした。なお、この加熱が本
発明でいう一次加熱である。そして、加熱、加圧の時間
は熱硬化性樹脂層のガラス転移温度が表1中に示す「穴
明け時のガラス転移温度」となる時間とした。また、こ
の熱硬化性樹脂層について、別途に硬化条件を変動させ
て、ガラス転移温度を調査した結果、十分に硬化させた
場合に到達する最大ガラス転移温度が、175℃で90
分の加熱をした場合に得られる140℃であることを確
認した。従って、各比較例では一次加熱によって、十分
に硬化させた状態に到達していることになる。ガラス転
移温度の測定はデュポン社製のDSC装置を使用し、前
述したように、昇温速度:10℃/分、サンプル量:2
00mgの条件でDSC法により行った。
Then, the inner layer substrate on which the epoxy resin varnish layer has been formed is placed in a box dryer and heated and dried at 130 ° C. for 30 minutes to remove the volatile components of the epoxy resin varnish layer to a thickness of about 100 μm. To obtain an uncured thermosetting resin layer. Next, on the surface of this thermosetting resin layer, an electrolytic copper foil having a thickness of 18 μm is laid so that its matte surface is in contact with the thermosetting resin layer, and then heated and pressed to mold it.
Copper foil was adhered to the surface of the inner layer substrate via a thermosetting resin layer. The heating temperature in this case was 150 ° C. in each example and 175 ° C. in each comparative example. This heating is the primary heating in the present invention. The heating and pressurizing time was set to the time at which the glass transition temperature of the thermosetting resin layer became the "glass transition temperature at the time of punching" shown in Table 1. Further, as a result of investigating the glass transition temperature of this thermosetting resin layer by separately changing the curing conditions, the maximum glass transition temperature reached when fully cured was 90 at 175 ° C.
It was confirmed that the temperature was 140 ° C., which was obtained when heating for a minute. Therefore, in each comparative example, the fully heated state has reached the state of being sufficiently cured. The glass transition temperature was measured by using a DSC device manufactured by DuPont. As described above, the temperature rising rate was 10 ° C./min and the sample amount was 2
It was carried out by the DSC method under the condition of 00 mg.

【0021】次いで、上記のようにして接着した表層の
銅箔に対して、エッチングレジストフィルム(ドライフ
ィルム)を貼着、露光した後、銅箔をエッチングして、
経由穴を形成する位置の銅箔を除去した。なお、経由穴
を形成する位置は内層用基板の配線パターンが存在する
部分に設定した。次いで、表1〜表4に示すように、
過マンガン酸液を用いるエッチング法、サンドブラス
ターを用いる方法、反応性ガスとして酸素ガスを含む
プラズマエッチング法、反応性ガスとしてフッ素系ガ
ス及び酸素ガスを含むプラズマエッチング法のいずれか
の方法によって熱硬化性樹脂層に経由穴を一括して形成
した。〜の各穴明け方法及び穴明け速度の測定の詳
細を下記に示す。
Next, an etching resist film (dry film) is attached to the surface copper foil adhered as described above, exposed to light, and then the copper foil is etched,
The copper foil at the position where the via hole was formed was removed. The position where the via hole is formed is set to a portion where the wiring pattern of the inner layer substrate exists. Then, as shown in Tables 1 to 4,
Thermal curing by any one of an etching method using a permanganate solution, a method using a sand blaster, a plasma etching method containing oxygen gas as a reactive gas, and a plasma etching method containing fluorine-based gas and oxygen gas as a reactive gas Through holes were collectively formed in the functional resin layer. Details of each of the drilling methods and the measurement of the drilling speed are shown below.

