JPH082623Y2 - 遅延量測定回路 - Google Patents

遅延量測定回路

Info

Publication number
JPH082623Y2
JPH082623Y2 JP1986104137U JP10413786U JPH082623Y2 JP H082623 Y2 JPH082623 Y2 JP H082623Y2 JP 1986104137 U JP1986104137 U JP 1986104137U JP 10413786 U JP10413786 U JP 10413786U JP H082623 Y2 JPH082623 Y2 JP H082623Y2
Authority
JP
Japan
Prior art keywords
gate
signal
circuit
supplied
gates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1986104137U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6310471U (enrdf_load_html_response
Inventor
茂 八重田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1986104137U priority Critical patent/JPH082623Y2/ja
Publication of JPS6310471U publication Critical patent/JPS6310471U/ja
Application granted granted Critical
Publication of JPH082623Y2 publication Critical patent/JPH082623Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1986104137U 1986-07-07 1986-07-07 遅延量測定回路 Expired - Lifetime JPH082623Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986104137U JPH082623Y2 (ja) 1986-07-07 1986-07-07 遅延量測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986104137U JPH082623Y2 (ja) 1986-07-07 1986-07-07 遅延量測定回路

Publications (2)

Publication Number Publication Date
JPS6310471U JPS6310471U (enrdf_load_html_response) 1988-01-23
JPH082623Y2 true JPH082623Y2 (ja) 1996-01-29

Family

ID=30977354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986104137U Expired - Lifetime JPH082623Y2 (ja) 1986-07-07 1986-07-07 遅延量測定回路

Country Status (1)

Country Link
JP (1) JPH082623Y2 (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI404958B (zh) * 2006-05-26 2013-08-11 Advantest Corp 測試裝置以及測試模組

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59154367A (ja) * 1983-02-23 1984-09-03 Mitsubishi Electric Corp 遅延量測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI404958B (zh) * 2006-05-26 2013-08-11 Advantest Corp 測試裝置以及測試模組

Also Published As

Publication number Publication date
JPS6310471U (enrdf_load_html_response) 1988-01-23

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