JPH0323707Y2 - - Google Patents

Info

Publication number
JPH0323707Y2
JPH0323707Y2 JP1986077757U JP7775786U JPH0323707Y2 JP H0323707 Y2 JPH0323707 Y2 JP H0323707Y2 JP 1986077757 U JP1986077757 U JP 1986077757U JP 7775786 U JP7775786 U JP 7775786U JP H0323707 Y2 JPH0323707 Y2 JP H0323707Y2
Authority
JP
Japan
Prior art keywords
input
gate
multiplexer
delay
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1986077757U
Other languages
English (en)
Japanese (ja)
Other versions
JPS62188824U (enrdf_load_html_response
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986077757U priority Critical patent/JPH0323707Y2/ja
Publication of JPS62188824U publication Critical patent/JPS62188824U/ja
Application granted granted Critical
Publication of JPH0323707Y2 publication Critical patent/JPH0323707Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Pulse Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1986077757U 1986-05-22 1986-05-22 Expired JPH0323707Y2 (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986077757U JPH0323707Y2 (enrdf_load_html_response) 1986-05-22 1986-05-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986077757U JPH0323707Y2 (enrdf_load_html_response) 1986-05-22 1986-05-22

Publications (2)

Publication Number Publication Date
JPS62188824U JPS62188824U (enrdf_load_html_response) 1987-12-01
JPH0323707Y2 true JPH0323707Y2 (enrdf_load_html_response) 1991-05-23

Family

ID=30926063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986077757U Expired JPH0323707Y2 (enrdf_load_html_response) 1986-05-22 1986-05-22

Country Status (1)

Country Link
JP (1) JPH0323707Y2 (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008053914A (ja) * 2006-08-23 2008-03-06 Advantest Corp 遅延回路、試験装置、プログラム、半導体チップ、イニシャライズ方法、および、イニシャライズ回路

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6068713A (ja) * 1983-09-26 1985-04-19 Nec Corp タイミング調整回路
JPS60167519A (ja) * 1984-02-10 1985-08-30 Hitachi Ltd 半導体遅延回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008053914A (ja) * 2006-08-23 2008-03-06 Advantest Corp 遅延回路、試験装置、プログラム、半導体チップ、イニシャライズ方法、および、イニシャライズ回路

Also Published As

Publication number Publication date
JPS62188824U (enrdf_load_html_response) 1987-12-01

Similar Documents

Publication Publication Date Title
KR0184041B1 (ko) 반도체 시험장치의 측정 신호의 타이밍 교정 방법 및 그 회로
US6469493B1 (en) Low cost CMOS tester with edge rate compensation
EP1000364B1 (en) Low cost cmos tester with high channel density
US5854797A (en) Tester with fast refire recovery time
US5204559A (en) Method and apparatus for controlling clock skew
US4458165A (en) Programmable delay circuit
KR100218125B1 (ko) 타이밍 신호 발생 회로
US4805195A (en) Selectable timing delay circuit
JP2000332583A (ja) 遅延信号生成装置および半導体試験装置
TW201021423A (en) Delay circuit, timing generator using the delay circuit, and test device
JP2002084186A (ja) タイミング信号発生回路、及び、それを備えた半導体検査装置
KR100198519B1 (ko) 지연 시간 안정화 회로
JPH0323707Y2 (enrdf_load_html_response)
JP4825131B2 (ja) 消費電流バランス回路、補償電流量調整方法、タイミング発生器及び半導体試験装置
KR19980703081A (ko) 지연시간 측정방법 및 이 방법의 실시에 사용하는 지연시간측정용 펄스발생장치
JPH0812574B2 (ja) 集積回路装置
JP3415516B2 (ja) Ｐｌｌ回路及び半導体集積回路
JP3691112B2 (ja) 半導体集積回路
JPH082623Y2 (ja) 遅延量測定回路
JP4412775B2 (ja) 遅延信号生成装置およびその遅延量を調整する方法
JPH06124138A (ja) クロック調整方式
JPS6316712A (ja) パルス発生器のタイミング自動補正方法
US7123071B2 (en) Method and device for producing delayed signals
JPH0926467A (ja) Ｉｃテスタのタイミング発生回路用ｐｌｌ発振器
JPH0575447A (ja) タイミング校正方式