【0022】過マンガン酸液を用いるエッチング法 シプレイ社のMLB211液に80℃、30分間浸漬す
る膨潤処理の後、過マンガン酸含有液であるシプレイ社
のMLB213液を80℃に加温した液中に経由穴の形
成が完了するまで浸漬する酸化分解処理を行い、次い
で、水洗し、その後、10%硫酸水溶液に5分間浸漬し
て処理液残さを中和処理後、さらに水洗を行う方法で行
った。また、酸化分解処理によって経由穴が形成できる
までの時間と、熱硬化性樹脂層の厚みとの関係から、樹
脂層の穴明け速度を算出し、その結果を表1〜表4に示
した。 サンドブラスターを用いる方法 サンドブラスターを用いて経由穴の形成が完了するまで
処理した。経由穴が形成できるまでの時間と、熱硬化性
樹脂層の厚みとの関係から、樹脂層の穴明け速度を算出
し、その結果を表1〜表4に示した。
Etching Method Using Permanganate Solution After swelling by immersing in MLB211 solution of Shipley at 80 ° C. for 30 minutes, MLB213 solution of Shipley containing permanganate is heated to 80 ° C. The oxidative decomposition treatment is performed by dipping until the formation of the via hole is completed, followed by rinsing with water, then immersing in 10% sulfuric acid aqueous solution for 5 minutes to neutralize the treatment liquid residue, and then rinsing with water. It was Further, the punching rate of the resin layer was calculated from the relationship between the time until the via hole was formed by the oxidative decomposition treatment and the thickness of the thermosetting resin layer, and the results are shown in Tables 1 to 4. Method using sand blaster Treatment was performed using a sand blaster until formation of via holes was completed. The drilling speed of the resin layer was calculated from the relationship between the time until the through hole was formed and the thickness of the thermosetting resin layer, and the results are shown in Tables 1 to 4.

【0023】反応性ガスとして酸素ガスを含むプラズ
マエッチング法の条件 雰囲気圧力:0.1トール(Torr)、導入ガス:酸素ガ
ス(流量50cc/分)とアルゴンガス(流量20cc
/分)の混合ガス、プラズマ印加電力:60W(13.
56MHz)の条件で経由穴の形成が完了するまで処理
した。経由穴が形成できるまでの時間と、熱硬化性樹脂
層の厚みとの関係から、樹脂層の穴明け速度を算出し、
その結果を表1〜表4に示した。
Conditions of the plasma etching method containing oxygen gas as a reactive gas: Atmospheric pressure: 0.1 torr (Torr), introduced gas: oxygen gas (flow rate 50 cc / min) and argon gas (flow rate 20 cc)
/ Min) mixed gas, plasma applied power: 60 W (13.
(56 MHz) until the formation of via holes was completed. From the relationship between the time until the through hole can be formed and the thickness of the thermosetting resin layer, the hole speed of the resin layer is calculated,
The results are shown in Tables 1 to 4.

【0024】反応性ガスとしてフッ素系ガス及び酸素
ガスを含むプラズマエッチング法 雰囲気圧力:0.1トール(Torr)、導入ガス:酸素ガ
ス(流量50cc/分)とCF4 ガス(流量5cc/
分)とアルゴンガス(流量20cc/分)の混合ガス、
プラズマ印加電力:60W(13.56MHz)の条件
で経由穴の形成が完了するまで処理した。経由穴が形成
できるまでの時間と、熱硬化性樹脂層の厚みとの関係か
ら、樹脂層の穴明け速度を算出し、その結果を表1〜表
4に示した。
Plasma Etching Method Containing Fluorine Gas and Oxygen Gas as Reactive Gas Atmospheric pressure: 0.1 Torr (torr), introduced gas: oxygen gas (flow rate 50 cc / min) and CF 4 gas (flow rate 5 cc / min)
Min) and argon gas (flow rate 20 cc / min), mixed gas,
Plasma application power: Processed under the condition of 60 W (13.56 MHz) until formation of via holes was completed. The drilling speed of the resin layer was calculated from the relationship between the time until the through hole was formed and the thickness of the thermosetting resin layer, and the results are shown in Tables 1 to 4.

【0025】次いで、上記のようにして経由穴の形成を
終わった基板について、175℃で90分の2次加熱を
施し、さらに、経由穴にめっき法により銅膜を形成して
内層用基板に備わる配線パターンと銅箔を電気的に接続
して、多層プリント配線板を作製した。なお、各比較例
については、2次加熱を行うことなく、経由穴にめっき
法により銅膜を形成するようにした。各実施例について
は2次加熱後の熱硬化性樹脂層のガラス転移温度を測定
し、その結果を表1〜表4に示した。
Next, the substrate on which the via holes have been formed as described above is subjected to secondary heating at 175 ° C. for 90 minutes, and a copper film is formed on the via holes by a plating method to form an inner layer substrate. The provided wiring pattern and the copper foil were electrically connected to each other to produce a multilayer printed wiring board. In each comparative example, a copper film was formed in the via hole by plating without secondary heating. For each example, the glass transition temperature of the thermosetting resin layer after the secondary heating was measured, and the results are shown in Tables 1 to 4.

