JPH074553Y2 - 測光装置 - Google Patents
測光装置Info
- Publication number
- JPH074553Y2 JPH074553Y2 JP1985080606U JP8060685U JPH074553Y2 JP H074553 Y2 JPH074553 Y2 JP H074553Y2 JP 1985080606 U JP1985080606 U JP 1985080606U JP 8060685 U JP8060685 U JP 8060685U JP H074553 Y2 JPH074553 Y2 JP H074553Y2
- Authority
- JP
- Japan
- Prior art keywords
- output
- signal
- circuit
- photodiode
- comparison
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985080606U JPH074553Y2 (ja) | 1985-05-29 | 1985-05-29 | 測光装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985080606U JPH074553Y2 (ja) | 1985-05-29 | 1985-05-29 | 測光装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61195428U JPS61195428U (US20070167544A1-20070719-C00007.png) | 1986-12-05 |
JPH074553Y2 true JPH074553Y2 (ja) | 1995-02-01 |
Family
ID=30626613
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985080606U Expired - Lifetime JPH074553Y2 (ja) | 1985-05-29 | 1985-05-29 | 測光装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH074553Y2 (US20070167544A1-20070719-C00007.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009216411A (ja) * | 2008-03-07 | 2009-09-24 | Advanced Mask Inspection Technology Kk | 試料検査装置及び試料検査方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50118990U (US20070167544A1-20070719-C00007.png) * | 1974-03-12 | 1975-09-29 |
-
1985
- 1985-05-29 JP JP1985080606U patent/JPH074553Y2/ja not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009216411A (ja) * | 2008-03-07 | 2009-09-24 | Advanced Mask Inspection Technology Kk | 試料検査装置及び試料検査方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS61195428U (US20070167544A1-20070719-C00007.png) | 1986-12-05 |
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