JPH0366624B2 - - Google Patents

Info

Publication number
JPH0366624B2
JPH0366624B2 JP57104864A JP10486482A JPH0366624B2 JP H0366624 B2 JPH0366624 B2 JP H0366624B2 JP 57104864 A JP57104864 A JP 57104864A JP 10486482 A JP10486482 A JP 10486482A JP H0366624 B2 JPH0366624 B2 JP H0366624B2
Authority
JP
Japan
Prior art keywords
speed clock
test
output
low
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57104864A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58222534A (ja
Inventor
Shigeo Kamya
Seiichi Nishio
Misao Myata
Isamu Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57104864A priority Critical patent/JPS58222534A/ja
Publication of JPS58222534A publication Critical patent/JPS58222534A/ja
Publication of JPH0366624B2 publication Critical patent/JPH0366624B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP57104864A 1982-06-18 1982-06-18 集積回路 Granted JPS58222534A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57104864A JPS58222534A (ja) 1982-06-18 1982-06-18 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57104864A JPS58222534A (ja) 1982-06-18 1982-06-18 集積回路

Publications (2)

Publication Number Publication Date
JPS58222534A JPS58222534A (ja) 1983-12-24
JPH0366624B2 true JPH0366624B2 (enrdf_load_html_response) 1991-10-18

Family

ID=14392104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57104864A Granted JPS58222534A (ja) 1982-06-18 1982-06-18 集積回路

Country Status (1)

Country Link
JP (1) JPS58222534A (enrdf_load_html_response)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61191973A (ja) * 1985-02-20 1986-08-26 Fujitsu Ltd 試験回路をそなえた半導体集積回路
JPH0810724B2 (ja) * 1987-08-05 1996-01-31 富士通株式会社 ゲ−トアレイ及びメモリを有する半導体集積回路装置
JPH0740059B2 (ja) * 1988-06-15 1995-05-01 富士通株式会社 超大規模集積回路の試験容易化方法

Also Published As

Publication number Publication date
JPS58222534A (ja) 1983-12-24

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