JPH01118380U - - Google Patents
Info
- Publication number
- JPH01118380U JPH01118380U JP1123588U JP1123588U JPH01118380U JP H01118380 U JPH01118380 U JP H01118380U JP 1123588 U JP1123588 U JP 1123588U JP 1123588 U JP1123588 U JP 1123588U JP H01118380 U JPH01118380 U JP H01118380U
- Authority
- JP
- Japan
- Prior art keywords
- test chamber
- temperature
- temperature test
- open section
- temperature characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009423 ventilation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1123588U JPH01118380U (cs) | 1988-02-01 | 1988-02-01 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1123588U JPH01118380U (cs) | 1988-02-01 | 1988-02-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01118380U true JPH01118380U (cs) | 1989-08-10 |
Family
ID=31219608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1123588U Pending JPH01118380U (cs) | 1988-02-01 | 1988-02-01 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01118380U (cs) |
-
1988
- 1988-02-01 JP JP1123588U patent/JPH01118380U/ja active Pending