【0026】[0026]

【表1】 [Table 1]

【0027】[0027]

【表2】 [Table 2]

【0028】[0028]

【表3】 [Table 3]

【0029】[0029]

【表4】 [Table 4]

【0030】表1〜表4の穴明け速度の結果から、実施
例の方が対応する比較例より穴明け速度が速いことが確
認された。
From the results of the drilling speeds in Tables 1 to 4, it was confirmed that the drilling speed of the example was higher than that of the corresponding comparative example.

【0031】[0031]

【発明の効果】請求項1〜請求項6に係る発明の製造方
法では、熱硬化性樹脂層のガラス転移温度が、十分に硬
化させた場合に到達する最大ガラス転移温度よりも20
℃以上低い範囲内に留まっていて、かつ、金属箔と内層
用基板が熱硬化性樹脂層で接着される段階まで一次加熱
を施し、次いで、経由穴を形成する位置の金属箔を除去
し、次いで、熱硬化性樹脂層に経由穴を一括して形成す
るので、熱硬化性樹脂層を十分に硬化させた後で経由穴
を一括して形成する場合に比べて、短時間で熱硬化性樹
脂層に経由穴を形成することを可能となり、多層プリン
ト配線板の製造方法として有用である。
In the manufacturing method of the invention according to claims 1 to 6, the glass transition temperature of the thermosetting resin layer is 20 higher than the maximum glass transition temperature reached when the thermosetting resin layer is sufficiently cured.
Remains in the lower range of ℃ or more, and is subjected to primary heating until the metal foil and the inner layer substrate are bonded by the thermosetting resin layer, and then the metal foil at the position where the via hole is formed is removed, Next, since the via holes are collectively formed in the thermosetting resin layer, compared with the case where the via holes are collectively formed after the thermosetting resin layer is sufficiently cured, the thermosetting property can be shortened in a short time. The through hole can be formed in the resin layer, which is useful as a method for manufacturing a multilayer printed wiring board.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 前田 修二 大阪府門真市大字門真1048番地松下電工株 式会社内 (72)発明者 池谷 晋一 大阪府門真市大字門真1048番地松下電工株 式会社内 (72)発明者 藤原 弘明 大阪府門真市大字門真1048番地松下電工株 式会社内 (72)発明者 杉山 肇 大阪府門真市大字門真1048番地松下電工株 式会社内 (72)発明者 澤田 康志 大阪府門真市大字門真1048番地松下電工株 式会社内 (72)発明者 井上 孝啓 大阪府門真市大字門真1048番地松下電工株 式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Shuji Maeda 1048, Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Works Co., Ltd. 72) Inventor Hiroaki Fujiwara 1048, Kadoma, Kadoma, Osaka Prefecture, Matsushita Electric Works Co., Ltd. (72) Inventor Hajime Sugiyama, 1048, Kadoma, Kadoma, Osaka Matsuda Electric Works Co., Ltd. 1048 Kadoma, Kadoma-shi (72) Inventor Takahiro Inoue 1048 Kadoma, Kadoma-shi, Osaka Prefecture Matsushita Electric Works Co., Ltd.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 配線パターン形成済みの内層用基板表面
に、熱硬化性樹脂層を介して金属箔を接着し、次いで経
由穴を形成する位置の金属箔を除去し、次いで、熱硬化
性樹脂層に経由穴を一括して形成し、この経由穴に導電
性物質を付与して内層用基板に備わる配線パターンと金
属箔を電気的に接続する多層プリント配線板の製造方法
において、内層用基板表面に未硬化の熱硬化性樹脂層を
介して金属箔を配設し、次いで、熱硬化性樹脂層のガラ
ス転移温度が、十分に硬化させた場合に到達する最大ガ
ラス転移温度よりも20℃以上低い範囲内に留まってい
て、かつ、金属箔と内層用基板が熱硬化性樹脂層で接着
される段階まで一次加熱を施し、次いで、経由穴を形成
する位置の金属箔を除去し、次いで、熱硬化性樹脂層に
経由穴を一括して形成し、その後に、二次加熱を行い熱
硬化性樹脂層の硬化を進めることを特徴とする多層プリ
ント配線板の製造方法。
