JPS63139569U - - Google Patents

Info

Publication number
JPS63139569U
JPS63139569U JP3170787U JP3170787U JPS63139569U JP S63139569 U JPS63139569 U JP S63139569U JP 3170787 U JP3170787 U JP 3170787U JP 3170787 U JP3170787 U JP 3170787U JP S63139569 U JPS63139569 U JP S63139569U
Authority
JP
Japan
Prior art keywords
test chamber
temperature
open part
dew
electronic equipment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3170787U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0752624Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987031707U priority Critical patent/JPH0752624Y2/ja
Publication of JPS63139569U publication Critical patent/JPS63139569U/ja
Application granted granted Critical
Publication of JPH0752624Y2 publication Critical patent/JPH0752624Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1987031707U 1987-03-04 1987-03-04 温度試験器 Expired - Lifetime JPH0752624Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987031707U JPH0752624Y2 (ja) 1987-03-04 1987-03-04 温度試験器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987031707U JPH0752624Y2 (ja) 1987-03-04 1987-03-04 温度試験器

Publications (2)

Publication Number Publication Date
JPS63139569U true JPS63139569U (cs) 1988-09-14
JPH0752624Y2 JPH0752624Y2 (ja) 1995-11-29

Family

ID=30837691

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987031707U Expired - Lifetime JPH0752624Y2 (ja) 1987-03-04 1987-03-04 温度試験器

Country Status (1)

Country Link
JP (1) JPH0752624Y2 (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2022209697A1 (cs) * 2021-04-01 2022-10-06

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221083A (ja) * 1985-07-19 1987-01-29 Takamisawa Saibaneteitsukusu:Kk 電子機器の温度特性試験器

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221083A (ja) * 1985-07-19 1987-01-29 Takamisawa Saibaneteitsukusu:Kk 電子機器の温度特性試験器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2022209697A1 (cs) * 2021-04-01 2022-10-06

Also Published As

Publication number Publication date
JPH0752624Y2 (ja) 1995-11-29

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