JPH0752624Y2 - 温度試験器 - Google Patents

温度試験器

Info

Publication number
JPH0752624Y2
JPH0752624Y2 JP1987031707U JP3170787U JPH0752624Y2 JP H0752624 Y2 JPH0752624 Y2 JP H0752624Y2 JP 1987031707 U JP1987031707 U JP 1987031707U JP 3170787 U JP3170787 U JP 3170787U JP H0752624 Y2 JPH0752624 Y2 JP H0752624Y2
Authority
JP
Japan
Prior art keywords
air
temperature
test chamber
test
air curtain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987031707U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63139569U (cs
Inventor
源生 岡本
Original Assignee
株式会社高見沢サイバネティックス
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社高見沢サイバネティックス filed Critical 株式会社高見沢サイバネティックス
Priority to JP1987031707U priority Critical patent/JPH0752624Y2/ja
Publication of JPS63139569U publication Critical patent/JPS63139569U/ja
Application granted granted Critical
Publication of JPH0752624Y2 publication Critical patent/JPH0752624Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1987031707U 1987-03-04 1987-03-04 温度試験器 Expired - Lifetime JPH0752624Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987031707U JPH0752624Y2 (ja) 1987-03-04 1987-03-04 温度試験器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987031707U JPH0752624Y2 (ja) 1987-03-04 1987-03-04 温度試験器

Publications (2)

Publication Number Publication Date
JPS63139569U JPS63139569U (cs) 1988-09-14
JPH0752624Y2 true JPH0752624Y2 (ja) 1995-11-29

Family

ID=30837691

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987031707U Expired - Lifetime JPH0752624Y2 (ja) 1987-03-04 1987-03-04 温度試験器

Country Status (1)

Country Link
JP (1) JPH0752624Y2 (cs)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022209697A1 (ja) * 2021-04-01 2022-10-06 パナソニックIpマネジメント株式会社 収納装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221083A (ja) * 1985-07-19 1987-01-29 Takamisawa Saibaneteitsukusu:Kk 電子機器の温度特性試験器

Also Published As

Publication number Publication date
JPS63139569U (cs) 1988-09-14

Similar Documents

Publication Publication Date Title
US8281607B2 (en) Electronic block valve
US20080160799A1 (en) Terminal block test pad
JPH0325706B2 (cs)
KR20220036892A (ko) 챔버 씰링을 위한 반도체 번인 오븐
JPH0752624Y2 (ja) 温度試験器
JPS6221083A (ja) 電子機器の温度特性試験器
JPH0752625Y2 (ja) 温度特性試験槽
JP4805963B2 (ja) 環境試験方法及び環境試験装置
KR100742291B1 (ko) 메모리모듈 검사용 냉/온기 발생장치
CN110907168A (zh) 试验装置
JP3435410B2 (ja) 低温試験装置及び低温試験方法
JPH0527014Y2 (cs)
CN112032824B (zh) 空调机
JPH075426Y2 (ja) 温度特性試験槽
US5331273A (en) Thermal fixture for testing an integrated circuit
KR102537215B1 (ko) 다양한 반도체 소자에 적응적으로 가속인자의 적용이 가능한 반도체 소자 평가 시스템 및 이를 이용한 반도체 소자의 평가 방법
CN218001673U (zh) 一种防凝露组件、室外机和空调系统
CN115436211A (zh) 复式快速温变冲击试验箱
CN216387288U (zh) 一种集成电路高低温测试装置
JPH01196583A (ja) 温度特性試験槽
CN219590434U (zh) 一种电子产品老化测试设备
JPH08136442A (ja) 急速昇降温型冷熱試験装置
JP2002214270A (ja) 温度特性試験装置
CN215340179U (zh) 一种自动化实时监测功能的芯片可靠性测试装置
CN112856898B (zh) 冰箱