1. A metal foil is adhered to a surface of an inner layer substrate on which a wiring pattern has been formed via a thermosetting resin layer, and then the metal foil at a position where a via hole is formed is removed, and then the thermosetting resin. In a method for manufacturing a multilayer printed wiring board, in which a via hole is collectively formed in a layer, and a conductive substance is applied to the via hole to electrically connect a wiring pattern provided in the inner layer board to a metal foil, A metal foil is arranged on the surface via an uncured thermosetting resin layer, and then the glass transition temperature of the thermosetting resin layer is 20 ° C. higher than the maximum glass transition temperature reached when sufficiently cured. The primary heating is performed until the metal foil and the inner layer substrate are bonded to each other with the thermosetting resin layer, and the metal foil at the position where the via hole is formed is removed, , Collectively form via holes in the thermosetting resin layer A method for manufacturing a multilayer printed wiring board, which comprises: forming a thermosetting resin layer, and then performing secondary heating to cure the thermosetting resin layer.
【請求項2】 経由穴を形成する方法が過マンガン酸液
により熱硬化性樹脂層を溶解除去する方法であることを
特徴とする請求項1記載の多層プリント配線板の製造方
法。
2. The method for manufacturing a multilayer printed wiring board according to claim 1, wherein the method of forming the via hole is a method of dissolving and removing the thermosetting resin layer with a permanganate solution.
【請求項3】 経由穴を形成する方法がサンドブラスタ
ーを用いて熱硬化性樹脂層を除去する方法であることを
特徴とする請求項1記載の多層プリント配線板の製造方
法。
3. The method for manufacturing a multilayer printed wiring board according to claim 1, wherein the method of forming the through hole is a method of removing the thermosetting resin layer using a sand blaster.
【請求項4】 経由穴を形成する方法が反応性ガスを用
いたプラズマエッチングにより熱硬化性樹脂層を除去す
る方法であることを特徴とする請求項1記載の多層プリ
ント配線板の製造方法。
4. The method for producing a multilayer printed wiring board according to claim 1, wherein the method of forming the via hole is a method of removing the thermosetting resin layer by plasma etching using a reactive gas.
【請求項5】 反応性ガスが酸素ガスを含むガスである
ことを特徴とする請求項4記載の多層プリント配線板の
製造方法。
5. The method for manufacturing a multilayer printed wiring board according to claim 4, wherein the reactive gas is a gas containing oxygen gas.
【請求項6】 反応性ガスがフッ素系ガス及び酸素ガス
を含むガスであることを特徴とする請求項4記載の多層
プリント配線板の製造方法。
6. The method for manufacturing a multilayer printed wiring board according to claim 4, wherein the reactive gas is a gas containing a fluorine-based gas and an oxygen gas.
JP11948295A 1995-05-18 1995-05-18 Manufacture of multilayer printed wiring board Withdrawn JPH08316640A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11948295A JPH08316640A (en) 1995-05-18 1995-05-18 Manufacture of multilayer printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11948295A JPH08316640A (en) 1995-05-18 1995-05-18 Manufacture of multilayer printed wiring board

Publications (1)

Publication Number Publication Date
JPH08316640A true JPH08316640A (en) 1996-11-29

Family

ID=14762385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11948295A Withdrawn JPH08316640A (en) 1995-05-18 1995-05-18 Manufacture of multilayer printed wiring board

Country Status (1)

Country Link
JP (1) JPH08316640A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007317749A (en) * 2006-05-23 2007-12-06 Matsushita Electric Works Ltd Printed wiring board material and method of manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007317749A (en) * 2006-05-23 2007-12-06 Matsushita Electric Works Ltd Printed wiring board material and method of manufacturing the same

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