JPH0772739B2 - アナログテスタ - Google Patents

アナログテスタ

Info

Publication number
JPH0772739B2
JPH0772739B2 JP2400294A JP40029490A JPH0772739B2 JP H0772739 B2 JPH0772739 B2 JP H0772739B2 JP 2400294 A JP2400294 A JP 2400294A JP 40029490 A JP40029490 A JP 40029490A JP H0772739 B2 JPH0772739 B2 JP H0772739B2
Authority
JP
Japan
Prior art keywords
signal
current
diode
circuit
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2400294A
Other languages
English (en)
Japanese (ja)
Other versions
JPH04208867A (ja
Inventor
信治 馬場
Original Assignee
三和エム・アイ・テクノス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三和エム・アイ・テクノス株式会社 filed Critical 三和エム・アイ・テクノス株式会社
Priority to JP2400294A priority Critical patent/JPH0772739B2/ja
Priority to ITMI913207A priority patent/IT1252135B/it
Priority to DE4139854A priority patent/DE4139854A1/de
Publication of JPH04208867A publication Critical patent/JPH04208867A/ja
Publication of JPH0772739B2 publication Critical patent/JPH0772739B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/22—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of ac into dc
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Leads Or Probes (AREA)
JP2400294A 1990-12-04 1990-12-04 アナログテスタ Expired - Fee Related JPH0772739B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2400294A JPH0772739B2 (ja) 1990-12-04 1990-12-04 アナログテスタ
ITMI913207A IT1252135B (it) 1990-12-04 1991-11-29 Circuito di risposta bipolare e strumento di misura analogico che impiega tale circuito
DE4139854A DE4139854A1 (de) 1990-12-04 1991-12-03 Bipolare verarbeitungsschaltung sowie die bipolare verarbeitungsschaltung einsetzendes analog-messgeraet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2400294A JPH0772739B2 (ja) 1990-12-04 1990-12-04 アナログテスタ

Publications (2)

Publication Number Publication Date
JPH04208867A JPH04208867A (ja) 1992-07-30
JPH0772739B2 true JPH0772739B2 (ja) 1995-08-02

Family

ID=18510206

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2400294A Expired - Fee Related JPH0772739B2 (ja) 1990-12-04 1990-12-04 アナログテスタ

Country Status (3)

Country Link
JP (1) JPH0772739B2 (it)
DE (1) DE4139854A1 (it)
IT (1) IT1252135B (it)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016095187A (ja) * 2014-11-13 2016-05-26 中国電力株式会社 電気テスター

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5447479U (it) * 1977-09-09 1979-04-02
JPS58127367U (ja) * 1982-02-22 1983-08-29 東洋電機製造株式会社 電圧指示回路

Also Published As

Publication number Publication date
ITMI913207A0 (it) 1991-11-29
ITMI913207A1 (it) 1993-05-29
IT1252135B (it) 1995-06-05
DE4139854A1 (de) 1992-06-11
JPH04208867A (ja) 1992-07-30

Similar Documents

Publication Publication Date Title
JP2889227B2 (ja) 導体中の電流を測定するための方法およびデバイス
US4160206A (en) Audible voltage-impedance tester
US5319306A (en) Portable electrical line tester using audible tones to indicate voltage
JPH0772739B2 (ja) アナログテスタ
JP4222678B2 (ja) 電流測定装置
JP3073806B2 (ja) デジタルマルチメータ
JPH05119110A (ja) 直流測定器
JPH0645909Y2 (ja) Ｉｃ試験装置
US3898559A (en) Method and apparatus for testing transistors
JPH11295363A (ja) インピーダンス測定装置
JP4443681B2 (ja) 配線接続チェッカ
JPH0136140Y2 (it)
SU1122983A1 (ru) Устройство дл измерени коэффициента усилени по току транзисторов
SU1714528A1 (ru) Устройство контрол электрических цепей и напр жений
JP2889264B2 (ja) 四端子測定装置
JPH0654338B2 (ja) 多層プリント配線基板のショート位置検出装置
JPS61155873A (ja) 半導体素子の測定装置
JP2003337150A (ja) インピーダンス測定装置
JPH0226485Y2 (it)
RU2012935C1 (ru) Устройство для определения полярности выводов электролитических конденсаторов
JP3469369B2 (ja) 電気計測器
SU65603A1 (ru) Устройство дл измерени модул сопротивлени
JPS5931980B2 (ja) 接触検査および極性判別装置
JPH05292742A (ja) スイッチング電源装置
JPS6097279A (ja) 検相方法

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees